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JPH0756493B2 - Method for manufacturing conductive contact terminal - Google Patents
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JPH0756493B2 - Method for manufacturing conductive contact terminal - Google Patents

Method for manufacturing conductive contact terminal

Info

Publication number
JPH0756493B2
JPH0756493B2 JP29757892A JP29757892A JPH0756493B2 JP H0756493 B2 JPH0756493 B2 JP H0756493B2 JP 29757892 A JP29757892 A JP 29757892A JP 29757892 A JP29757892 A JP 29757892A JP H0756493 B2 JPH0756493 B2 JP H0756493B2
Authority
JP
Japan
Prior art keywords
conductive
contact terminal
insulating member
conductive contact
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP29757892A
Other languages
Japanese (ja)
Other versions
JPH06109762A (en
Inventor
保幸 人見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nittoseiko Co Ltd
Original Assignee
Nittoseiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nittoseiko Co Ltd filed Critical Nittoseiko Co Ltd
Priority to JP29757892A priority Critical patent/JPH0756493B2/en
Publication of JPH06109762A publication Critical patent/JPH06109762A/en
Publication of JPH0756493B2 publication Critical patent/JPH0756493B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、液晶表示パネル等ガラ
スあるいはPC板等に印刷配線された直線配列式極小ピ
ッチの高密度微細なパターンを有する電子部品を対象
に、各種の試験・測定を行う際の電気接続部に使用され
る導通接触端子の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is applicable to various kinds of tests and measurements for electronic parts having a high density and fine pattern of a linear array and a very small pitch, which are printed and printed on a glass such as a liquid crystal display panel or a PC board. The present invention relates to a method of manufacturing a conductive contact terminal used for an electric connection portion when performing.

【0002】[0002]

【従来の技術】一般に、極小ピッチの微細なパターンを
有する液晶表示パネルや電子基板を対象にした試験およ
び測定装置の電気接続を行う接触端子としては、コンタ
クトプローブピンやプローブカードおよび導電ゴム等が
知られている。
2. Description of the Related Art Generally, contact probe pins, probe cards, conductive rubber, etc. are used as contact terminals for electrically connecting a test and measurement apparatus for a liquid crystal display panel or an electronic substrate having a fine pattern with an extremely small pitch. Are known.

【0003】[0003]

【発明が解決しようとする課題】しかし、これら従来の
技術による接触端子では次のような課題が生じている。
まず、コンタクトプローブピンは高価で、その上にコン
タクトプローブピンを微小間隔で多数保持するボードの
穴加工は高度な技術を要するために、製作費が高くなる
とともに、コンタクト部が目視で確認できない欠点があ
る。またプローブカードも高価であり、それを微少間隔
で多数個並べる高度な技術を要し、製作費が高くなる問
題がある。一方、導電ゴムにおいても高価であるととも
にコンタクト部が目視で確認できない欠点があり、さら
に測定ポイント範囲が広くなると相手基板に対して均一
な接触圧が得られないことや、またコンタクト部にゴム
を含有したシリコンが付着する問題が生じている。この
他にも絶縁板に微少間隔で多数個の溝を掘り、これにワ
イヤを並べたものもあるが、この方法も非常に製作費が
高くなる欠点がある。本発明はこれらの課題を解消し、
直線配列式の微細パターンに確実に対応して電気接続で
きる安価な接触端子を製作することを目的として発明さ
れたものである。
However, the contact terminals according to these conventional techniques have the following problems.
First of all, the contact probe pins are expensive, and the process of making holes on a board that holds a large number of contact probe pins at minute intervals requires sophisticated technology, which increases the manufacturing cost and makes it difficult to visually confirm the contact part. There is. Further, the probe card is also expensive, and requires a high technology for arranging a large number of the probe cards at a minute interval, which causes a problem of high manufacturing cost. On the other hand, conductive rubber is also expensive and has the drawback that the contact part cannot be visually confirmed. Further, if the measurement point range becomes wider, it is not possible to obtain a uniform contact pressure with the mating substrate. There is a problem that the contained silicon adheres. In addition to this, there is also a method in which a large number of grooves are dug in the insulating plate at minute intervals and wires are arranged on this, but this method also has a drawback that the manufacturing cost becomes very high. The present invention solves these problems,
The invention was invented for the purpose of manufacturing an inexpensive contact terminal which can be electrically connected to a linear array type fine pattern without fail.

【0004】[0004]

【課題を解決するための手段】この目的を達成するた
め、ガラス板等の絶縁部材2に、りん青銅板等のばね性
を有する極小幅の導電部材3を微小間隔で多数、しかも
前記導電部材3の先端を前記絶縁部材2の一端から所定
寸法だけ突出させて固着する導通接触端子1の製造方法
であって、前記導電部材3を所定の寸法、配置にエッチ
ング加工した後、絶縁部材2に接着固定し、その後導電
部材3の両端を切断する導通接触端子1の製造方法であ
る。
To achieve this object, a large number of electrically conductive members 3 having a spring property, such as phosphor bronze plates, are provided at a minute interval on an insulating member 2 such as a glass plate. A method for manufacturing a conductive contact terminal 1 in which a tip of 3 is projected and fixed from one end of the insulating member 2 by a predetermined dimension, the conductive member 3 is etched into a predetermined dimension and arranged, and then the insulating member 2 is formed. This is a manufacturing method of the conductive contact terminal 1 in which the conductive contact member 1 is bonded and fixed and then both ends of the conductive member 3 are cut.

【0005】[0005]

【作用】導電部材3が連なるように両端に余裕を残した
状態でエッチング加工をしているため、導電部材3を微
少間隔で正確に多数配置することができるとともに加工
後の反りや歪が少ない。また、絶縁部材2は被測定基板
と同じ材料を使用し、エッチング加工によって正確に配
列された導電部材3を接着することにより、高温試験な
ど温度変化を伴う試験・測定時も被測定基板のパターン
とのピッチずれがなく正確に電気接続することができ
る。
Since the etching process is performed with a margin left at both ends so that the conductive members 3 are connected, a large number of conductive members 3 can be accurately arranged at minute intervals and warpage and distortion after processing are small. . In addition, the insulating member 2 is made of the same material as the substrate to be measured, and the conductive member 3 accurately arranged by etching is adhered, so that the pattern of the substrate to be measured can be used even during a test or measurement involving temperature change such as a high temperature test. It is possible to make an accurate electrical connection without any pitch deviation from.

【0006】[0006]

【実施例】以下、図面に基づき本発明の一実施例を説明
する。図1は導電部材3のエッチング加工の完了図であ
る。この加工はまず、導電部材3の素材として厚さ0.
05〜0.08mmのばね用りん青銅板を使用し、縦1
6.5mm、横50.91mmに切断する。次に、この
ばね用りん青銅板の両端にそれぞれ2mmを残し、幅
0.08mmの導電部がピッチ0.17mmに多数配列
された状態(図2)にエッチング加工を行う。図1に示
す短冊形の部分がエッチング加工による多数の角長穴で
ある。そして、このエッチング加工が完了したものに金
めっきを施す。一方、図3は絶縁部材2の加工説明図で
ある。絶縁部材2には厚さ2mmのガラス板を使用し、
縦8mm、横80mmに形成した後、接着部2a(導電
部材を接着する面)をスリガラス状に粗荒加工を施す。
次に、図4の接着説明図に示すように絶縁部材2に前記
エッチング加工した導電部材3を耐熱接着剤により所定
の位置に接着する。続いて図5に示すように、絶縁部材
2に接着した導電部材3の突き出した一方を絶縁部材2
の一端から3mmに切断する。そしてこの導電部材3の
先端部3aはラッピング加工を行い、さらに金めっきを
施す。次に図6に示すように、導電部材3の他の一方を
絶縁部材2に沿って切断する。その後、図7に示すよう
に剥離防止のため押え板(ガラス板)4を接着して導通
接触端子1が完成する。その側面図を図8に示す。当然
のことながら、前述の実施例の各部寸法は、対象となる
被試験基板のパターンによって異なり、所望の寸法に自
由に製作することができる。尚、導電部材3は、導電性
が良くかつばね性を有する材料(例えばりん青銅板、ベ
リリュウム銅板等)であればよい。また絶縁部材2およ
び押え板4は、対象となる被試験基板に使用されている
材料(例えばガラス、セラミツク等)を使用するのが最
適である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing the completion of etching of the conductive member 3. This processing is first performed as a material of the conductive member 3 with a thickness of 0.
A phosphor bronze plate for springs with a diameter of 05 to 0.08 mm is used.
Cut to 6.5 mm and 50.91 mm wide. Next, the phosphor bronze plate for spring is left with 2 mm at each end, and etching is performed in a state where a large number of conductive parts having a width of 0.08 mm are arranged at a pitch of 0.17 mm (FIG. 2). The strip-shaped portion shown in FIG. 1 is a large number of rectangular long holes formed by etching. Then, gold plating is applied to the product after the etching process. On the other hand, FIG. 3 is a processing explanatory view of the insulating member 2. A glass plate with a thickness of 2 mm is used for the insulating member 2,
After being formed to have a length of 8 mm and a width of 80 mm, the bonding portion 2a (the surface to which the conductive member is bonded) is roughly roughened into ground glass.
Next, as shown in the adhesion explanatory view of FIG. 4, the conductive member 3 which has been subjected to the etching processing is adhered to the insulating member 2 at a predetermined position with a heat resistant adhesive. Subsequently, as shown in FIG. 5, one of the protruding conductive members 3 bonded to the insulating member 2 is attached to the insulating member 2.
Cut 3 mm from one end of the. The tip 3a of the conductive member 3 is lapped and then gold plated. Next, as shown in FIG. 6, the other one of the conductive members 3 is cut along the insulating member 2. Thereafter, as shown in FIG. 7, a holding plate (glass plate) 4 is adhered to prevent separation, and the conductive contact terminal 1 is completed. The side view is shown in FIG. As a matter of course, the size of each part of the above-described embodiment differs depending on the pattern of the target substrate under test, and can be freely manufactured to a desired size. The conductive member 3 may be made of a material having good conductivity and spring properties (for example, phosphor bronze plate, beryllium copper plate, etc.). Further, the insulating member 2 and the holding plate 4 are optimally made of the material (for example, glass, ceramics, etc.) used for the target substrate under test.

【0007】[0007]

【発明の効果】以上の説明で明らかなように本発明は、
ガラス板等の絶縁部材に、りん青銅板等のばね性を有す
る極小幅の導電部材を微小間隔で多数、しかも前記導電
部材の先端を前記絶縁部材の一端から所定寸法だけ突出
させて固着する導通接触端子の製造方法であって、前記
導電部材を所定の寸法、配置にエッチング加工した後、
絶縁部材に接着固定し、その後導電部材の両端を切断す
る導通接触端子の製造方法である。
As is apparent from the above description, the present invention is
Conduction in which a large number of spring-like conductive members having a very small width such as phosphor bronze plates are attached to an insulating member such as a glass plate at minute intervals, and the tip of the conductive member is fixed by protruding by a predetermined dimension from one end of the insulating member. A method of manufacturing a contact terminal, which comprises etching the conductive member into a predetermined size and arrangement,
This is a method of manufacturing a conductive contact terminal, which is adhesively fixed to an insulating member and then both ends of the conductive member are cut.

【0008】この発明によれば、極小幅の多数の導電部
材が連なった状態でエッチング加工をしているため、導
電部材を微少間隔で正確に多数配置することができると
ともに加工後の反りや歪が少ない。またこの方法による
と、接触端子は従来の10分の1という極めて低価格で
製作できるため、測定装置や試験装置が安価になる大き
な利点がある。さらに被試験基板と接触端子の絶縁部材
とを同じ材料にすることにより熱膨脹率が等しくなるた
め、温度変化を伴う測定・試験等においてピッチのずれ
がなく確実に電気接続できる。さらにこの方法では、ピ
ッチ0.1mmの微細パターンに対応できる導通接触端
子が製作可能であり、140°Cまでの温度にも対応が
可能である。また、TABテープに直接接続できるた
め、外部との信号接続が可能になるとともに、ノイズ損
傷のない極めて短い接続が可能になるなど本発明特有の
大きな効果が得られる。
According to the present invention, since the etching process is carried out in a state where a large number of conductive members having a very small width are connected, it is possible to accurately arrange a large number of conductive members at a minute interval and to prevent warpage and distortion after processing. Less is. Further, according to this method, the contact terminal can be manufactured at an extremely low price of 1/10 of that of the conventional method, which is a great advantage that the measuring device and the test device are inexpensive. Furthermore, since the substrate under test and the insulating material of the contact terminal are made of the same material, the coefficient of thermal expansion becomes equal, so that there is no pitch deviation in measurement / testing or the like involving temperature changes, and reliable electrical connection is possible. Further, according to this method, a conductive contact terminal capable of handling a fine pattern with a pitch of 0.1 mm can be manufactured, and a temperature up to 140 ° C can be handled. Further, since it can be directly connected to the TAB tape, the signal connection with the outside can be realized, and the extremely short connection without noise damage can be achieved.

【図面の簡単な説明】[Brief description of drawings]

【図1】導電部材のエッチング加工工程の平面図であ
る。
FIG. 1 is a plan view of a step of etching a conductive member.

【図2】図1のA部拡大平面図である。FIG. 2 is an enlarged plan view of a portion A of FIG.

【図3】絶縁部材の加工説明平面図である。FIG. 3 is a plan view for explaining the processing of the insulating member.

【図4】絶縁部材に導電部材を接着する工程の平面図で
ある。
FIG. 4 is a plan view of a step of adhering a conductive member to an insulating member.

【図5】導電部材の一方を切断した平面図である。FIG. 5 is a plan view in which one of the conductive members is cut.

【図6】導電部材の他方を切断した平面図である。FIG. 6 is a plan view in which the other of the conductive members is cut.

【図7】押え板を接着した完成平面図である。FIG. 7 is a completed plan view in which a holding plate is bonded.

【図8】図7の側面図である。FIG. 8 is a side view of FIG. 7.

【符号の説明】[Explanation of symbols]

1 導通接触端子 2 絶縁部材(ガラス板) 2a 接着部 3 導電部材(ばね用りん青銅板) 3a 先端部 4 押え板(ガラス板) 1 Conductive Contact Terminal 2 Insulation Member (Glass Plate) 2a Adhesive Part 3 Conductive Member (Spring Phosphor Bronze Plate) 3a Tip 4 Holding Plate (Glass Plate)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 ガラス板等の絶縁部材に、りん青銅板等
のばね性を有する極小幅の導電部材を微小間隔で多数、
しかも前記導電部材の先端を前記絶縁部材の一端から所
定寸法だけ突出させて固着する導通接触端子の製造方法
であって、 前記導電部材を所定の寸法、配置にエッチング加工した
後、絶縁部材に接着固定し、その後導電部材の両端を切
断することを特徴とする導通接触端子の製造方法。
1. An insulating member such as a glass plate, and a large number of conductive members having a spring property such as a phosphor bronze plate and having a very small width, at minute intervals.
In addition, the method is a method for manufacturing a conductive contact terminal in which the tip of the conductive member is protruded from one end of the insulating member by a predetermined dimension and fixed, and the conductive member is bonded to the insulating member after being etched into a predetermined dimension and arrangement. A method for manufacturing a conductive contact terminal, which comprises fixing and then cutting both ends of a conductive member.
JP29757892A 1992-09-25 1992-09-25 Method for manufacturing conductive contact terminal Expired - Lifetime JPH0756493B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29757892A JPH0756493B2 (en) 1992-09-25 1992-09-25 Method for manufacturing conductive contact terminal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29757892A JPH0756493B2 (en) 1992-09-25 1992-09-25 Method for manufacturing conductive contact terminal

Publications (2)

Publication Number Publication Date
JPH06109762A JPH06109762A (en) 1994-04-22
JPH0756493B2 true JPH0756493B2 (en) 1995-06-14

Family

ID=17848372

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29757892A Expired - Lifetime JPH0756493B2 (en) 1992-09-25 1992-09-25 Method for manufacturing conductive contact terminal

Country Status (1)

Country Link
JP (1) JPH0756493B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2812220B2 (en) * 1994-10-31 1998-10-22 株式会社デンソー Self-luminous pointer type instrument
US6082288A (en) * 1994-10-31 2000-07-04 Nippondenso Co., Ltd. Indicating instrument having self-luminescent indicator
JP2680556B2 (en) * 1995-03-02 1997-11-19 株式会社双晶テック Probe unit

Also Published As

Publication number Publication date
JPH06109762A (en) 1994-04-22

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