JPH0778875B2 - Texture processing method for amorphous carbon substrate for magnetic disk - Google Patents
Texture processing method for amorphous carbon substrate for magnetic diskInfo
- Publication number
- JPH0778875B2 JPH0778875B2 JP41043690A JP41043690A JPH0778875B2 JP H0778875 B2 JPH0778875 B2 JP H0778875B2 JP 41043690 A JP41043690 A JP 41043690A JP 41043690 A JP41043690 A JP 41043690A JP H0778875 B2 JPH0778875 B2 JP H0778875B2
- Authority
- JP
- Japan
- Prior art keywords
- amorphous carbon
- carbon substrate
- magnetic disk
- surface roughness
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 title claims description 76
- 229910003481 amorphous carbon Inorganic materials 0.000 title claims description 60
- 238000003672 processing method Methods 0.000 title claims description 6
- 230000003746 surface roughness Effects 0.000 claims description 50
- 238000005498 polishing Methods 0.000 claims description 44
- 238000010438 heat treatment Methods 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 4
- 229910052760 oxygen Inorganic materials 0.000 claims description 4
- 239000001301 oxygen Substances 0.000 claims description 4
- 230000000052 comparative effect Effects 0.000 description 10
- 239000006061 abrasive grain Substances 0.000 description 8
- 238000001179 sorption measurement Methods 0.000 description 8
- 238000001513 hot isostatic pressing Methods 0.000 description 4
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 4
- 229910010271 silicon carbide Inorganic materials 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 229910052715 tantalum Inorganic materials 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 238000005339 levitation Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910003465 moissanite Inorganic materials 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910001018 Cast iron Inorganic materials 0.000 description 1
- 229910018104 Ni-P Inorganic materials 0.000 description 1
- 229910018536 Ni—P Inorganic materials 0.000 description 1
- -1 Zr O 2 Chemical compound 0.000 description 1
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 description 1
- 239000003082 abrasive agent Substances 0.000 description 1
- 238000003763 carbonization Methods 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
Landscapes
- Manufacturing Of Magnetic Record Carriers (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は磁気ヘッド浮揚面と磁気
ディスク表面との間に吸着現象が発生することを防止す
るためにテクスチャー処理する磁気ディスク用アモルフ
ァスカーボン基板のテクスチャー(Texture )処理方法
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a texture processing method for an amorphous carbon substrate for a magnetic disk, which is texture-processed to prevent an adsorption phenomenon between a magnetic head levitating surface and a magnetic disk surface. .
【0002】[0002]
【従来の技術】従来、磁気ディスクはNi−Pメッキ材
等が被覆されたAl基板上に磁性膜を形成して構成され
ている。そして、磁気ディスク再生装置においては、磁
気ディスク上に浮揚型磁気ヘッドを配置し、磁気ディス
クを回転させることにより前記磁気ヘッドを浮揚させた
状態で、この磁気ヘッドにより磁気ディスクへの書込み
又は再生を行う。しかしながら、磁気ディスクへの書込
み又は再生を行う際、ディスク静止時において磁気ヘッ
ド浮揚面と磁気ディスク表面との間に吸着が生じる場合
がある。この吸着現象は磁気ヘッド浮揚面及び磁気ディ
スク表面が極めて平滑であって双方が微小間隔で対面し
ているときに、その間隙がO2 、N2 又はH2 O等の分
子により埋め尽くされて界面張力により大きな吸着力が
発生することに起因する。このような吸着現象が発生す
ると、磁気ディスクを駆動するモータが起動するときに
多大の電力を消費するという不都合を招来する。2. Description of the Related Art Conventionally, a magnetic disk is constructed by forming a magnetic film on an Al substrate coated with a Ni--P plating material or the like. In the magnetic disk reproducing apparatus, a floating magnetic head is arranged on the magnetic disk, and the magnetic head is levitated by rotating the magnetic disk, and writing or reproducing to or from the magnetic disk is performed by this magnetic head. To do. However, when writing to or reproducing from a magnetic disk, adsorption may occur between the magnetic head levitation surface and the magnetic disk surface when the disk is stationary. This adsorption phenomenon is caused when the magnetic head levitation surface and the magnetic disk surface are extremely smooth and both face each other with a minute gap, and the gap is filled with molecules such as O 2 , N 2 or H 2 O. This is due to the large adsorption force generated by the interfacial tension. When such an adsorption phenomenon occurs, it causes a disadvantage that a large amount of electric power is consumed when the motor that drives the magnetic disk is started.
【0003】そこで、上述の吸着現象を防止するため、
磁気ディスク用Al基板においては、磁性膜を被着する
に先立ち、基板表面を一旦鏡面仕上げした後、テクスチ
ャー処理を施すことによりその表面粗さを調整してい
る。このテクスチャー処理方法としては、以下に示すも
のがある。即ち、Al基板(Ni−Pメッキ材)を回転
させた状態で、このAl基板に研磨テープをローラで押
し付けて接触させつつ、前記研磨テープをAl基板の半
径方向に移動させる。研磨テープとしては炭化ケイ素、
アルミナ又はダイヤモンド等の砥粒を付着させたものを
使用する。このように機械的なテクスチャー処理を施す
ことにより、磁気ディスク用Al基板の表面に同心円状
の条痕を付し、条痕が円周方向に配向した粗面を得るこ
とができる。Therefore, in order to prevent the above-mentioned adsorption phenomenon,
In the Al substrate for a magnetic disk, before the magnetic film is deposited, the substrate surface is once mirror-finished and then subjected to a texture treatment to adjust the surface roughness. The following texture processing methods are available. That is, while the Al substrate (Ni-P plated material) is rotated, the polishing tape is moved in the radial direction of the Al substrate while the polishing tape is pressed against the Al substrate by the roller to make contact with the Al substrate. Silicon carbide as polishing tape,
Use those to which abrasive grains such as alumina or diamond are attached. By performing the mechanical texture treatment in this way, it is possible to form a concentric circular striation on the surface of the Al substrate for a magnetic disk and obtain a rough surface in which the striation is oriented in the circumferential direction.
【0004】なお、従来の他の磁気ディスク用基板とし
て、アモルファスカーボン基板(神戸製鋼技報、Vol.3
9、No.4、35乃至38頁、1989年発行)が提案されてい
る。このアモルファスカーボン基板は軽量且つ高強度で
あると共に、耐熱性及び表面精度が優れていて、Al基
板に比して磁気ディスクの記録密度を向上させることが
できるものである。Incidentally, as another conventional magnetic disk substrate, an amorphous carbon substrate (Kobe Steel Technical Report, Vol.
9, No. 4, pages 35 to 38, issued in 1989) is proposed. This amorphous carbon substrate is lightweight and has high strength, is excellent in heat resistance and surface accuracy, and can improve the recording density of the magnetic disk as compared with the Al substrate.
【0005】[0005]
【発明が解決しようとする課題】しかしながら、従来の
磁気ディスク用Al基板のテクスチャー処理方法におい
ては、表面粗さを適切なものに調整することが極めて困
難であり、必要以上に粗くなりやすい。磁気ディスクは
記録密度を高めるために、磁気ヘッドの浮上高さ(スペ
ーシング)をより一層小さくすることが好ましいが、上
述の如く、磁気ディスク用Al基板の表面粗さが必要以
上に粗くなると、磁気ヘッドの浮上高さが大きくなり、
磁気ディスクの記録密度を向上させることができない。
更に、従来のアモルファスカーボン基板は磁気ヘッドの
吸着防止及び磁気記録特性の向上の面から表面粗さを検
討すること自体、十分になされていないという問題点が
ある。However, it is extremely difficult to adjust the surface roughness to an appropriate value in the conventional method of texture-treating an Al substrate for a magnetic disk, and it tends to be unnecessarily rough. In order to increase the recording density of the magnetic disk, it is preferable to further reduce the flying height (spacing) of the magnetic head. However, as described above, if the surface roughness of the Al substrate for the magnetic disk becomes larger than necessary, The flying height of the magnetic head increases,
The recording density of the magnetic disk cannot be improved.
Further, the conventional amorphous carbon substrate has a problem that the surface roughness itself has not been sufficiently examined from the viewpoint of preventing the magnetic head from adsorbing and improving the magnetic recording characteristics.
【0006】本発明はかかる問題点に鑑みてなされたも
のであって、磁気ディスクのヘッド吸着を防止できると
共に、磁性膜の特性を改善することができ、磁気ヘッド
の浮上高さを従来より小さくすることができるテクスチ
ャー面を得ることができる磁気ディスク用アモルファス
カーボン基板のテクスチャー処理方法を提供することを
目的とする。The present invention has been made in view of the above problems. It is possible to prevent the magnetic head from sticking to the magnetic disk, improve the characteristics of the magnetic film, and make the flying height of the magnetic head smaller than before. It is an object of the present invention to provide a texture processing method for an amorphous carbon substrate for a magnetic disk, which can obtain a textured surface that can be obtained.
【0007】[0007]
【課題を解決するための手段】本発明に係る磁気ディス
ク用アモルファスカーボン基板のテクスチャー処理方法
は、アモルファスカーボン基板の表面を研磨することに
よりその表面粗さRaを 5乃至50Åにすると共に、円周
方向の表面粗さRa1 と半径方向の表面粗さRa2 との
比Ra2 /Ra1 を1.50以上にする研磨工程と、表面研
磨したアモルファスカーボン基板を酸素の存在下で加熱
処理する加熱工程とを有することを特徴とする。A method of texturing an amorphous carbon substrate for a magnetic disk according to the present invention has a surface roughness Ra of 5 to 50Å by polishing the surface of the amorphous carbon substrate, Polishing step for increasing the ratio Ra 2 / Ra 1 of the surface roughness Ra 1 in the radial direction to the surface roughness Ra 2 in the radial direction to 1.50 or more, and a heating step for heating the surface-polished amorphous carbon substrate in the presence of oxygen. And having.
【0008】[0008]
【作用】本願発明者等はアモルファスカーボン基板がも
つ性質に着目してそのテクスチャー処理方法について種
々研究を重ねた。その結果、アモルファスカーボン基板
を所定の表面粗さに研磨した後に、酸化性雰囲気中にて
所定の温度で加熱処理することにより、アモルファスカ
ーボン基板を磁気ディスク用として適切な表面粗さに処
理することができるということを見い出した。The present inventors paid attention to the properties of the amorphous carbon substrate and conducted various studies on the texture processing method. As a result, after the amorphous carbon substrate is polished to a predetermined surface roughness, the amorphous carbon substrate is heat-treated at a predetermined temperature in an oxidizing atmosphere to process the amorphous carbon substrate to a suitable surface roughness for a magnetic disk. I found that I can do it.
【0009】即ち、所定の表面粗さに研磨されたアモル
ファスカーボン基板を所定の温度に加熱すると、C+O
2 →CO2 の酸化反応が起こり、カーボンがガス化され
てその研磨面に微細な凹凸が形成される。従って、処理
温度及び時間等の加熱処理の条件をコントロールするこ
とによりアモルファスカーボン基板を適切な表面粗さに
容易に処理することができ、その表面が必要以上に粗く
なることはない。これにより、磁気ディスクのヘッド吸
着を防止することができると共に、アモルファスカーボ
ン基板上に形成される磁性膜の特性を改善することがで
き、磁気ヘッドの浮上高さを従来より小さくすることが
できる。That is, when an amorphous carbon substrate polished to a predetermined surface roughness is heated to a predetermined temperature, C + O
The oxidation reaction of 2 → CO 2 occurs, carbon is gasified, and fine irregularities are formed on the polished surface. Therefore, by controlling the heat treatment conditions such as the treatment temperature and time, the amorphous carbon substrate can be easily treated to have an appropriate surface roughness, and the surface is not roughened more than necessary. As a result, the magnetic disk head adsorption can be prevented, the characteristics of the magnetic film formed on the amorphous carbon substrate can be improved, and the flying height of the magnetic head can be made smaller than before.
【0010】次に、表面研磨後におけるアモルファスカ
ーボン基板の表面粗さRa及び円周方向の表面粗さRa
1 と半径方向の表面粗さRa2との比Ra2 /Ra1 の
限定理由について説明する。Next, the surface roughness Ra and the surface roughness Ra in the circumferential direction of the amorphous carbon substrate after surface polishing.
The reason for limiting the ratio Ra 2 / Ra 1 of 1 to the surface roughness Ra 2 in the radial direction will be described.
【0011】表面研磨後におけるアモルファスカーボン
基板の表面粗さ(平均面粗さ)Raが 5Åより小さい
と、磁気ディスクとして実用する際に磁気ヘッドの吸着
が生じやすい。一方、表面粗さRaが50Åを超えると、
磁気ヘッドの浮上高さを従来より小さくすることが困難
になる。このため、表面研磨後におけるアモルファスカ
ーボン基板の表面粗さRaは 5乃至50Åにする。If the surface roughness (average surface roughness) Ra of the amorphous carbon substrate after surface polishing is smaller than 5Å, the magnetic head is apt to be attracted when it is practically used as a magnetic disk. On the other hand, when the surface roughness Ra exceeds 50Å,
It becomes difficult to make the flying height of the magnetic head smaller than in the past. Therefore, the surface roughness Ra of the amorphous carbon substrate after surface polishing is set to 5 to 50 Å.
【0012】磁気ディスク用アモルファスカーボン基板
をテクスチャー処理する主目的は磁気ヘッドの吸着防止
であるが、基板面に対するテクスチャーの方向性を同心
円状の円周配向にすると、即ち、アモルファスカーボン
基板の表面粗さRaを円周方向に比して半径方向に大き
くすると、円周方向の保磁力及び角形比を半径方向のそ
れに比して 2乃至 3割向上させることができる。そし
て、記録再生時において磁気ヘッドは磁気ディスクに対
して相対的に円周方向に移動するので、上述の如くテク
スチャーの方向性を円周配向にすると、磁性膜の円周方
向の磁気特性を著しく向上させることができる。従っ
て、磁性膜(メディア層)にPt又はTa等の高価な元
素を添加することにより磁性膜の磁気特性を向上させる
必要がない。The main purpose of texturing an amorphous carbon substrate for a magnetic disk is to prevent adsorption of a magnetic head. However, when the directionality of the texture with respect to the substrate surface is made into a concentric circular orientation, that is, the surface roughness of the amorphous carbon substrate is roughened. When Ra is made larger in the radial direction than in the circumferential direction, the coercive force and the squareness ratio in the circumferential direction can be improved by 20 to 30% as compared with those in the radial direction. Since the magnetic head moves in the circumferential direction relative to the magnetic disk during recording and reproduction, if the texture is oriented in the circumferential direction as described above, the magnetic characteristics of the magnetic film in the circumferential direction are significantly increased. Can be improved. Therefore, it is not necessary to improve the magnetic characteristics of the magnetic film by adding an expensive element such as Pt or Ta to the magnetic film (media layer).
【0013】このテクスチャーの円周配向性は加熱処理
前の表面研磨により決定される。しかしながら、表面研
磨後におけるアモルファスカーボン基板の円周方向の表
面粗さRa1 と半径方向の表面粗さRa2 との比Ra2
/Ra1 が1.50未満であると、テクスチャーの円周配向
が不十分であって円周方向のメディア層の磁気特性の向
上が不十分になる。このため、表面研磨後におけるアモ
ルファスカーボン基板の円周方向の表面粗さRa1 と半
径方向の表面粗さRa2 との比Ra2 /Ra1 は1.50以
上にする。The circumferential orientation of this texture is determined by surface polishing before heat treatment. However, the ratio Ra 2 of the surface roughness Ra 1 in the circumferential direction and the surface roughness Ra 2 in the radial direction of the amorphous carbon substrate after surface polishing.
When / Ra 1 is less than 1.50, the circumferential orientation of the texture is insufficient and the magnetic properties of the media layer in the circumferential direction are insufficiently improved. Therefore, the ratio Ra 2 / Ra 1 of the surface roughness Ra 1 in the circumferential direction and the surface roughness Ra 2 in the radial direction of the amorphous carbon substrate after the surface polishing is set to 1.50 or more.
【0014】このように、本発明に係る磁気ディスク用
アモルファスカーボン基板は、磁気ヘッドの浮上高さを
小さくすることができると共に、Pt又はTa等の高価
な元素を添加しなくてもメディア層の磁気特性を向上さ
せることができるので、特に低コストの磁気ディスクに
使用するのに好適である。As described above, the amorphous carbon substrate for a magnetic disk according to the present invention can reduce the flying height of the magnetic head, and can form a medium layer without adding an expensive element such as Pt or Ta. Since the magnetic characteristics can be improved, it is particularly suitable for use in a low-cost magnetic disk.
【0015】なお、本発明におけるアモルファスカーボ
ン基板とは、アモルファスカーボンに超高温HIP(熱
間静水圧加圧)処理を施すことにより、気孔を殆ど消失
させて密度を1.80g/cm3以上と高くし、その特性を
グラファイトに近付けた高密度アモルファスカーボンか
らなるものである。[0015] Note that the amorphous carbon substrate in the present invention, by performing the ultra-high temperature HIP (hot isostatic pressing) process to amorphous carbon, a density almost abolished pores high as 1.80 g / cm 3 or more However, it is made of high-density amorphous carbon whose characteristics are close to those of graphite.
【0016】次に、アモルファスカーボン基板を上述の
表面粗さに研磨するための研磨方法について説明する。Next, a polishing method for polishing the amorphous carbon substrate to the above-mentioned surface roughness will be described.
【0017】研磨工程においては、従来の磁気ディスク
用Al基板を機械的にテクスチャー処理する場合に使用
するテープポリッシャー等の研磨材が有効である。即
ち、アモルファスカーボン基板を回転させた状態で研磨
材を前記アモルファスカーボン基板に接触させつつ、こ
の研磨材を前記アモルファスカーボン基板の半径方向
に、例えば基板の外周部から内周部に向けて移動させ
る。前記研磨材には微粉状の砥粒を付着させた研磨テー
プを使用することができる。砥粒としてはアモルファス
カーボン基板と同等以上の硬度を有し、工業的に安価な
もの、例えば、ダイヤモンド、アルミナ、SiC、Zr
O2 、酸化セリウム及びSiO2 等を使用する。これに
より、アモルファスカーボン基板の表面はその回転に伴
って前記砥粒により切削される。従って、基板の回転
数、使用する研磨テープの番手及び研磨テープの移動速
度等を適宜選択することにより、表面研磨後におけるア
モルファスカーボン基板の表面粗さRaを 5乃至50Åに
すると共に円周方向の表面粗さRa1 と半径方向の表面
粗さRa2 との比Ra2 /Ra1 を1.50以上にすること
ができ、前記アモルファスカーボン基板の表面に同心円
状の条痕を形成することができる。In the polishing step, an abrasive material such as a tape polisher used when mechanically texture-processing a conventional Al substrate for a magnetic disk is effective. That is, while the polishing material is brought into contact with the amorphous carbon substrate while the amorphous carbon substrate is rotated, the polishing material is moved in the radial direction of the amorphous carbon substrate, for example, from the outer peripheral portion of the substrate toward the inner peripheral portion. . A polishing tape to which fine powdery abrasive grains are attached can be used as the polishing material. Abrasive grains having hardness equal to or higher than that of an amorphous carbon substrate and industrially inexpensive, for example, diamond, alumina, SiC, Zr
O 2 , cerium oxide, SiO 2 or the like is used. As a result, the surface of the amorphous carbon substrate is cut by the abrasive grains as it rotates. Therefore, by appropriately selecting the number of rotations of the substrate, the number of the polishing tape to be used, the moving speed of the polishing tape, etc., the surface roughness Ra of the amorphous carbon substrate after the surface polishing is set to 5 to 50 Å and the The ratio Ra 2 / Ra 1 of the surface roughness Ra 1 and the surface roughness Ra 2 in the radial direction can be 1.50 or more, and concentric circular scratches can be formed on the surface of the amorphous carbon substrate.
【0018】[0018]
【実施例】以下、本発明の実施例及び本願特許請求の範
囲から外れる比較例に係る磁気ディスク用アモルファス
カーボン基板のテクスチャー処理方法について説明す
る。EXAMPLES A method of texturing an amorphous carbon substrate for a magnetic disk according to examples of the present invention and comparative examples which depart from the scope of the claims of the present application will be described below.
【0019】先ず、炭化焼成後にアモルファスカーボン
となる熱硬化性樹脂とフェノールホルムアルデヒド樹脂
との混合樹脂をホットプレスにより磁気ディスクの形状
に成形した後、この成形体をN2 ガス雰囲気中で約1450
℃の温度に加熱して予備焼成した。次いで、この予備焼
成体を熱間静水圧加圧(HIP)装置を使用して約2350
℃に加熱しつつ約1800気圧の等方的圧力を加えてHIP
処理を施した。これにより、アモルファスカーボン基板
(未処理)を得た。First, a mixed resin of a thermosetting resin that becomes amorphous carbon after carbonization and firing and a phenol-formaldehyde resin is molded into a magnetic disk shape by hot pressing, and this molded body is subjected to about 1450 in an N 2 gas atmosphere.
It was preheated by heating to a temperature of ° C. Then, the pre-fired body is heated to about 2350 using a hot isostatic pressing (HIP) device.
HIP by applying isotropic pressure of about 1800 atm while heating to ℃
Treated. As a result, an amorphous carbon substrate (untreated) was obtained.
【0020】次に、スピードファム社製の16B両面研磨
機を使用し、SiCの砥粒をスラリーとして滴下しなが
ら、鋳鉄製定盤にて未処理のアモルファスカーボン基板
に粗研磨を施した。この粗研磨においては、砥粒濃度を
35重量%とし、ワーク荷重を300g/cm2とし、下定盤回転
数を100rpmとし、スラリー滴下量を600ml/分とし、研磨
時間を45分とした。Next, using a 16B double-side polishing machine manufactured by Speed Fam Co., rough polishing was performed on an untreated amorphous carbon substrate with a cast iron surface plate while dropping SiC abrasive grains as a slurry. In this rough polishing, the abrasive grain concentration
The weight was 35% by weight, the work load was 300 g / cm 2 , the lower platen rotation speed was 100 rpm, the slurry dropping amount was 600 ml / min, and the polishing time was 45 minutes.
【0021】次に、粗研磨後のアモルファスカーボン基
板を超音波洗浄して粗研磨用の砥粒を十分に除去した。
その後、粗研磨後のアモルファスカーボン基板を基板回
転軸に固定し、これを 300乃至500rpmで回転させた状態
で研磨テープを前記アモルファスカーボン基板に接触さ
せつつ、この研磨テープを基板の外周部から内周部に向
けて移動させた。このようにして粗研磨後のアモルファ
スカーボン基板に仕上げ研磨を施すことにより、アモル
ファスカーボン基板の表面に同心円状の研磨痕を形成し
た。なお、研磨テープとしてはダイヤモンド、SiC、
Al2 O3 、SiO2 及びZrO2 等の砥粒を付着させ
たものであって番手が6000番以上のものを使用すること
が好ましい。Then, the amorphous carbon substrate after the rough polishing was ultrasonically cleaned to sufficiently remove the abrasive grains for the rough polishing.
After that, the amorphous carbon substrate after rough polishing was fixed to the substrate rotating shaft, and while this was rotated at 300 to 500 rpm, the polishing tape was brought into contact with the amorphous carbon substrate, and the polishing tape was put inside from the outer peripheral portion of the substrate. Moved to the circumference. In this way, the amorphous carbon substrate after the rough polishing was subjected to the final polishing to form concentric polishing marks on the surface of the amorphous carbon substrate. As the polishing tape, diamond, SiC,
It is preferable to use those having abrasive grains such as Al 2 O 3 , SiO 2 and ZrO 2 attached thereto and having a count of 6000 or more.
【0022】上述の仕上げ研磨によりアモルファスカー
ボン基板の表面粗さRa及び円周方向の表面粗さRa1
と半径方向の表面粗さRa2との比Ra2/Ra1を種
々異なるものにして実施例1乃至4及び比較例1乃至3
とした。そして、実施例及び比較例に係るアモルファス
カーボン基板について、夫々表面粗さ計を使用して仕上
げ研磨後の表面粗さRaを測定し、円周方向の表面粗さ
Ra1と半径方向の表面粗さRa2との比Ra2/Ra
1を求めた。その結果を下記表1に示す。なお、仕上げ
研磨後の表面粗さRaは5Åにすることが限界であっ
て、それ以上の鏡面を出すことはできなかった。また、
表面粗さ計はランクテーラホブソン社製のタリステップ
(商品名)を使用し、以下に示す条件にて測定を行っ
た。 スタイラス; 0.2μm 測定長さ ; 1mm カットオフ;0.08mm 倍率 ;縦×1000000 次に、仕上げ研磨後のアモルファスカーボン基板を空気
中(酸素の存在下)において所定の温度で所定時間加熱
処理した。このようにして、実施例1乃至4及び比較例
1乃至3に係る磁気ディスク用アモルファスカーボン基
板を製造した。By the above-mentioned finish polishing, the surface roughness Ra of the amorphous carbon substrate and the surface roughness Ra 1 in the circumferential direction are obtained.
Examples 1 to 4 and Comparative Examples 1 to 3 with different ratios Ra 2 / Ra 1 between the surface roughness Ra 2 and the surface roughness Ra 2 in the radial direction.
And Then, with respect to the amorphous carbon substrates according to the example and the comparative example, the surface roughness Ra after finish polishing was measured using a surface roughness meter, respectively, and the surface roughness Ra 1 in the circumferential direction and the surface roughness Ra in the radial direction were measured. is the ratio Ra 2 / Ra with Ra 2
I asked for 1 . The results are shown in Table 1 below. The surface roughness Ra after the finish polishing was limited to 5 Å, and a mirror surface higher than that could not be obtained. Also,
As the surface roughness meter, TALISTEP (trade name) manufactured by Lanktera Hobson Co. was used, and measurement was performed under the following conditions. Stylus: 0.2 μm Measurement length: 1 mm Cutoff: 0.08 mm Magnification: Vertical x 1000000 Next, the amorphous carbon substrate after finish polishing was heat-treated in air (in the presence of oxygen) at a predetermined temperature for a predetermined time. Thus, the amorphous carbon substrates for magnetic disks according to Examples 1 to 4 and Comparative Examples 1 to 3 were manufactured.
【0023】上述の実施例及び比較例に係る磁気ディス
ク用アモルファスカーボン基板について、夫々表面粗さ
計を使用してテクスチャー処理後の表面粗さRaを測定
し、円周方向の表面粗さRa1 と半径方向の表面粗さR
a2 との比Ra2 /Ra1 を求めた。その結果を下記表
1に併せて示す。With respect to the amorphous carbon substrates for magnetic disks according to the above-mentioned Examples and Comparative Examples, the surface roughness Ra after the texture treatment was measured using a surface roughness meter, respectively, and the surface roughness Ra 1 in the circumferential direction was measured. And radial surface roughness R
was determined the ratio Ra 2 / Ra 1 and a 2. The results are also shown in Table 1 below.
【0024】[0024]
【表1】 次に、実施例及び比較例に係る磁気ディスク用アモルフ
ァスカーボン基板を精密洗浄した後、マグネトロンスパ
ッタリング装置を使用してこのアモルファスカーボン基
板上にCoNiCrからなるメディア層(磁性膜)とカ
ーボン保護膜とを順次成膜し、更にその表面に潤滑材を
塗布して磁気ディスクを作製した。[Table 1] Next, after precisely cleaning the amorphous carbon substrates for magnetic disks according to Examples and Comparative Examples, a media layer (magnetic film) made of CoNiCr and a carbon protective film were formed on the amorphous carbon substrates by using a magnetron sputtering device. Films were sequentially formed, and a lubricant was applied to the surface of the film to manufacture a magnetic disk.
【0025】そして、実施例及び比較例に係る磁気ディ
スクから1辺が 5mmの正方形状の試料片を切り出し、こ
の試料片の静磁気特性を測定した。なお、この静磁気特
性は磁気ディスクの円周方向及びこれに直交する半径方
向について測定した。また、同様にして作製した実施例
及び比較例に係る磁気ディスクについて、プロクイップ
社製のディスクサーティファイヤ(商品名)を使用して
記録再生を行い、ヘッドクラッシュの発生状況を評価し
た。これらの結果を前記表1に併せて示す。なお、磁気
ディスクとMIG(Metal In Gap)ヘッドとの間のヘッ
ド浮上高さは約0.15μmにした。Then, a square sample piece having a side of 5 mm was cut out from each of the magnetic disks according to the examples and comparative examples, and the magnetostatic characteristics of the sample piece were measured. The magnetostatic characteristics were measured in the circumferential direction of the magnetic disk and the radial direction orthogonal to this. Further, with respect to the magnetic disks according to Examples and Comparative Examples manufactured in the same manner, recording / reproducing was performed using a disk certifier (trade name) manufactured by Proquip Co., Ltd., and the occurrence of head crash was evaluated. The results are also shown in Table 1 above. The head flying height between the magnetic disk and the MIG (Metal In Gap) head was set to about 0.15 μm.
【0026】この表1から明らかなように、実施例1乃
至4に係る磁気ディスクはいずれもヘッド浮上高さが約
0.15μmと低くても、ヘッドクラッシュが発生すること
はなく、その円周方向の保磁力Hcが優れたものであっ
た。As is apparent from Table 1, the magnetic disks according to Examples 1 to 4 all have a head flying height of about 1.
Even if it was as low as 0.15 μm, head crash did not occur, and its coercive force Hc in the circumferential direction was excellent.
【0027】一方、仕上げ研磨後の表面粗さRaが61Å
である比較例1に係る磁気ディスクは、テクスチャー処
理後の表面粗さRaが必要以上に粗くなるために記録再
生時にヘッドクラッシュが発生し、低ヘッド浮上高さで
の実用が困難であった。仕上げ研磨後のRa2 /Ra1
が1.50未満である比較例2,3に係る磁気ディスクは、
円周方向の保磁力Hcの向上が不十分であった。On the other hand, the surface roughness Ra after finish polishing is 61Å
In the magnetic disk according to Comparative Example 1, the surface roughness Ra after the texture treatment is unnecessarily rough, so that a head crash occurs during recording and reproduction, and it is difficult to put the head into practical use at a low head flying height. Ra 2 / Ra 1 after finish polishing
Is less than 1.50, the magnetic disks according to Comparative Examples 2 and 3 are
The improvement of the coercive force Hc in the circumferential direction was insufficient.
【0028】[0028]
【発明の効果】以上説明したように本発明によれば、磁
気ディスク用アモルファスカーボン基板の表面を研磨す
ることにより、その表面粗さRaを 5乃至50Åにすると
共に円周方向の表面粗さRa1 と半径方向の表面粗さR
a2 との比Ra2 /Ra1 を1.50以上にした後、これを
酸素の存在下で加熱処理するから、テクスチャーを円周
配向にしてその表面粗さを適切なものにすることができ
る。このため、磁気ディスクに対する磁気ヘッドの吸着
を防止することができると共に、磁気ヘッドの浮上高さ
を従来より小さくして磁性膜の円周方向の磁気特性を著
しく向上させることができる。As described above, according to the present invention, the surface roughness Ra of the amorphous carbon substrate for a magnetic disk is adjusted to 5 to 50Å and the surface roughness Ra in the circumferential direction is polished. 1 and surface roughness R in the radial direction
Since the ratio Ra 2 / Ra 1 with respect to a 2 is set to 1.50 or more and then heat-treated in the presence of oxygen, the texture can be circumferentially oriented and the surface roughness can be made appropriate. Therefore, the magnetic head can be prevented from being attracted to the magnetic disk, and the flying height of the magnetic head can be made smaller than in the prior art, and the magnetic characteristics in the circumferential direction of the magnetic film can be remarkably improved.
【0029】従って、本発明に係る磁気ディスク用アモ
ルファスカーボン基板は、特に、メディア層にPt又は
Ta等の高価な元素を添加しない低コストの磁気ディス
クの基板として好適である。Therefore, the amorphous carbon substrate for a magnetic disk according to the present invention is particularly suitable as a low-cost magnetic disk substrate in which an expensive element such as Pt or Ta is not added to the media layer.
Claims (2)
することによりその表面粗さRaを 5乃至50Åにすると
共に円周方向の表面粗さRa1 と半径方向の表面粗さR
a2 との比Ra2 /Ra1 を1.50以上にする研磨工程
と、表面研磨したアモルファスカーボン基板を酸素の存
在下で加熱処理する加熱工程とを有することを特徴とす
る磁気ディスク用アモルファスカーボン基板のテクスチ
ャー処理方法。1. The surface roughness Ra of the amorphous carbon substrate is adjusted to 5 to 50 Å by polishing the surface, and the surface roughness Ra 1 in the circumferential direction and the surface roughness R in the radial direction are obtained.
An amorphous carbon substrate for a magnetic disk, comprising: a polishing step for making a ratio Ra 2 / Ra 1 with respect to a 2 1.50 or more; and a heating step for heating a surface-polished amorphous carbon substrate in the presence of oxygen. Texture processing method.
基板を回転させた状態で研磨材を前記アモルファスカー
ボン基板に接触させつつその半径方向に移動させること
により前記アモルファスカーボン基板の表面に同心円状
の条痕を形成することを特徴とする請求項1に記載の磁
気ディスク用アモルファスカーボン基板のテクスチャー
処理方法。2. In the polishing step, while the amorphous carbon substrate is being rotated, a polishing material is brought into contact with the amorphous carbon substrate and moved in the radial direction thereof to form concentric scratches on the surface of the amorphous carbon substrate. The method for texture treatment of an amorphous carbon substrate for a magnetic disk according to claim 1, wherein
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP41043690A JPH0778875B2 (en) | 1990-12-12 | 1990-12-12 | Texture processing method for amorphous carbon substrate for magnetic disk |
| DE4109939A DE4109939C2 (en) | 1990-03-29 | 1991-03-26 | An amorphous carbon substrate for a magnetic disk and method of making the same |
| GB9106590A GB2242423B (en) | 1990-03-29 | 1991-03-28 | Amorphous carbon substrate for a magnetic disk and a method of manufacturing the same |
| US07/676,569 US5326607A (en) | 1990-03-29 | 1991-03-28 | Amorphous carbon substrate for a magnetic disk and a method of manufacturing the same |
| GB9401690A GB2274839B (en) | 1990-03-29 | 1994-01-28 | Amorphous carbon substrate for a magnetic disk and a method of manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP41043690A JPH0778875B2 (en) | 1990-12-12 | 1990-12-12 | Texture processing method for amorphous carbon substrate for magnetic disk |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04214227A JPH04214227A (en) | 1992-08-05 |
| JPH0778875B2 true JPH0778875B2 (en) | 1995-08-23 |
Family
ID=18519604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP41043690A Expired - Lifetime JPH0778875B2 (en) | 1990-03-29 | 1990-12-12 | Texture processing method for amorphous carbon substrate for magnetic disk |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0778875B2 (en) |
-
1990
- 1990-12-12 JP JP41043690A patent/JPH0778875B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04214227A (en) | 1992-08-05 |
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