JPH0748372B2 - Ion source for mass spectrometer - Google Patents
Ion source for mass spectrometerInfo
- Publication number
- JPH0748372B2 JPH0748372B2 JP62219323A JP21932387A JPH0748372B2 JP H0748372 B2 JPH0748372 B2 JP H0748372B2 JP 62219323 A JP62219323 A JP 62219323A JP 21932387 A JP21932387 A JP 21932387A JP H0748372 B2 JPH0748372 B2 JP H0748372B2
- Authority
- JP
- Japan
- Prior art keywords
- porous member
- primary beam
- sample
- ion source
- sample liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Electron Tubes For Measurement (AREA)
Description
【発明の詳細な説明】 [産業上の利用分野] 本発明は、一次ビームを試料に照射し、その衝撃で試料
をイオン化する方式の質量分析装置用イオン源に関し、
特に液体クロマトグラフからの試料液をオンラインでイ
オン化室に直接導入してイオン化する場合に使用して好
適なイオン源を提供するものである。TECHNICAL FIELD The present invention relates to an ion source for a mass spectrometer, in which a sample is irradiated with a primary beam and the sample is ionized by the impact of the sample.
In particular, the present invention provides a suitable ion source to be used when the sample liquid from the liquid chromatograph is directly introduced online into the ionization chamber for ionization.
[従来の技術] 液体クロマトグラフで分離した試料液を質量分析装置に
直接導入する方式のイオン源として、第5図に示すよう
な構造のものがある。[Prior Art] As an ion source of a type in which a sample liquid separated by a liquid chromatograph is directly introduced into a mass spectrometer, there is an ion source having a structure as shown in FIG.
第5図において、1は質量分析装置の質量分析系、2は
イオン源、3はイオン化室、4はイオン化室内で生成さ
れたイオンの加速と集束を行なう電極群、5は一次ビー
ム発生器、6は液体クロマトグラフ、7は液体クロマト
グラフ6で分離された試料液をイオン化室3内に導入す
るための導入管である。この導入管としては例えばフュ
ーズドシリカ管が用いられる。また、イオン化室内に挿
入された導入管7の先端部には、拡大断面図を第6図に
示すように、ステンレス管8が被せられ、さらに、その
外側にガラス管(ステンレス等の金属管でも良い)9が
被せられている。そして、導入管の開口部を塞ぐように
多孔性部材10が取付けられている。この多孔性部材とし
ては、例えばステンレスの粉末を焼結して作成したフィ
ルタ(フリット)が使用される。尚、前記ステンレス管
8にはリペラ電源11から適宜な電圧が印加される。In FIG. 5, 1 is a mass analysis system of a mass spectrometer, 2 is an ion source, 3 is an ionization chamber, 4 is an electrode group for accelerating and focusing the ions generated in the ionization chamber, 5 is a primary beam generator, Reference numeral 6 is a liquid chromatograph, and 7 is an introduction tube for introducing the sample liquid separated by the liquid chromatograph 6 into the ionization chamber 3. A fused silica tube, for example, is used as the introduction tube. Further, as shown in an enlarged cross-sectional view of FIG. 6, the tip portion of the introduction tube 7 inserted into the ionization chamber is covered with a stainless tube 8 and, further, a glass tube (a metal tube such as stainless steel is also provided on the outside thereof). Good) 9 is covered. Then, the porous member 10 is attached so as to close the opening of the introduction tube. As this porous member, for example, a filter (frit) made by sintering stainless powder is used. An appropriate voltage is applied to the stainless pipe 8 from a repeller power supply 11.
かかる構成において、液体クロマトグラフ6で分離され
た試料液は導入管7を介して順次イオン化室3内に導入
され、導入管先端に取付けられている多孔性部材10の中
を通って表面に滲出する。表面に滲出した試料液は、一
次ビーム発生器5からの一次ビームBの衝撃を受けてイ
オン化され、生成されたイオンは質量分析部1へ導入さ
れ質量分析される。In such a configuration, the sample liquid separated by the liquid chromatograph 6 is sequentially introduced into the ionization chamber 3 through the introduction pipe 7, and exudes to the surface through the porous member 10 attached to the tip of the introduction pipe. To do. The sample liquid that has exuded to the surface is impacted by the primary beam B from the primary beam generator 5 and is ionized, and the generated ions are introduced into the mass spectrometric section 1 for mass analysis.
[発明が解決しようとする問題点] ところで液体クロマトグラフ6で分離された試料液を多
孔性部材10の表面に滲出させるにあたっては、従来第6
図に示すように試料液を多孔性部材の裏側から導入して
表側(一次ビーム照射面)に滲出させている。試料液中
の溶媒成分は多孔性部材を通過する途中で蒸発するため
一次ビーム照射面に到達する時点では試料成分の濃度が
高くなっている。この濃縮作用を高めて生成イオン量を
多くし感度を向上させようとすると、多孔性部材の試料
液導入管から滲出面までの距離(厚さ)tを長くする必
要がある。[Problems to be Solved by the Invention] Meanwhile, in exuding the sample liquid separated by the liquid chromatograph 6 onto the surface of the porous member 10, the conventional sixth method is used.
As shown in the figure, the sample solution is introduced from the back side of the porous member and exudes to the front side (primary beam irradiation surface). Since the solvent component in the sample liquid evaporates while passing through the porous member, the concentration of the sample component is high at the time of reaching the primary beam irradiation surface. In order to increase the concentration action to increase the amount of produced ions and improve the sensitivity, it is necessary to lengthen the distance (thickness) t from the sample liquid introducing tube of the porous member to the exuding surface.
ところが、このように多孔性部材の厚さtを大きくする
と、試料液の流速が遅くなって試料液は多孔性部材内で
試料注入部を中心とした球面状に拡散しながら移動す
る。そのため、第7図に示すように導入管7を介してあ
る試料液Fを多孔性部材10に注入した場合、直進した部
分F1が最初に多孔性部材の一次ビーム照射面Aの中心部
に到達して滲出し、拡散して移動した部分F2がある時間
遅れて一次ビーム照射面Aに到達してその周囲に滲出す
る。However, when the thickness t of the porous member is increased in this way, the flow rate of the sample liquid slows down, and the sample liquid moves while diffusing into a spherical shape centered on the sample injection portion within the porous member. Therefore, as shown in FIG. 7, when the sample solution F is introduced into the porous member 10 through the introduction tube 7, the straight portion F1 first reaches the central portion of the primary beam irradiation surface A of the porous member. Then, the portion F2 that has exuded and diffused and moved reaches the primary beam irradiation surface A with a certain time delay and exudes to the periphery thereof.
このように同時に注入された試料成分が一次ビーム照射
面Aの異なった位置に異なった時刻に滲出するという現
象は、液体クロマトグラフで分離された試料液を導入し
た場合、前の試料成分と次の試料成分とが一次ビーム照
射面Aに同時に滲出してイオン化されることにつなが
り、それがメモリ現象の原因となる。As described above, the phenomenon that the simultaneously injected sample components exude to different positions of the primary beam irradiation surface A at different times is due to the fact that when the sample liquid separated by the liquid chromatograph is introduced, And the sample component of (3) simultaneously exude to the primary beam irradiation surface A and are ionized, which causes a memory phenomenon.
これを防止するために一次ビーム照射面の前方に一次ビ
ーム通過穴を形成したキャップを配置し、多孔性部材の
中心部だけに一次ビームを照射することが考えられる
が、この方法では一次ビームによる試料液の照射領域が
少なく、イオン発生量が少なくて感度が低い欠点があ
る。この場合、イオン量を多くするために、一次ビーム
量を多くすることも考えられるが、多孔性部材が損傷し
たり試料が破壊される恐れがある。In order to prevent this, a cap with a primary beam passage hole formed in front of the primary beam irradiation surface may be placed to irradiate only the central portion of the porous member with the primary beam. There are disadvantages that the sample liquid irradiation area is small, the amount of generated ions is small, and the sensitivity is low. In this case, the primary beam amount may be increased in order to increase the ion amount, but there is a risk that the porous member will be damaged or the sample will be destroyed.
そこで本発明はかかる不都合に鑑みてなされたものであ
り、簡単な構成によりメモリ現象の発生を防止しつつ感
度の向上を図ることのできるイオン源を提供することを
目的とするものである。Therefore, the present invention has been made in view of such inconvenience, and an object thereof is to provide an ion source capable of improving the sensitivity while preventing the occurrence of a memory phenomenon with a simple configuration.
[問題点を解決するための手段] 上記目的を達成するため、本発明は、イオン化室と、外
部から該イオン化室内に試料液を導入するための導入管
と、該導入管の先端に配置され該導入管から試料液が内
部に注入される多孔性部材と、該多孔性部材を通りその
表面に滲出した試料液に一次ビームを照射してイオン化
するための一次ビーム発生手段とを備えた装置におい
て、試料液が多孔性部材内をその一次ビーム照射面に沿
って流れるように前記導入管から多孔性部材へ試料液を
注入すると共に、一次ビームの照射領域を制限する照射
領域制限部材を一次ビーム発生手段と多孔性部材との間
に配置したことを特徴としている。[Means for Solving the Problems] In order to achieve the above object, the present invention provides an ionization chamber, an introduction pipe for introducing a sample solution into the ionization chamber from the outside, and a distal end of the introduction pipe. Apparatus provided with a porous member into which the sample liquid is injected from the introduction tube, and a primary beam generating means for irradiating the sample liquid that has passed through the porous member and exuded to its surface with a primary beam for ionization In, while injecting the sample liquid from the introduction tube into the porous member so that the sample liquid flows along the primary beam irradiation surface in the porous member, a primary irradiation region limiting member for limiting the primary beam irradiation region is provided. It is characterized in that it is arranged between the beam generating means and the porous member.
以下、本発明の実施例を図面に基づいて詳説する。Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
[実施例] 第1図は本発明を実施した質量分析装置用イオン源の一
例を示す要部拡大断面図、第2図は第1図の左側面図、
第3図及び第4図は本発明の動作を説明するための図で
あり、第5図及び第6図と同一符号は同一構成要素を示
している。[Examples] FIG. 1 is an enlarged sectional view of an essential part showing an example of an ion source for a mass spectrometer according to the present invention, FIG. 2 is a left side view of FIG.
3 and 4 are diagrams for explaining the operation of the present invention, and the same reference numerals as those in FIGS. 5 and 6 denote the same components.
本実施例では円盤状の多孔性部材10の上部外周面(端
部)に導入管7の開放端を取付けることにより試料液S
が前記多孔性部材の一次ビーム照射面A(以下面Aと称
す)に沿って多孔性部材内を流れるようにしたことを特
徴とする。尚、同図中、12は前記多孔性部材10を支持す
る支持棒で、イオン源2側壁に挿脱可能に取付けられて
いる。13はこの支持棒12の先端部に面Aを包囲するよう
に被せられた有底状のキャップで、その底部に楕円状の
一次ビーム通過穴14が形成されている。In this embodiment, the sample solution S is formed by attaching the open end of the introduction tube 7 to the upper outer peripheral surface (end) of the disk-shaped porous member 10.
Is allowed to flow in the porous member along the primary beam irradiation surface A (hereinafter referred to as surface A) of the porous member. In the figure, reference numeral 12 is a support rod for supporting the porous member 10, which is removably attached to the side wall of the ion source 2. Reference numeral 13 denotes a bottomed cap which covers the tip end of the support rod 12 so as to surround the surface A, and an elliptical primary beam passage hole 14 is formed in the bottom portion.
かかる構成において、導入管7から導入された試料液S
は多孔性部材10内をその面Aに沿って流れ、下方へ移動
してやがて多孔性部材10外に出て行く。その移動の過程
で、試料液中の溶媒成分は気化し、試料成分の濃度が高
まって行く。In such a configuration, the sample solution S introduced from the introduction tube 7
Flows in the porous member 10 along the surface A, moves downward, and eventually leaves the porous member 10. During the transfer process, the solvent component in the sample liquid is vaporized, and the concentration of the sample component increases.
第3図(a)は一定濃度の試料液を連続的に流した時の
面A上における濃度の変化の様子を等濃度曲線で表わし
たもので、同図(b)は面A上の線lに沿った濃度変化
を示す。この2つの図から、導入管7から多孔性部材10
内に注入された試料液が放射状に広がって行き、それと
共に急激に濃縮されて行く様子が分る。また、同図
(c)は線lに沿った流速の変化を示し、濃縮が進み、
濃度が高まるにつれて粘度が増し、移動速度が急激に低
下することが分る。FIG. 3 (a) shows a change in concentration on the surface A when a sample solution having a constant concentration is continuously flowed by an equal concentration curve, and FIG. 3 (b) shows a line on the surface A. The change in concentration along l is shown. From these two figures, from the introduction pipe 7 to the porous member 10
It can be seen that the sample liquid injected inside spreads radially and was rapidly concentrated with it. Further, FIG. 7C shows the change of the flow velocity along the line l, and the concentration proceeds,
It can be seen that the viscosity increases as the concentration increases, and the moving speed decreases rapidly.
このことから、第4図(a)に示すようにピークa〜e
を持つクロマトグラムで表わされる液体クロマトグラフ
からの流出液を導入管7を介して多孔性部材10に流した
場合、同図(b)に示すようにピークeが面Aの中央部
分に到達した時点で、既に通過したピークa〜dが面A
の下部に残っているという事態が起こり得る。From this fact, as shown in FIG.
When the effluent from the liquid chromatograph represented by the chromatogram having the above is flown into the porous member 10 through the introduction pipe 7, the peak e reaches the central portion of the surface A as shown in FIG. At this point, the peaks a to d which have already passed are on the surface A
It can happen that it remains at the bottom of the.
そのため、面A全体に一次ビームを照射したのでは、各
ピークの部分に存在する試料成分のイオンが同時に発生
してしまい、メモリ現象が起こることは避けられない。Therefore, if the entire surface A is irradiated with the primary beam, the ions of the sample component existing in the respective peak portions are simultaneously generated, and the memory phenomenon cannot be avoided.
それを避けるためには、試料液の移動速度が大きな面A
の上部だけに一次ビームを照射すれば良いが、最上部に
近い部分では濃縮が進んでおらず、生成イオン量が少な
い。In order to avoid this, the surface A where the moving speed of the sample solution is high
It is sufficient to irradiate only the upper part of the primary beam with the primary beam, but the concentration near the uppermost part is not advanced and the amount of produced ions is small.
そこで、移動速度と濃縮の程度との兼ね合いから、例え
ば第4図(b)中で破線で囲んだ中央部分に一次ビーム
通過穴14を設定し、この部分だけに一次ビームが照射さ
れるように一次ビーム照射領域を制限すれば、メモリ現
象を防ぎつつ生成イオン量の多い効率の良いイオン化を
行うことができる。Therefore, considering the balance between the moving speed and the degree of concentration, for example, the primary beam passage hole 14 is set in the central portion surrounded by the broken line in FIG. 4 (b) so that only this portion is irradiated with the primary beam. By limiting the primary beam irradiation area, efficient ionization with a large amount of generated ions can be performed while preventing the memory phenomenon.
また、支持棒12の下端に開口15が設けてあるので、多孔
性部材10の下部に溜まった試料液が、すみやかにキャッ
プ13内に排出されるため、多孔性部材10の下方に溜まっ
た試料液がビーム照射されている面Aの条件を乱すこと
がない。Further, since the opening 15 is provided at the lower end of the support rod 12, the sample liquid accumulated in the lower portion of the porous member 10 is promptly discharged into the cap 13, so that the sample accumulated below the porous member 10 The condition of the surface A on which the liquid is irradiated with the beam is not disturbed.
尚、前述の説明は本発明の一例であり、実施にあたって
は幾多の変形が考えられる。例えば多孔性部材に対する
導入管の取付け位置は上記実施例のように上方端部に限
定されることなく、左右端部あるいは下方端部もしくは
いずれかの端部近傍の側面(面Aと平行な面)でも良
い。ただし、重力の作用を考えると上記実施例のように
上方に配置する方が有利である。The above description is an example of the present invention, and various modifications can be considered in the implementation. For example, the mounting position of the introduction tube with respect to the porous member is not limited to the upper end portion as in the above-described embodiment, and the side surface (a surface parallel to the surface A) near the left and right end portions or the lower end portion or any one of the end portions. ) Is okay. However, in consideration of the action of gravity, it is more advantageous to arrange it above as in the above embodiment.
また、多孔性部材の形状は、円盤状に限らず矩形状でも
良い。Further, the shape of the porous member is not limited to a disc shape, and may be a rectangular shape.
また、キャップ13内を真空ポンプにより排気することに
より、一次ビーム通過穴14側に流出する面Aからの気化
ガスを減少させれば、該通過穴14を介して取出されるイ
オンが気化ガス分子と衝突して消滅する確率が低くなる
ため、面Aから発生したイオンを効率良く質量分析系へ
導くことができ、感度の向上を図ることができる。Further, if the vaporized gas from the surface A flowing out to the primary beam passage hole 14 side is reduced by exhausting the inside of the cap 13 with a vacuum pump, the ions taken out through the passage hole 14 are vaporized gas molecules. Since the probability of collision with and disappearance is reduced, the ions generated from the surface A can be efficiently guided to the mass analysis system, and the sensitivity can be improved.
[効果] 以上詳述した如く本発明によれば、メモリ現象の発生を
防止しつつ感度の向上を図ることのできるイオン源を得
ることができる。[Effect] As described in detail above, according to the present invention, it is possible to obtain an ion source capable of improving the sensitivity while preventing the occurrence of the memory phenomenon.
第1図は本発明の一実施例を示す概略図、第2図は第1
図の左側面図、第3図及び第4図は本発明の動作を説明
するための図、第5図乃至第7図は従来例を説明するた
めの図である。 1:質量分析部、2:イオン源 3:イオン化室、4:電極群 5:一次ビーム発生器 6:液体クロマトグラフ 7:導入管、10:多孔性部材 12:支持棒、13:キャップ 14:一次ビーム通過穴 15:開口FIG. 1 is a schematic view showing an embodiment of the present invention, and FIG.
Left side views of the drawings, FIGS. 3 and 4 are views for explaining the operation of the present invention, and FIGS. 5 to 7 are views for explaining a conventional example. 1: Mass spectrometric section, 2: Ion source 3: Ionization chamber, 4: Electrode group 5: Primary beam generator 6: Liquid chromatograph 7: Introduction tube, 10: Porous member 12: Support rod, 13: Cap 14: Primary beam passage hole 15: Aperture
Claims (1)
試料液を導入するための導入管と、該導入管の先端に配
置され該導入管から試料液が内部に注入される多孔性部
材と、該多孔性部材を通りその表面に滲出した試料液に
一次ビームを照射してイオン化するための一次ビーム発
生手段とを備えた装置において、試料液が多孔性部材内
をその一次ビーム照射面に沿って流れるように前記導入
管から多孔性部材へ試料液を注入すると共に、一次ビー
ムの照射領域を制限する照射領域制限部材を一次ビーム
発生手段と多孔性部材との間に配置したことを特徴とす
る質量分析装置用イオン源。1. An ionization chamber, an introduction pipe for introducing a sample liquid into the ionization chamber from the outside, and a porous member arranged at the tip of the introduction pipe and injecting the sample liquid into the inside from the introduction pipe. In a device provided with a primary beam generating means for irradiating a sample solution exuding on the surface thereof through the porous member with a primary beam to ionize the sample solution, the sample solution is irradiated inside the porous member on its primary beam irradiation surface. The sample liquid is injected into the porous member from the introduction pipe so as to flow along the irradiation region, and an irradiation region limiting member for limiting the irradiation region of the primary beam is arranged between the primary beam generating means and the porous member. Ion source for mass spectrometer.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62219323A JPH0748372B2 (en) | 1987-09-02 | 1987-09-02 | Ion source for mass spectrometer |
| US07/136,141 US4818863A (en) | 1986-12-27 | 1987-12-21 | Ion source for use in a mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62219323A JPH0748372B2 (en) | 1987-09-02 | 1987-09-02 | Ion source for mass spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6463251A JPS6463251A (en) | 1989-03-09 |
| JPH0748372B2 true JPH0748372B2 (en) | 1995-05-24 |
Family
ID=16733669
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62219323A Expired - Fee Related JPH0748372B2 (en) | 1986-12-27 | 1987-09-02 | Ion source for mass spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0748372B2 (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61116065U (en) * | 1984-12-28 | 1986-07-22 |
-
1987
- 1987-09-02 JP JP62219323A patent/JPH0748372B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6463251A (en) | 1989-03-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0123552B1 (en) | Method and apparatus for the mass spectrometric analysis of solutions | |
| US4383171A (en) | Particle analyzing method and apparatus | |
| JP3138527B2 (en) | Ion focusing method and apparatus in viscous flow jet expansion region of electrospray device | |
| JP4234441B2 (en) | Ionization method and apparatus for specimen and in-use ion source probe | |
| US6849848B2 (en) | Method and apparatus for cooling and focusing ions | |
| US7642511B2 (en) | Ultra high mass range mass spectrometer systems | |
| JP2000057989A (en) | Mass spectrometer and mass spectrometry | |
| US6972408B1 (en) | Ultra high mass range mass spectrometer systems | |
| EP0052140A1 (en) | Ion vapor source for mass spectrometry of liquids | |
| JPH0748372B2 (en) | Ion source for mass spectrometer | |
| JP3620120B2 (en) | Method and apparatus for mass spectrometry of solutions | |
| de Wit et al. | Photoionization detector for open-tubular liquid chromatography | |
| JPH0830695B2 (en) | Liquid chromatograph / mass spectrometer | |
| US4810878A (en) | Ion source for mass spectrometer | |
| JP4444938B2 (en) | Liquid Chromatograph / Laser Desorption / Ionization Time-of-Flight Mass Spectrometer | |
| US4818863A (en) | Ion source for use in a mass spectrometer | |
| JP3948096B2 (en) | LC / MS interface | |
| JPS6235255A (en) | Liquid chromatograph mass spectrometer | |
| JPH0894579A (en) | Gas chromatograph-mass spectrometer | |
| JPH0754691B2 (en) | Ion source for mass spectrometer | |
| JPS5774957A (en) | Ionizing device of mass spectrometer | |
| JPH0626108B2 (en) | Ion source for mass spectrometer | |
| JPH0429181B2 (en) | ||
| GB2202671A (en) | Ion source for mass spectrometer | |
| Stanley | The direct analysis of thin layer chromatograms and planar electropherograms with chromatography/SIMS |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |