JPH0733571B2 - Film forming equipment - Google Patents
Film forming equipmentInfo
- Publication number
- JPH0733571B2 JPH0733571B2 JP26625386A JP26625386A JPH0733571B2 JP H0733571 B2 JPH0733571 B2 JP H0733571B2 JP 26625386 A JP26625386 A JP 26625386A JP 26625386 A JP26625386 A JP 26625386A JP H0733571 B2 JPH0733571 B2 JP H0733571B2
- Authority
- JP
- Japan
- Prior art keywords
- shutter
- ion beam
- holder
- substrate
- film forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000010884 ion-beam technique Methods 0.000 claims description 15
- 239000000758 substrate Substances 0.000 claims description 12
- 238000001704 evaporation Methods 0.000 claims description 10
- 230000008020 evaporation Effects 0.000 claims description 9
- 239000000126 substance Substances 0.000 claims description 4
- 238000007738 vacuum evaporation Methods 0.000 claims 1
- 239000000463 material Substances 0.000 description 6
- 238000001816 cooling Methods 0.000 description 4
- 238000001771 vacuum deposition Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000009834 vaporization Methods 0.000 description 2
- 230000008016 vaporization Effects 0.000 description 2
- 239000006200 vaporizer Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 239000000112 cooling gas Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】 〈産業上の利用分野〉 この発明は、イオンビーム照射と真空蒸着を併用して基
板表面に膜を形成する膜形成装置に関し、特にそのシヤ
ツターの改良に関する。Description: TECHNICAL FIELD The present invention relates to a film forming apparatus for forming a film on a substrate surface by using both ion beam irradiation and vacuum deposition, and particularly to improvement of a shutter thereof.
〈従来の技術〉 この種膜形成装置としては、単一のイオン源と、単一の
蒸発源とを用いて、イオンビーム照射と真空蒸着とを同
時もしくは、交互に行うようにしたものがある。<Prior Art> As this seed film forming apparatus, there is one in which a single ion source and a single evaporation source are used to simultaneously or alternately perform ion beam irradiation and vacuum deposition. .
近年、この種膜形成過程において、例えば、真空蒸着と
同時に低エネルギーでイオンビームを照射した後に、高
エネルギーでイオンビームを照射することが試みられて
いる。In recent years, in the process of forming this seed film, for example, it has been attempted to irradiate the ion beam with high energy after irradiating it with low energy at the same time as vacuum deposition.
この種装置としては、例えば第5図に示す如く、真空容
器1内に基板2を保持するホルダ3が設けられ、ホルダ
3の矢印Aのような回転中心に対してほぼ左右対称な所
に、相対的に高エネルギー(例えば1KeV〜50KeV程度の
範囲)のイオンビーム41を発生し得る高エネルギーイオ
ン源4と、相対的に低エネルギー(例えば50eV〜1KeV程
度の範囲)のイオンビーム51を発生し得る低エネルギー
イオン源5とがそれぞれ斜め下方からホルダ3の方に向
けて配置されている。As an apparatus of this type, for example, as shown in FIG. 5, a holder 3 for holding a substrate 2 is provided in a vacuum container 1, and the holder 3 is provided at a position substantially symmetrical with respect to a rotation center as indicated by an arrow A. A high energy ion source 4 capable of generating an ion beam 41 of relatively high energy (for example, a range of about 1 KeV to 50 KeV) and an ion beam 51 of relatively low energy (for example, a range of about 50 eV to 1 KeV). The low-energy ion source 5 to be obtained and the low-energy ion source 5 to be obtained are respectively arranged obliquely from below toward the holder 3.
ホルダ3はホルダ駆動装置9に取り付けられており、堂
外ホルダ駆動装置9は、ホルダ3を矢印Aのように回転
させてそこに保持された基板2の表面の向きを高エネル
ギーイオン源4側と低エネルギーイオン源5側とに変更
できる機能や、ホルダ3を矢印Bのように回転させて基
板2をその面内で回転させる機能等を有し、各イオンビ
ームの入射角が任意に設定できるうに形成されている。The holder 3 is attached to a holder driving device 9, and the hall outside driving device 9 rotates the holder 3 as shown by an arrow A so that the surface of the substrate 2 held therein is oriented toward the high energy ion source 4 side. And the low-energy ion source 5 side, and the function of rotating the holder 3 as shown by the arrow B to rotate the substrate 2 in the plane thereof, and the angle of incidence of each ion beam is arbitrarily set. It is formed as you can.
更に、真空容器1内のホルダ3の下方であつてホルダ3
の矢印Aのような回転中心に対してはほぼ左右対称な所
に、蒸発物質61及び71をそれぞれ発生し得る2台の蒸発
源6および7がそれぞれ配置されており、前者は高エネ
ルギーイオン源4側に向けられた基板2の表面の方に、
後者は低エネルギーイオン限5側に向けられた基板2の
表面の方にそれぞれ向くようにされている。Further, below the holder 3 in the vacuum container 1, the holder 3
Two evaporation sources 6 and 7 capable of generating evaporation substances 61 and 71, respectively, are arranged substantially symmetrically with respect to the center of rotation as indicated by arrow A in FIG. To the surface of the substrate 2 facing the 4 side,
The latter are respectively directed toward the surface of the substrate 2 which is directed to the low energy ion limit 5 side.
そして、基板2に入射する高エネルギーのイオンビーム
41、低エネルギーのイオンビーム51、蒸発物質61および
蒸発物質71等を断続するシヤツター8がホルダ3と高エ
ネルギーイオン源4、低カネルギーイオン源5、蒸発源
6および蒸発源7の間に介在して設けられている。この
シヤツター8の構造は第6図に示すように、平板状の遮
蔽板82′にビームパワーおよび蒸発源からの幅射熱によ
る温度上昇を低くするための冷却パイプ87がロー付けに
より固着されている。この冷却パイプ87はパイプ状のア
ーム88の中を挿通して真空容器1の外部に導出されてお
り、内部に冷却水や冷却ガス等からなる冷却媒体が循環
するようにされている。そして、シヤツター8は第4図
の平面断面図に示すように、真空容器1の外部に設けら
れたシヤツター駆動装置(図示せず)によつて矢印の方
向に平行移動して開閉がなされる。Then, the high-energy ion beam incident on the substrate 2
41, a low-energy ion beam 51, a vaporizer 61, and a shutter 8 for connecting and disconnecting the vaporizer 71 and the like are interposed between the holder 3 and the high-energy ion source 4, the low energy ion source 5, the vaporization source 6 and the vaporization source 7. Is provided. As shown in FIG. 6, the structure of the shutter 8 is such that a cooling pipe 87 for reducing the temperature rise due to the beam power and the radiant heat from the evaporation source is fixed to the flat shield plate 82 'by brazing. There is. The cooling pipe 87 is inserted into a pipe-shaped arm 88 and led out to the outside of the vacuum container 1, and a cooling medium such as cooling water or cooling gas is circulated inside. Then, as shown in the plan sectional view of FIG. 4, the shutter 8 is moved in parallel by a shutter drive device (not shown) provided outside the vacuum container 1 in the direction of the arrow to be opened and closed.
〈発明が解決しようとする問題点〉 ところが、このような構成によれば、シヤツター8を平
板状にして基板2に入射する高エネルギーのイオンビー
ム41、低エネルギーのイオンビーム51、蒸発物質61およ
び蒸発物質71等を遮蔽するには第6図にて示すシヤツタ
ー8の幅寸法Wがかなり大きなものとなる。シヤツター
8の幅寸法Wが大きくなると第4図の平面断面図に示す
ように、真空容器1の直径寸法Dが大きくなる。<Problems to be Solved by the Invention> However, according to such a configuration, the high-energy ion beam 41, the low-energy ion beam 51, and the vaporized substance 61 which are incident on the substrate 2 by forming the shutter 8 into a flat plate, In order to shield the evaporation material 71 and the like, the width dimension W of the shutter 8 shown in FIG. 6 becomes considerably large. As the width W of the shutter 8 increases, the diameter D of the vacuum container 1 increases as shown in the plan sectional view of FIG.
また、矢印の方向にシヤツター8を開閉すると、第6図
に示す遮蔽板82′の両端が上下方向に揺動するため、支
持金具86にねじれの力が加わることから支持金具86は強
固なものが必要で、材料が大きくなる。更に、真空容器
1の直径寸法Dが大きくなるとシヤツターのアーム88が
長くなることからアーム88は強固なものが必要で、材料
が大きくなる等の問題がある。Further, when the shutter 8 is opened and closed in the direction of the arrow, both ends of the shield plate 82 'shown in FIG. 6 swing in the vertical direction, so that a twisting force is applied to the support fitting 86, so that the support fitting 86 is solid. Is required, and the material becomes large. Furthermore, as the diameter dimension D of the vacuum container 1 becomes larger, the arm 88 of the shutter becomes longer, so that a strong arm 88 is required, and there is a problem that the material becomes large.
〈問題点を解決するための手段〉 本発明の膜形成装置は、シヤツターを複数のイオン源に
それぞれ向かい合う面を擁するものにすることを特徴と
する。<Means for Solving Problems> The film forming apparatus of the present invention is characterized in that the shutter has a surface facing each of a plurality of ion sources.
〈作用〉 シヤツターの形状を複数のイオン源にそれぞれ向かい合
う面を擁するものにすると、その両端は折り曲げた形に
なることから、シヤツターの幅寸法は小さいものにな
る。<Operation> If the shape of the shutter is such that it has surfaces facing each of a plurality of ion sources, both ends thereof are bent, and therefore the width of the shutter becomes small.
〈実施例〉 第1図はこの発明の一実施例に係る膜形成装置を示す概
略図であり、第5図と同等部分は同一符号を付してい
る。<Embodiment> FIG. 1 is a schematic view showing a film forming apparatus according to an embodiment of the present invention, and the same portions as those in FIG. 5 are designated by the same reference numerals.
第1図に示すように、シヤツター8の両端を折り曲げ、
その折り曲げた面を複数のイオン源、例えば、高エネル
ギーイオン源4および低エネルギーイオン源5にそれぞ
れ向かい合うようにする。このようにすると、第2図に
て示すシヤツター8の幅寸法Wは、第6図にて示すシヤ
ツター8の幅寸法Wよりも小さなものとなる。シヤツタ
ー8の幅寸法Wが小さくなると第3図の平面断面図に示
すように、真空容器1の直径寸法Dは第4図にて示す真
空容器1の直径寸法Dよりも小さなものとなる。シヤツ
ター8の幅寸法Wおよび真空容器1の直径寸法Dが小さ
くなると、第2図のシヤツター8の支持金具86およびア
ーム88は第6図に示す平板状のものに比較して強度的に
負担が軽くなり使用する材料が小さなものとなる。Bend both ends of the shutter 8 as shown in FIG.
The bent surface faces a plurality of ion sources, for example, a high energy ion source 4 and a low energy ion source 5. By doing so, the width dimension W of the shutter 8 shown in FIG. 2 becomes smaller than the width dimension W of the shutter 8 shown in FIG. When the width dimension W of the shutter 8 becomes smaller, the diameter dimension D of the vacuum vessel 1 becomes smaller than the diameter dimension D of the vacuum vessel 1 shown in FIG. 4, as shown in the plan sectional view of FIG. When the width dimension W of the shutter 8 and the diameter dimension D of the vacuum vessel 1 become smaller, the supporting metal fitting 86 and the arm 88 of the shutter 8 in FIG. 2 are stronger than those in the flat plate shape shown in FIG. It is lighter and the material used is smaller.
尚、第2図に示すようにシヤツター8の構成を、取付板
81と遮蔽板82、遮蔽板83、遮蔽板84の組み合わせ構造に
し、且つ、遮蔽板82乃至84を例えばボルト85等により着
脱自在に取付けると、異質の膜を形成するとき遮蔽板に
前の物質が付着していて、これが不純物となつて後の成
膜に悪影響を及ぼすことより、これを取り除く作業に際
して、これら遮蔽板82乃至84が容易に取りはずせるため
便利である。更に、取付板81に例えば熱伝導率および機
械加工性が良好な銅を用い、冷却パイプ87に例えば機械
加工性が良好で熱伝導率も比較的良好なステンレスを用
い、遮蔽板82乃至84に例えばスパツタ率が低いモリブデ
ンまたはタンタルを用いると、シヤツター全体として熱
伝導率の良好なスパツタ率の低いものとなるため、シヤ
ツターの冷却効果を大きく、また、真空容器内の汚れを
少なくすることが出来る。In addition, as shown in FIG.
When the 81, the shielding plate 82, the shielding plate 83, and the shielding plate 84 have a combined structure, and the shielding plates 82 to 84 are detachably attached by, for example, bolts 85 or the like, when the foreign film is formed, the previous substance is attached to the shielding plate. Are adhered, and they act as impurities to adversely affect the subsequent film formation. Therefore, it is convenient that the shielding plates 82 to 84 can be easily removed during the work of removing them. Further, for example, copper having good thermal conductivity and machinability is used for the mounting plate 81, stainless steel having good machinability and relatively good thermal conductivity is used for the cooling pipe 87, and the shielding plates 82 to 84 are used. For example, if molybdenum or tantalum having a low spatter rate is used, the overall shatter has good thermal conductivity and a low spatter rate, so that the cooling effect of the shatter is large and the contamination in the vacuum container can be reduced. .
〈発明の効果〉 以上のようにこの発明によれば、シヤツターの幅寸法が
小さくなることより、真空容器の直径寸法を小さくする
ことが出来、更にシヤツターの支持金具およびアームの
材料も小さくすることが出来るので装置として小型にな
り経済的である。<Effects of the Invention> As described above, according to the present invention, the width dimension of the shutter is reduced, so that the diameter dimension of the vacuum vessel can be reduced, and further, the materials of the support metal fittings and arms of the shutter are also reduced. Because it is possible, it becomes economical as the device becomes smaller.
第1図は、この発明の一実施例に係る膜形成装置を示す
概略図で、第2図はそのシヤツター部分の詳細図、第3
図は第1図の平面断面図を示す。 第5図は、従来例の膜形成装置を示す概略図で、第6図
はそのシヤツター部分の詳細図、第4図は第5図の平面
断面図を示す。 1……真空容器、2……基板、3……ホルダ、4……高
エネルギーイオン源、41……高エネルギーのイオンビー
ム、5……低エネルギーイオン源、51……低エネルギー
のイオンビーム、6,7……蒸発源、61,71……蒸発物質、
8……シヤツター、9……ホルダ駆動装置。FIG. 1 is a schematic view showing a film forming apparatus according to an embodiment of the present invention, and FIG. 2 is a detailed view of a shutter portion thereof, and FIG.
The figure shows a cross-sectional plan view of FIG. FIG. 5 is a schematic view showing a film forming apparatus of a conventional example, FIG. 6 is a detailed view of a shutter portion thereof, and FIG. 4 is a plan sectional view of FIG. 1 ... Vacuum container, 2 ... Substrate, 3 ... Holder, 4 ... High energy ion source, 41 ... High energy ion beam, 5 ... Low energy ion source, 51 ... Low energy ion beam, 6,7 …… Evaporation source, 61,71 …… Evaporation material,
8: Shutter, 9: Holder drive device.
フロントページの続き (72)発明者 村松 智 京都府京都市右京区梅津高畝町47番地 日 新電機株式会社内 審査官 影山 秀一Front Page Continuation (72) Inventor Satoshi Muramatsu 47 Umezu Takaunecho, Ukyo-ku, Kyoto City Kyoto Prefecture Shuichi Kageyama Examiner, Nissin Electric Co., Ltd.
Claims (1)
照射と蒸発源による真空蒸着を併用して基板表面に膜を
形成する装置において、真空容器内に設けられていて基
板を保持可能なホルダと、互いに異なる方向からホルダ
の方に向けられていてイオンビームを発生する複数のイ
オン源と、1台以上の蒸発源と、イオン源にそれぞれ向
かい合う面を擁し、基板に入射するイオンビームおよび
蒸発物質を断続する1台のシヤツターを備えることを特
徴とする膜形成装置。1. An apparatus for forming a film on a substrate surface by using both ion beam irradiation by an ion source and vacuum evaporation by an evaporation source in a vacuum container, and a holder provided in the vacuum container and capable of holding a substrate. , An ion beam and an evaporating substance which are incident on a substrate, each of which has a plurality of ion sources directed toward the holder from different directions to generate an ion beam, one or more evaporation sources, and a surface facing the ion source. A film forming apparatus, comprising one shutter for intermittently connecting and disconnecting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26625386A JPH0733571B2 (en) | 1986-11-08 | 1986-11-08 | Film forming equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26625386A JPH0733571B2 (en) | 1986-11-08 | 1986-11-08 | Film forming equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63121655A JPS63121655A (en) | 1988-05-25 |
| JPH0733571B2 true JPH0733571B2 (en) | 1995-04-12 |
Family
ID=17428407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26625386A Expired - Fee Related JPH0733571B2 (en) | 1986-11-08 | 1986-11-08 | Film forming equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0733571B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4942063A (en) * | 1989-04-20 | 1990-07-17 | North American Philips Corporation | Method for controlling the thickness distribution of an interference filter |
| US4982695A (en) * | 1989-04-20 | 1991-01-08 | North American Philips Corporation | Method and apparatus for controlling the thickness distribution of an interference filter |
-
1986
- 1986-11-08 JP JP26625386A patent/JPH0733571B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63121655A (en) | 1988-05-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |