Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP3393769B2 - Wiring board and method of manufacturing the same - Google Patents
[go: Go Back, main page]

JP3393769B2 - Wiring board and method of manufacturing the same - Google Patents

Wiring board and method of manufacturing the same

Info

Publication number
JP3393769B2
JP3393769B2 JP30815896A JP30815896A JP3393769B2 JP 3393769 B2 JP3393769 B2 JP 3393769B2 JP 30815896 A JP30815896 A JP 30815896A JP 30815896 A JP30815896 A JP 30815896A JP 3393769 B2 JP3393769 B2 JP 3393769B2
Authority
JP
Japan
Prior art keywords
thermosetting resin
resin
paste
wiring
insulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP30815896A
Other languages
Japanese (ja)
Other versions
JPH10150248A (en
Inventor
英典 鹿田
俊一 藤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP30815896A priority Critical patent/JP3393769B2/en
Publication of JPH10150248A publication Critical patent/JPH10150248A/en
Application granted granted Critical
Publication of JP3393769B2 publication Critical patent/JP3393769B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4673Application methods or materials of intermediate insulating layers not specially adapted to any one of the previous methods of adding a circuit layer
    • H05K3/4676Single layer compositions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/682Shapes or dispositions thereof comprising holes having chips therein
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、配線基板に関し、
より詳細には半導体素子を収容するための半導体素子収
納用パッケージや混成集積回路装置等に用いられる配線
基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board,
More specifically, the present invention relates to a semiconductor element housing package for housing a semiconductor element, a wiring board used in a hybrid integrated circuit device, and the like.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに該半導体素子
の各電極を、例えばボンディングワイヤ等の電気的接続
手段を介して配線導体に電気的に接続し、しかる後、前
記絶縁基体の上面に、金属やセラミックス等から成る蓋
体を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロ
ウ材等の封止部材を介して接合させ、絶縁基体の凹部内
に半導体素子を気密に収容することによって製品として
の半導体装置となる。
2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element, is made of ceramics such as an aluminum oxide sintered body, and the semiconductor element is housed in the center of its upper surface. And a wiring conductor made of a refractory metal powder such as tungsten or molybdenum, which is led out from the periphery of the recess of the insulating base to the lower surface, and a semiconductor element is formed on the bottom of the recess of the insulating base. The electrodes are bonded and fixed via an adhesive such as glass, resin, or a brazing material, and each electrode of the semiconductor element is electrically connected to a wiring conductor through an electrical connecting means such as a bonding wire. A sealing member made of glass, resin, brazing material, etc. is formed on the upper surface of the insulating base by covering the concave portion of the insulating base with a lid made of metal or ceramics. Through by joining a semiconductor device as a product by housing airtightly semiconductor element in the recess of the insulating substrate.

【0003】なお、この従来の配線基板は一般に、セラ
ミックグリーンシート積層法によって製作されており、
具体的には酸化アルミニウム、酸化珪素、酸化マグネシ
ウム、酸化カルシウム等のセラミック原料粉末に適当な
有機バインダー、溶剤等を添加混合して泥漿状となすと
ともにこれを従来周知のドクターブレード法を採用し、
シート状にすることによって複数枚のセラミックグリー
ンシートを得、しかる後、前記セラミックグリーンシー
トに適当な打ち抜き加工を施すとともに配線導体となる
金属ペーストを所定パターンに印刷塗布し、最後に前記
セラミックグリーンシートを所定の順に上下に積層して
生セラミック成形体となすとともに該生セラミック成形
体を還元雰囲気中、約1600℃の高温で焼成すること
によって製作される。
This conventional wiring board is generally manufactured by a ceramic green sheet laminating method,
Specifically, aluminum oxide, silicon oxide, magnesium oxide, calcium oxide, and other ceramic raw material powders are mixed with an appropriate organic binder, solvent, etc. to form a slurry, and this is adopted by the conventionally known doctor blade method.
A plurality of ceramic green sheets are obtained by forming a sheet, and thereafter, the ceramic green sheets are appropriately punched and a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally the ceramic green sheets are formed. Are laminated in a predetermined order to form a green ceramic compact, and the green ceramic compact is fired in a reducing atmosphere at a high temperature of about 1600 ° C.

【0004】しかしながら、この従来の配線基板は、絶
縁基体を構成する酸化アルミニウム質焼結体等のセラミ
ックスが硬くて脆い性質を有するため、搬送工程や半導
体装置製作の自動ライン等において配線基板同士が、あ
るいは配線基板と半導体装置製作自動ラインの一部とが
激しく衝突すると絶縁基体に欠けや割れ、クラック等が
発生し、その結果、半導体素子を気密に収容することが
できず、半導体素子を長期間にわたり正常、かつ安定に
作動させることができなくなるという欠点を有してい
た。
However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body forming the insulating substrate has a hard and brittle property, the wiring boards may not be connected to each other in a carrying process or an automatic line for manufacturing a semiconductor device. Or, if the wiring board and a part of the automatic production line for semiconductor devices collide violently, the insulating substrate may be chipped, cracked, or cracked. As a result, the semiconductor element cannot be hermetically housed and the semiconductor element is long. It has a drawback that it cannot operate normally and stably over a period of time.

【0005】また、前記配線基板の製造方法によれば、
生セラミック成形体を焼成する際、生セラミック成形体
に不均一な焼成収縮が生じ、得られる配線基板に反り等
の変形や寸法のばらつきが発生して半導体素子の各電極
を所定の配線導体に、あるいは配線導体を所定の外部電
気回路に正確、かつ確実に電気的接続することができな
いという欠点を有していた。
According to the method of manufacturing the wiring board,
When firing the green ceramic compact, uneven firing shrinkage occurs in the raw ceramic compact, resulting in deformation such as warpage and dimensional variation in the obtained wiring board, and each electrode of the semiconductor element is used as a predetermined wiring conductor. Alternatively, there is a drawback that the wiring conductor cannot be electrically connected to a predetermined external electric circuit accurately and surely.

【0006】そこで、配線基板の絶縁基体を従来のセラ
ミックスに代えて無機絶縁物粉末を熱硬化性樹脂で結合
したものに、配線導体を従来の高融点金属粉末に代えて
金属粉末を熱硬化性樹脂で結合したものにした配線基板
が提案されている。この無機絶縁物粉末を熱硬化性樹脂
で結合して成る絶縁基体と金属粉末を熱硬化性樹脂で結
合して成る配線導体とから成る配線基板は、熱硬化性樹
脂と無機絶縁物粉末とを混合して成る半硬化状態の前駆
体シートを準備するとともに該前駆体シートに適当な打
ち抜き加工を施し、次にこれに熱硬化性樹脂と金属粉末
とを混合して成る金属ペーストを所定パターンに印刷塗
布し、最後に前記金属ペーストが印刷塗布された前駆体
シートを必要に応じて積層するとともにこれを約100
〜300℃の温度で熱硬化させることによって製作され
る。
Therefore, the insulating substrate of the wiring board is replaced with the conventional ceramics and the inorganic insulating powder is bonded with the thermosetting resin, and the wiring conductor is replaced with the conventional refractory metal powder, and the metal powder is thermoset. A wiring board made of resin is proposed. A wiring board composed of an insulating substrate formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with the thermosetting resin is composed of the thermosetting resin and the inorganic insulating powder. A semi-cured precursor sheet prepared by mixing is prepared, and the precursor sheet is subjected to an appropriate punching process, and then a metal paste formed by mixing a thermosetting resin and metal powder is formed into a predetermined pattern. If necessary, a precursor sheet on which the above-mentioned metal paste is printed and applied is laminated by printing and applied, and this is applied to about 100
It is manufactured by heat curing at a temperature of ~ 300 ° C.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、この無
機絶縁物粉末を熱硬化性樹脂で結合して成る絶縁基体と
金属粉末を熱硬化性樹脂で結合して成る配線導体とから
成る配線基板は、絶縁基体に対する配線導体の接合強度
が若干弱く、配線導体に半導体素子の電極を接続する際
等において配線導体に大きな外力が印加されると該外力
によって配線導体が絶縁基体より剥離し、半導体素子等
の電極と配線導体との電気的接続の信頼性が若干劣ると
いう解決すべき課題を有していた。
However, a wiring board comprising an insulating substrate formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with the thermosetting resin is The bonding strength of the wiring conductor to the insulating base is slightly weak, and when a large external force is applied to the wiring conductor when connecting the electrodes of the semiconductor element to the wiring conductor, the wiring conductor is separated from the insulating base by the external force, and the semiconductor element, etc. There was a problem to be solved that the reliability of the electrical connection between the electrode and the wiring conductor was slightly inferior.

【0008】本発明は上記欠点に鑑み案出されたもの
で、その目的は絶縁基体と配線導体との接合を強固と
し、配線導体に半導体素子の電極等を強固に電気的接続
することができる配線基板を提供することにある。
The present invention has been devised in view of the above-mentioned drawbacks, and an object thereof is to strengthen the connection between the insulating substrate and the wiring conductor and to firmly electrically connect the electrode of the semiconductor element and the like to the wiring conductor. To provide a wiring board.

【0009】[0009]

【課題を解決するための手段】本発明は、60重量%乃
至95重量%の無機絶縁物粉末と5重量%乃至40重量
%の熱硬化性樹脂とからり、前記無機絶縁物粉末を前
記熱硬化性樹脂により結合して成る前駆体シートを半硬
化させて、前記無機絶縁物粉末を前記熱硬化性樹脂によ
り結合した複数の絶縁基板を積層して成る絶縁基体の前
記絶縁基板に、半硬化の前記前駆体シートとともに熱硬
化させた、金属粉末を熱硬化性樹脂により結合した配線
導体を被着させて成る配線基板であって、前記絶縁基
と配線導体との間および該配線導体を被着させる前記絶
縁基板とこれに積層される前記絶縁基板との間に、熱硬
化性樹脂からる中間層を介在させるとともに、該中間
層の熱硬化性樹脂を絶縁基及び配線導体の各々の熱硬
化性樹脂に架橋反応により接合させたことを特徴とする
ものである。
SUMMARY OF THE INVENTION The present invention, Ri consists of 60 wt% to 95 wt% of the inorganic insulator powder and 5 wt% to 40 wt% of a thermosetting resin, wherein the inorganic insulator powder Semi-hardened precursor sheet made by bonding with thermosetting resin
And the inorganic insulating powder is converted into the thermosetting resin.
Previous plurality of insulating substrates comprising insulating substrate laminated bound Ri
Heat-cured on the insulating substrate together with the semi-cured precursor sheet.
It was of the metal powder to a wiring substrate formed by depositing the wiring conductor joined by a thermosetting resin, is deposited between and wiring conductors and said insulating base plate <br/> the wiring conductor Said
Between the insulating substrate and the edge board is laminated thereto, with the interposition of forming Ru intermediate layer of a thermosetting resin, each of the thermal curing of a thermosetting resin insulating board and the wiring conductors of the intermediate layer It is characterized in that it is bonded to the organic resin by a crosslinking reaction.

【0010】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合して、硬
化後に絶縁基体と成る前駆体シートを準備する工程と、
該前駆体シートを半硬化させる工程と、該半硬化した
記前駆体シートの一面に熱硬化性樹脂前駆体から成る樹
脂ペーストを塗布する工程と、前記塗布された樹脂ペー
スト上に熱硬化性樹脂前駆体と金属粉末とを混合して
、硬化後に配線導体と成る金属ペーストを所定パター
ンに塗布する工程と、前記前駆体シート、樹脂ペースト
及び金属ペーストに圧力を印加しながら加熱処理し、樹
脂ペーストの熱硬化性樹脂と前駆体シート及び金属ペー
ストの熱硬化性樹脂との間に架橋反応をおこさせつつ熱
硬化させる工程と、から成ることを特徴とするものであ
る。
[0010] method of manufacturing a wiring board of the present invention, Ru formed by mixing a thermosetting resin precursor and the inorganic insulating powder, hard
Of preparing a precursor sheet to be an insulating substrate after conversion ,
A step of semi-curing the precursor sheet ; a step of applying a resin paste made of a thermosetting resin precursor on one surface of the semi-cured precursor sheet; and a step of applying the resin paste on the applied resin paste. to a mixture of the metal powder thermosetting resin precursor Ru formed <br/>, the steps of applying a metal paste to a predetermined pattern comprising a wiring conductor after curing, the precursor sheet, the resin paste and the metal paste heat treatment while applying a pressure, a step of thermally curing while causing a crosslinking reaction between the tree <br/> thermosetting resin of thermosetting resin of fat paste precursor sheet and metal paste, from It is characterized by being formed.

【0011】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作ラインの一部とが激しく衝
突したとしても絶縁基体に欠けや割れ、クラック等を発
生することはない。
According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are connected to each other or between the wiring boards and the semiconductor device manufacturing line. Even if a part of the insulating base material violently collides with the insulating base material, the insulating base material will not be chipped, cracked, or cracked.

【0012】また本発明の配線基板によれば、絶縁基
と配線導体との間および配線導体を被着させる絶縁基板
とこれに積層される絶縁基板との間に熱硬化性樹脂から
成る中間層を介在させるとともに該中間層の熱硬化性樹
脂を絶縁基及び配線導体の各々の熱硬化性樹脂に架橋
反応により接合させたことから絶縁基に対する配線導
体の接合強度が極めて強いものとなり、その結果、配線
導体に半導体素子の電極を接続する際等において配線導
体に大きな外力が印加されても配線導体が絶縁基より
剥離することはなく、半導体素子等の電極を配線導体に
確実、強固に電気的接続することが可能となる。
[0012] According to the wiring board of the present invention, an insulating substrate on which is deposited between and wiring conductors of the wiring conductor and the insulating board <br/>
The crosslinking reaction of a thermosetting resin of the intermediate layer in each of the thermosetting resin of the insulating board and the wiring conductors together is interposed an intermediate layer made of a thermosetting resin between the insulating substrate laminated thereto and bonding strength of the wiring conductor for insulating board since it was bonded becomes extremely strong, so that even the wiring conductor large external force is applied to the wiring conductor in such when connecting electrodes of the semiconductor element to the wiring conductor insulation not be separated from the base plate, ensuring an electrode of a semiconductor element or the like on the wiring conductors, it is possible to firmly electrically connected.

【0013】更に本発明の配線基板は、熱硬化性樹脂前
駆体と無機絶縁物粉末とを混合して、硬化後に絶縁
基体と成る前駆体シートを準備する工程と、該前駆体シ
ートを半硬化させる工程と、該半硬化した前記前駆体シ
ートの一面に熱硬化性樹脂前駆体から成る樹脂ペースト
を塗布する工程と、前記塗布された樹脂ペースト上に熱
硬化性樹脂前駆体と金属粉末とを混合して、硬化後
に配線導体と成る金属ペーストを所定パターンに塗布す
る工程と、前記前駆体シート、樹脂ペースト及び金属ペ
ーストに圧力を印加しながら加熱処理し、樹脂ペースト
の熱硬化性樹脂と前駆体シート及び金属ペーストの熱硬
化性樹脂との間に架橋反応をおこさせつつ熱硬化させる
工程とで製作され、前駆体シート、樹脂ペースト、金属
ペーストの熱硬化性樹脂前駆体は熱硬化時に殆ど収縮し
ないことから不均一な収縮による変形や寸法のばらつき
が発生することもない。
Furthermore the wiring board of the present invention, Ru formed by mixing a thermosetting resin precursor and the inorganic insulating powder, the insulating after curing
Preparing a precursor sheet comprising a substrate, said precursor sheet
Of semi-curing the resin, a step of applying a resin paste made of a thermosetting resin precursor to one surface of the semi-cured precursor sheet, and a thermosetting resin precursor on the applied resin paste. mixing a metal powder and Ru formed after curing
In a step of applying a metal paste to a predetermined pattern comprising a wiring conductor, the precursor sheet, a heat treatment while applying a pressure to the resin paste and the metal paste, the precursor sheet and the metal and thermosetting resin tree butter paste The thermosetting resin precursor of the paste, the resin paste, and the metal paste hardly shrinks during thermosetting because it is produced by a step of thermosetting while causing a crosslinking reaction with the thermosetting resin of the paste. No deformation or dimensional variation due to uneven shrinkage occurs.

【0014】[0014]

【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。図1及び図2は、本発明の配線基板を
半導体素子を収容する半導体素子収納用パッケージに適
用した場合の一実施を示し、1は絶縁基体、2は配線
導体である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described in detail with reference to the accompanying drawings. 1 and 2 show an embodiment of the application of the wiring board to the semiconductor device housing package for housing a semiconductor device of the present invention, 1 denotes an insulating substrate, 2 denotes a wiring conductor.

【0015】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
材を介して接着固定される。
The insulating substrate 1 is composed of three insulating substrates 1a and 1a.
It is formed by stacking b and 1c, and has a recess 1d for accommodating a semiconductor element in the center of the upper surface thereof, and the semiconductor element 3 is provided on the bottom surface of the recess 1d via an adhesive such as resin. Adhesively fixed.

【0016】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは、例えば酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム、
ゼオライト等の無機絶縁物粉末をエポキシ樹脂、ポリイ
ミド樹脂等の熱硬化性樹脂で結合することによって形成
されており、絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cはその各々が無機絶縁物粉末を靱性に優
れる熱硬化性樹脂で接合することによって形成されてい
ることから絶縁基体1に外力が印加されても、該外力に
よって絶縁基体1に欠けや割れ、クラック等が発生する
ことはない。
The three insulating substrates 1a, 1b and 1c constituting the insulating base 1 are, for example, silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate,
It is formed by bonding inorganic insulating powder such as zeolite with a thermosetting resin such as epoxy resin or polyimide resin, and three insulating substrates 1 constituting the insulating substrate 1 are formed.
Since each of a, 1b, and 1c is formed by joining the inorganic insulating powder with a thermosetting resin having excellent toughness, even if an external force is applied to the insulating base 1, the insulating base 1 is applied to the insulating base 1 by the external force. No chipping, cracking, or cracking occurs.

【0017】なお、前記無機絶縁物粉末を熱硬化性樹脂
で結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨張係数が半導体素子3の
熱膨張係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に熱膨張係数の相違に起因する大
きな熱応力が発生し、この大きな熱応力によって半導体
素子3が絶縁基体1より剥離したり、半導体素子3に割
れや欠け等が発生してしまう。また95重量%を越える
と無機絶縁物粉末を熱硬化性樹脂で完全に結合させるこ
とができず、所定の絶縁基板1a、1b、1cを得るこ
とができなくなる。従って、前記絶縁基体1を構成する
絶縁基板1a、1b、1cはその各々の内部に含有され
る無機絶縁物粉末の量が60重量%乃至95重量%の範
囲に特定される。
In addition, three insulating substrates 1 constituting an insulating substrate 1 formed by bonding the inorganic insulating powders with a thermosetting resin.
a, 1b, and 1c have an inorganic insulating powder content of 60% by weight.
When it is less than the above, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, the semiconductor element 3 emits heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. Then, a large thermal stress is generated between them due to the difference in thermal expansion coefficient, and the large thermal stress causes the semiconductor element 3 to be separated from the insulating substrate 1, or the semiconductor element 3 to be cracked or chipped. I will end up. On the other hand, if it exceeds 95% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1b, 1c cannot be obtained. Therefore, the insulating substrates 1a, 1b, 1c constituting the insulating base 1 are specified such that the amount of the inorganic insulating powder contained therein is in the range of 60% by weight to 95% by weight.

【0018】また前記絶縁基体1はその凹部1dの周辺
から下面にかけて例えば、銅、銀、金等の金属粉末をエ
ポキシ樹脂等の熱硬化性樹脂より結合した配線導体2が
形成されている。
A wiring conductor 2 is formed from the periphery of the concave portion 1d to the lower surface of the insulating base 1 by binding a metal powder such as copper, silver or gold with a thermosetting resin such as an epoxy resin.

【0019】前記配線導体2は、内部に収容する半導体
素子3を外部電気回路に電気的に接続する作用をなし、
凹部1dの周辺部位には半導体素子3の各電極がボンデ
ィングワイヤ4を介して電気的に接続され、また絶縁基
体1の下面に導出する部位は外部電気回路基板に電気的
に接続される。
The wiring conductor 2 serves to electrically connect the semiconductor element 3 housed therein to an external electric circuit,
The electrodes of the semiconductor element 3 are electrically connected to the peripheral portion of the recess 1d through the bonding wires 4, and the portion leading to the lower surface of the insulating substrate 1 is electrically connected to the external electric circuit board.

【0020】前記配線導体2はそれに含有される金属粉
末の量が70重量%未満では配線導体2の導電性が悪く
なる傾向にあり、また95重量%を越えると金属粉末を
熱硬化性樹脂で強固に結合することが困難となる傾向に
ある。従って、前記金属粉末を熱硬化性樹脂で結合して
成る配線導体2は金属粉末の含有量を70重量%乃至9
5重量%の範囲としておくことが好ましい。
When the amount of the metal powder contained in the wiring conductor 2 is less than 70% by weight, the conductivity of the wiring conductor 2 tends to deteriorate, and when it exceeds 95% by weight, the metal powder is made of a thermosetting resin. A strong bond tends to be difficult. Therefore, the wiring conductor 2 formed by binding the metal powder with a thermosetting resin has a metal powder content of 70 to 9 wt%.
It is preferable to set it in the range of 5% by weight.

【0021】また前記配線導体2は、その露出する表面
にニッケル、金等の耐蝕性に優れ、かつ良導電性の金属
をめっき法により1μm乃至20μmの厚みに被着させ
ておくと、配線導体2の酸化腐食を有効に防止すること
ができるとともに配線導体2とボンディングワイヤ4と
を強固に電気的接続させることができる。従って、前記
配線導体2はその露出する表面にニッケルや金等の耐蝕
性に優れ、かつ良導電性である金属をめっき法により1
μm乃至20μm厚みに被着させておくことが好まし
い。
Further, the wiring conductor 2 is formed by depositing a metal having excellent corrosion resistance such as nickel or gold on the exposed surface by a plating method to a thickness of 1 μm to 20 μm. The oxidative corrosion of 2 can be effectively prevented, and the wiring conductor 2 and the bonding wire 4 can be firmly electrically connected. Therefore, the wiring conductor 2 is formed on the exposed surface by plating with a metal such as nickel or gold having excellent corrosion resistance and good conductivity.
It is preferable that the film is deposited to a thickness of μm to 20 μm.

【0022】前記配線導体2はまた絶縁基体1の下面に
導出する部位に、外部電気回路と電気的に接続されるバ
ンプ電極2aが形成されており、該バンプ電極2aを外
部電気回路基板の配線導体に半田等の導電性接着剤を介
して接合することにより内部に収容する半導体素子3は
外部電気回路に電気的に接続されることとなる。
The wiring conductor 2 has a bump electrode 2a electrically connected to an external electric circuit formed on the lower surface of the insulating substrate 1. The bump electrode 2a is connected to the wiring of the external electric circuit board. By joining the conductor to the conductor via a conductive adhesive such as solder, the semiconductor element 3 housed inside is electrically connected to an external electric circuit.

【0023】更に前記配線導体2と絶縁基体1を構成す
る絶縁基板1bの上面との間に図2に示すように、中間
層5が介在されており、該中間層5によって配線導体2
と絶縁基板1bとが強固に接合し、配線導体2に半導体
素子3の電極をボンディングワイヤ4を介して接続させ
る際等において、配線導体2に大きな外力が印加された
としても該外力によって配線導体2が絶縁基体1(絶縁
基板1bの上面)より剥離することはなく、これによっ
て半導体素子3の各電極を配線導体2に確実、強固に電
気的接続することが可能となる。
Further, as shown in FIG. 2, an intermediate layer 5 is interposed between the wiring conductor 2 and the upper surface of the insulating substrate 1b constituting the insulating substrate 1, and the intermediate layer 5 allows the wiring conductor 2 to be formed.
When the wiring conductor 2 is connected to the electrode of the semiconductor element 3 via the bonding wire 4 even when a large external force is applied to the wiring conductor 2, the wiring conductor 2 is firmly joined to the insulating substrate 1b by the external force. 2 does not peel off from the insulating base 1 (the upper surface of the insulating substrate 1b), whereby each electrode of the semiconductor element 3 can be reliably and firmly electrically connected to the wiring conductor 2.

【0024】前記中間層5はビスマレイミド−トリアジ
ン樹脂、エポキシ樹脂、ポリイミド樹脂等の熱硬化性樹
脂から成り、絶縁基板1bの熱硬化性樹脂と配線導体2
の熱硬化性樹脂とに架橋反応、具体的には中間層5の熱
硬化性樹脂がビスマレイミド−トリアジン樹脂、絶縁基
板1b及び配線導体2の熱硬化性樹脂がエポキシ樹脂の
場合、中間層5のビスマレイミド−トリアジン樹脂の主
成分であるシアネート基に存在する第3級アミンが、絶
縁基板1b及び配線導体2のエポキシ樹脂のエポキシ基
の開環重合として働いて架橋反応を起こしたり、ビスマ
レイミド樹脂に存在する−C=Oと、エボキシ基が架橋
反応を起こすことによって配線導体2を絶縁基板1bに
強固に接合させる。
The intermediate layer 5 is made of a thermosetting resin such as a bismaleimide-triazine resin, an epoxy resin or a polyimide resin. The thermosetting resin of the insulating substrate 1b and the wiring conductor 2 are used.
When the thermosetting resin of the intermediate layer 5 is a bismaleimide-triazine resin and the thermosetting resin of the insulating substrate 1b and the wiring conductor 2 is an epoxy resin, the intermediate layer 5 The tertiary amine present in the cyanate group, which is the main component of the bismaleimide-triazine resin, acts as a ring-opening polymerization of the epoxy groups of the epoxy resin of the insulating substrate 1b and the wiring conductor 2 to cause a crosslinking reaction, or the bismaleimide. A cross-linking reaction occurs between -C = O present in the resin and the oxy group, whereby the wiring conductor 2 is firmly bonded to the insulating substrate 1b.

【0025】なお、前記中間層5はその厚みが10μm
未満となると配線導体2を絶縁基板1b上に強固に接合
するのが困難となり、また70μmを越えると中間層5
と配線導体2及び絶縁基板1bとの間に熱膨張係数の相
違に伴う熱応力によって剥離が発生してしまう危険性が
ある。従って、前記中間層5はその厚みを10μm乃至
70μmの範囲としておくことが好ましい。
The thickness of the intermediate layer 5 is 10 μm.
If the thickness is less than this, it becomes difficult to firmly bond the wiring conductor 2 onto the insulating substrate 1b, and if it exceeds 70 μm, the intermediate layer 5 is formed.
There is a risk that peeling may occur between the wiring conductor 2 and the insulating substrate 1b due to thermal stress due to the difference in thermal expansion coefficient. Therefore, the thickness of the intermediate layer 5 is preferably set in the range of 10 μm to 70 μm.

【0026】また、前記中間層5はその内部に酸化珪
素、酸化アルミニウム、窒化アルミニウム、炭化珪素、
チタン酸バリウム、チタン酸ストロンチウム、酸化チタ
ン等のフィラーを含有させておいてもよい。但し、その
含有量は50重量%を越えると配線導体2中の熱硬化性
樹脂及び絶縁基板1b中の熱硬化性樹脂との架橋反応性
が悪くなってしまうので50重量%以下とすることが好
ましい。
The intermediate layer 5 has silicon oxide, aluminum oxide, aluminum nitride, silicon carbide,
Fillers such as barium titanate, strontium titanate, and titanium oxide may be included. However, if the content exceeds 50% by weight, the cross-linking reactivity with the thermosetting resin in the wiring conductor 2 and the thermosetting resin in the insulating substrate 1b deteriorates, so it should be 50% by weight or less. preferable.

【0027】かくして上述の配線基板よれば、絶縁基体
1の凹部1d底面に半導体素子3を接着剤を介して接着
固定するとともに半導体素子3の各電極をボンディング
ワイヤ4を介して配線導体2に電気的に接続し、しかる
後、前記絶縁基体1の上面に蓋体6を封止剤を介して接
合させ、絶縁基体11と蓋体6とから成る容器内部に半
導体素子3を気密に収容することによって製品としての
半導体装置となる。
Thus, according to the above-mentioned wiring board, the semiconductor element 3 is adhered and fixed to the bottom surface of the recess 1d of the insulating substrate 1 with an adhesive, and each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 via the bonding wire 4. Electrically, and thereafter, the lid 6 is bonded to the upper surface of the insulating base 1 through a sealant, and the semiconductor element 3 is hermetically housed in the container including the insulating base 11 and the lid 6. The product becomes a semiconductor device.

【0028】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図3に基づき説明
する。まず図3(a)に示すように、3枚の前駆体シー
ト11a、11b、11cを準備する。
Next, a method of manufacturing the wiring board used for the semiconductor element housing package will be described with reference to FIG. First, as shown in FIG. 3A, three precursor sheets 11a, 11b and 11c are prepared.

【0029】前記3枚の前駆体シート11a、11b、
11cは酸化珪素、酸化アルミニウム、窒化アルミニウ
ム、炭化珪素、チタン酸バリウム、チタン酸ストロンチ
ウム、酸化チタン等の無機絶縁物粉末をエポキシ樹脂、
ポリイミド樹脂、ポリフェニレンエーテル樹脂等の熱硬
化性樹脂前駆体で結合することによって形成されてお
り、例えば粒径が0.1〜100μmの酸化珪素粉末
に、ビスフェノールA型エポキシ樹脂、ノボラック型エ
ポキシ樹脂、グリシジルエステル型エポキシ樹脂等のエ
ポキシ樹脂、及びアミン系硬化剤、イミダゾール系硬化
剤、酸無水物系硬化剤等の硬化剤を添加混合してペース
ト状となし、しかる後、このペーストをシート状になす
とともに約25〜100℃の温度で1〜60分間加熱
し、半硬化させことによって製作される。
The three precursor sheets 11a, 11b,
11c is an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, strontium titanate, or titanium oxide, which is an epoxy resin,
It is formed by bonding with a thermosetting resin precursor such as a polyimide resin or a polyphenylene ether resin. For example, a bisphenol A type epoxy resin, a novolac type epoxy resin, a silicon oxide powder having a particle size of 0.1 to 100 μm, Epoxy resin such as glycidyl ester type epoxy resin, and amine type curing agent, imidazole type curing agent, curing agent such as acid anhydride type curing agent are added and mixed to form a paste, and then this paste is formed into a sheet. It is manufactured by heating at a temperature of about 25 to 100 ° C. for 1 to 60 minutes and half-curing.

【0030】次に図3(b)に示すように、前記前駆体
シート11bの上面に中間層となる樹脂ペースト膜15
を形成する。
Next, as shown in FIG. 3B, a resin paste film 15 as an intermediate layer is formed on the upper surface of the precursor sheet 11b.
To form.

【0031】前記樹脂ペースト膜15はエポキシ樹脂、
ポリイミド樹脂、ポリフェニレンエーテル樹脂等の熱硬
化性樹脂前駆体から成り、前記前駆体シート11bの上
面に10μm〜70μmの厚みに被着させることよって
前駆体シート11bの上面に形成される。
The resin paste film 15 is an epoxy resin,
It is made of a thermosetting resin precursor such as a polyimide resin or a polyphenylene ether resin, and is formed on the upper surface of the precursor sheet 11b by depositing it on the upper surface of the precursor sheet 11b to a thickness of 10 μm to 70 μm.

【0032】前記樹脂ペースト膜15の前駆体シート1
1bの上面への形成は前駆体シート11bの上面に熱硬
化性樹脂前駆体から成る樹脂ペーストを塗布するととも
にこれを約25〜100℃の温度で1〜60分間熱処理
し、樹脂ペースト中の熱硬化性樹脂を半硬化させること
によって行われる。
Precursor sheet 1 of the resin paste film 15
1b is formed on the upper surface by applying a resin paste made of a thermosetting resin precursor on the upper surface of the precursor sheet 11b and heat-treating the resin paste at a temperature of about 25 to 100 ° C. for 1 to 60 minutes. It is performed by semi-curing a curable resin.

【0033】次に図3(c)に示すように、前記3枚の
前駆体シート11a、11b、11cのうち2枚の前駆
体シート11a、11bに半導体素子3を収容する凹部
1dとなる開口A、A’を、2枚の前駆体シート11
b、11cに配線導体2を引き回すための貫通孔B、
B’を各々形成する。
Next, as shown in FIG. 3 (c), two precursor sheets 11a, 11b, and 11c among the three precursor sheets 11a, 11b, and 11c are provided with recesses 1d for accommodating the semiconductor element 3 therein. A and A ′ are two precursor sheets 11
a through hole B for routing the wiring conductor 2 to b and 11c,
Form each B '.

【0034】前記開口A、A’及び貫通孔B、B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。
The openings A, A'and the through holes B, B'are formed by subjecting the precursor sheets 11a, 11b, 11c to a well-known punching process to obtain precursor sheets 11a, 11b, 11 '.
It is formed by drilling a hole of a predetermined shape in each of c.

【0035】次に図3(d)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法により所定パターンに印刷塗布するとともに
これを約25〜100℃の温度で1〜60分間加熱し、
半硬化させる。
Next, as shown in FIG. 3 (d), a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B'by a conventionally known screen printing method. While printing and applying in a predetermined pattern, this is heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes,
Semi-cure.

【0036】前記金属ペースト12としては、例えば、
粒径が0.1〜20μm程度の銅等の粉末にビスフェノ
ールA型エポキシ樹脂、ノボラック型エポキシ樹脂、グ
リシジルエステル型エポキシ樹脂等のエポキシ樹脂、及
びアミン系硬化剤、イミダゾール系硬化剤、酸無水物系
硬化剤等の硬化剤を添加混合しペースト状となしたもの
が使用される。
As the metal paste 12, for example,
Epoxy resin such as bisphenol A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin, etc. in powder of copper or the like having a particle size of about 0.1 to 20 μm, and amine type curing agent, imidazole type curing agent, acid anhydride A paste in which a curing agent such as a system curing agent is added and mixed is used.

【0037】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層し、上下より一定の圧
力(5〜50Kgf/cm2 )で押圧しつつ約80〜3
00℃の温度を10秒〜24時間印加し、前記樹脂ペー
スト膜15の熱硬化性樹脂と前記前駆体シート11bの
熱硬化性樹脂及び金属ペースト12の熱硬化性樹脂を架
橋反応させるとともに前記前駆体シート11a、11
b、11c、樹脂ペースト膜15及び所定パターンに印
刷塗布された金属ペースト12を完全に熱硬化させるこ
とによって図1に示すような絶縁基体1に配線導体2を
被着させた配線基板が完成する。この場合、前記前駆体
シート11a、11b、11c、樹脂ペースト膜15及
び金属ペースト12は熱硬化時に収縮することは殆どな
く、従って、得られる配線基板に変形や寸法のばらつき
が発生することはなく、これによって半導体素子と配線
導体とを正確に接続することが可能となる。
Finally, the three precursor sheets 11
a, 11b, 11c are vertically stacked, and approximately 80 to 3 while being pressed with a constant pressure (5 to 50 Kgf / cm 2 ) from above and below.
A temperature of 00 ° C. is applied for 10 seconds to 24 hours to cause a cross-linking reaction between the thermosetting resin of the resin paste film 15, the thermosetting resin of the precursor sheet 11b and the thermosetting resin of the metal paste 12 and the precursor. Body sheets 11a, 11
By completely thermosetting b, 11c, the resin paste film 15, and the metal paste 12 printed and applied in a predetermined pattern, a wiring board in which the wiring conductor 2 is adhered to the insulating substrate 1 as shown in FIG. 1 is completed. . In this case, the precursor sheets 11a, 11b, 11c, the resin paste film 15 and the metal paste 12 are hardly contracted at the time of thermosetting, so that the obtained wiring board is not deformed or the dimensions are not varied. As a result, it becomes possible to accurately connect the semiconductor element and the wiring conductor.

【0038】また前記3枚の前駆体シート11a、11
b、11cを上下より5〜50Kgf/cm2 で押圧す
るのは樹脂ペースト膜15の熱硬化性樹脂と金属ペース
ト12及び前駆体シート11bの熱硬化性樹脂との架橋
反応を促進するとともに各々の密着性を高めるためであ
り、押圧力が5Kgf/cm2 未満ではその目的が充分
に達成されず、また50Kgf/cm2 を越えると得ら
れる絶縁基体が大きく変形し寸法精度が低下することか
ら5〜50Kgf/cm2 の範囲としておくことが好ま
しい。
Further, the three precursor sheets 11a, 11
Pressing b and 11c at 5 to 50 Kgf / cm 2 from above and below accelerates the crosslinking reaction between the thermosetting resin of the resin paste film 15 and the metal paste 12 and the thermosetting resin of the precursor sheet 11b, and This is for the purpose of enhancing the adhesiveness, and if the pressing force is less than 5 Kgf / cm 2 , the object is not sufficiently achieved, and if it exceeds 50 Kgf / cm 2 , the obtained insulating substrate is largely deformed and the dimensional accuracy is lowered. It is preferably set in the range of ˜50 Kgf / cm 2 .

【0039】なお、本発明は上述の実施例に限定される
ものではなく、本発明の要旨を逸脱しない範囲であれば
種々の変更は可能であり、例えば上述の実施例では、本
発明の配線基板を半導体素子を収容する半導体素子収納
用パッケージに適用した場合を例に採って説明したが、
これを成集積回路等に用いられる配線基板としても適
用できることはいうまでもない。
The present invention is not limited to the above-mentioned embodiments, and various modifications can be made without departing from the gist of the present invention. For example, in the above-mentioned embodiments, the wiring of the present invention is used. The case where the substrate is applied to a semiconductor element housing package that houses a semiconductor element has been described as an example.
This can of course be also applied as a wiring substrate used in the mixed forming an integrated circuit.

【0040】更に上述の実施例では、3枚の前駆体シー
トを積層することによって配線基板を製作したが、一枚
や二枚、或いは四枚以上の絶縁基板を積層することによ
って形成してもよい。
Further, in the above-mentioned embodiment, the wiring board is manufactured by stacking three precursor sheets, but it may be formed by stacking one, two, or four or more insulating boards. Good.

【0041】[0041]

【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作ラインの一部とが激しく
衝突したとしても絶縁基体に欠けや割れ、クラック等を
発生することはない。
According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are manufactured together or the wiring board and the semiconductor device are manufactured. Even if a part of the line violently collides, the insulating substrate will not be chipped, cracked, or cracked.

【0042】また本発明の配線基板によれば、絶縁基
と配線導体との間および該配線導体を被着させる前記絶
縁基板とこれに積層される前記絶縁基板との間に熱硬化
性樹脂から成る中間層を介在させるととも該中間層の
熱硬化性樹脂を絶縁基及び配線導体の各々の熱硬化性
樹脂に架橋反応により接合させたことから絶縁基に対
する配線導体の接合強度が極めて強いものとなり、その
結果、配線導体に半導体素子の電極を接続する際等にお
いて配線導体に大きな外力が印加されても配線導体が絶
縁基より剥離することはなく、半導体素子等の電極を
配線導体に確実、強固に電気的接続することが可能とな
る。
[0042] According to the wiring board of the present invention, the absolute of depositing and between the wiring conductors of the wiring conductor and the insulating board <br/>
Thermosetting resin insulating board of the intermediate layer together when the intermediate layer is interposed made of a thermosetting resin and each of the thermosetting wiring conductors between the insulating substrate and the edge board is laminated thereto bonding strength of the wiring conductor pairs <br/> the insulating board since it was joined by a cross-linking reaction in the resin becomes extremely strong, so that the wiring conductor in such when connecting electrodes of the semiconductor element to the wiring conductor not a large external force is also wiring conductor is applied is peeled from the insulating base plate, ensuring an electrode of a semiconductor element or the like on the wiring conductors, it is possible to firmly electrically connected.

【0043】更に本発明の配線基板は、熱硬化性樹脂前
駆体と無機絶縁物粉末とを混合して、硬化後に絶縁
基体と成る前駆体シートを準備する工程と、該前駆体シ
ートを半硬化させる工程と、該半硬化した前記前駆体シ
ートの一面に熱硬化性樹脂前駆体から成る樹脂ペースト
を塗布する工程と、前記塗布された樹脂ペースト上に熱
硬化性樹脂前駆体と金属粉末とを混合して、硬化後
に配線導体と成る金属ペーストを所定パターンに塗布す
る工程と、前記前駆体シート、樹脂ペースト及び金属ペ
ーストに圧力を印加しながら加熱処理し、樹脂ペースト
の熱硬化性樹脂と前駆体シート及び金属ペーストの熱硬
化性樹脂との間に架橋反応をおこさせつつ熱硬化させる
工程とで製作され、前駆体シート、樹脂ペースト、金属
ペーストの熱硬化性樹脂前駆体は熱硬化時に殆ど収縮し
ないことから不均一な収縮による変形や寸法のばらつき
が発生することもない。
[0043] Further a wiring board of the present invention, Ru formed by mixing a thermosetting resin precursor and the inorganic insulating powder, the insulating after curing
Preparing a precursor sheet comprising a substrate, said precursor sheet
Of semi-curing the resin, a step of applying a resin paste made of a thermosetting resin precursor to one surface of the semi-cured precursor sheet, and a thermosetting resin precursor on the applied resin paste. mixing a metal powder and Ru formed after curing
In a step of applying a metal paste to a predetermined pattern comprising a wiring conductor, the precursor sheet, a heat treatment while applying a pressure to the resin paste and the metal paste, the precursor sheet and the metal and thermosetting resin tree butter paste The thermosetting resin precursor of the paste, the resin paste, and the metal paste hardly shrinks during thermosetting because it is produced by a step of thermosetting while causing a crosslinking reaction with the thermosetting resin of the paste. No deformation or dimensional variation due to uneven shrinkage occurs.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a cross-sectional view showing an embodiment in which a wiring board of the present invention is applied to a semiconductor element housing package.

【図2】図1に示す配線基板の要部拡大断面図である。FIG. 2 is an enlarged cross-sectional view of a main part of the wiring board shown in FIG.

【図3】(a)乃至(d)は本発明の配線基板の製造方
法を説明するための工程毎の断面図である。
3 (a) to 3 (d) are cross-sectional views for each step for explaining the method for manufacturing a wiring board of the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・・・・・絶縁基体 1a、1b、1c・・・絶縁基板 2・・・・・・・・・・配線導体 5・・・・・・・・・・中間層 11a、11b、11c・・前駆体シート 12・・・・・・・・・・・金属ペースト 15・・・・・・・・・・・樹脂ペースト膜 1 ... Insulating substrate 1a, 1b, 1c ... Insulating substrate 2 ... Wiring conductor 5: Middle layer 11a, 11b, 11c ... Precursor sheet 12: Metal paste 15: Resin paste film

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI H05K 3/46 H05K 3/46 T H01L 23/12 N 23/14 R (56)参考文献 特開 平8−125291(JP,A) 特開 平8−288596(JP,A) 特開 平3−215994(JP,A) 特開 平6−232548(JP,A) 特開 昭62−123792(JP,A) 特開 平10−150123(JP,A) (58)調査した分野(Int.Cl.7,DB名) H05K 1/02 H05K 1/03 H05K 1/09 H05K 3/12 H05K 3/46 H01L 23/12 - 23/15 H01B 1/00 - 1/24 ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI H05K 3/46 H05K 3/46 T H01L 23/12 N 23/14 R (56) Reference JP-A-8-125291 (JP, A) JP-A-8-288596 (JP, A) JP-A-3-215994 (JP, A) JP-A-6-232548 (JP, A) JP-A-62-123792 (JP, A) JP-A-10 −150123 (JP, A) (58) Fields investigated (Int.Cl. 7 , DB name) H05K 1/02 H05K 1/03 H05K 1/09 H05K 3/12 H05K 3/46 H01L 23/12-23 / 15 H01B 1/00-1/24

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】60重量%乃至95重量%の無機絶縁物粉
末と5重量%乃至40重量%の熱硬化性樹脂とから
り、前記無機絶縁物粉末を前記熱硬化性樹脂により結合
て成る前駆体シートを半硬化させて、前記無機絶縁物
粉末を前記熱硬化性樹脂により結合した複数の絶縁基板
を積層して成る絶縁基体の前記絶縁基板に、半硬化の前
記前駆体シートとともに熱硬化させた、金属粉末を熱硬
化性樹脂により結合した配線導体を被着させて成る配線
基板であって、前記絶縁基と配線導体との間および該
配線導体を被着させる前記絶縁基板とこれに積層される
前記絶縁基板との間に、熱硬化性樹脂からる中間層を
介在させるとともに、該中間層の熱硬化性樹脂を絶縁基
及び配線導体の各々の熱硬化性樹脂に架橋反応により
接合させたことを特徴とする配線基板。
1. 60% by weight to 95% by weight of inorganic insulating powder
From powder and 5% to 40% by weight of thermosetting resinSuccess
Bond the inorganic insulating powder with the thermosetting resin.
ShiThe semi-cured precursor sheet consisting of
A plurality of powders bonded by the thermosetting resinInsulation board
StackingInsulating base consistingOf the insulating substrateToBefore semi-curing
Heat cured together with the precursor sheet,Thermosetting metal powder
Wiring formed by depositing wiring conductors bonded with a chemical resin
A substrate, the insulating substrateBoardBetween the wiring conductor andAnd the
The insulating substrate on which the wiring conductor is adhered and laminated on the insulating substrate
Between the insulating substrateFrom thermosetting resinSuccessThe middle layer
In addition to interposing, the thermosetting resin of the intermediate layer is used as an insulating group.
BoardAnd the cross-linking reaction of each thermosetting resin of the wiring conductor
A wiring board characterized by being bonded.
【請求項2】前記中間層の厚みが10μm乃至70μm
であることを特徴とする請求項1に記載の配線基板。
2. The intermediate layer has a thickness of 10 μm to 70 μm.
The wiring board according to claim 1, wherein
【請求項3】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合して、硬化後に絶縁基体と成る前駆体シートを
準備する工程と、該前駆体シートを半硬化させる工程
と、該半硬化した前記前駆体シートの一面に熱硬化性樹
脂前駆体から成る樹脂ペーストを塗布する工程と、前記
塗布された樹脂ペースト上に熱硬化性樹脂前駆体と金属
粉末とを混合して、硬化後に配線導体と成る金属ペ
ーストを所定パターンに塗布する工程と、前記前駆体シ
ート、樹脂ペースト及び金属ペーストに圧力を印加しな
がら加熱処理し、樹脂ペーストの熱硬化性樹脂と前駆体
シート及び金属ペーストの熱硬化性樹脂との間に架橋反
応をおこさせつつ熱硬化させる工程と、から成ることを
特徴とする配線基板の製造方法。
Wherein Ru formed by mixing a thermosetting resin precursor and the inorganic insulator powder, a step of preparing a precursor sheet comprising an insulating substrate after curing, step of semi-curing the precursor sheet
And a step of applying a resin paste comprising a thermosetting resin precursor on one surface of the semi-cured precursor sheet, and mixing the thermosetting resin precursor and metal powder on the applied resin paste. forming Ru Te, the steps of applying a metal paste to a predetermined pattern comprising a wiring conductor after curing, the precursor sheet, a heat treatment while applying a pressure to the resin paste and the metal paste, the thermosetting resin tree butter paste while causing a crosslinking reaction between the thermosetting resin of the precursor sheet and metal paste and a step of thermally curing, in that it consists of
A method for manufacturing a characteristic wiring board.
JP30815896A 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same Expired - Fee Related JP3393769B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30815896A JP3393769B2 (en) 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30815896A JP3393769B2 (en) 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same

Publications (2)

Publication Number Publication Date
JPH10150248A JPH10150248A (en) 1998-06-02
JP3393769B2 true JP3393769B2 (en) 2003-04-07

Family

ID=17977604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30815896A Expired - Fee Related JP3393769B2 (en) 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same

Country Status (1)

Country Link
JP (1) JP3393769B2 (en)

Also Published As

Publication number Publication date
JPH10150248A (en) 1998-06-02

Similar Documents

Publication Publication Date Title
JP3393769B2 (en) Wiring board and method of manufacturing the same
JPH1117348A (en) Wiring board and method of manufacturing the same
JP3152852B2 (en) Wiring board and manufacturing method thereof
JPH1074858A (en) Wiring board and manufacturing method thereof
JP3393768B2 (en) Wiring board and method of manufacturing the same
JP3398310B2 (en) Manufacturing method of wiring board
JP3292644B2 (en) Wiring board and method of manufacturing the same
JP3274971B2 (en) Wiring board
JP3398305B2 (en) Wiring board and method of manufacturing the same
JP3297574B2 (en) Wiring board and method of manufacturing the same
JP3145621B2 (en) Wiring board and manufacturing method thereof
JP3292623B2 (en) Wiring board and method of manufacturing the same
JP3305574B2 (en) Wiring board
JP3398290B2 (en) Manufacturing method of wiring board
JP3292645B2 (en) Wiring board and method of manufacturing the same
JP3297576B2 (en) Wiring board and method of manufacturing the same
JP3266508B2 (en) Wiring board and method of manufacturing the same
JP3297575B2 (en) Wiring board and method of manufacturing the same
JP3297573B2 (en) Wiring board and method of manufacturing the same
JP3323060B2 (en) Wiring board
JP3145620B2 (en) Wiring board and manufacturing method thereof
JP3145619B2 (en) Wiring board and manufacturing method thereof
JP3393747B2 (en) Wiring board and method of manufacturing the same
JPH10209324A (en) Wiring board
JPH08307025A (en) Wiring board and manufacturing method thereof

Legal Events

Date Code Title Description
FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090131

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100131

Year of fee payment: 7

LAPS Cancellation because of no payment of annual fees