JPS6236610B2 - - Google Patents
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- Publication number
- JPS6236610B2 JPS6236610B2 JP56030278A JP3027881A JPS6236610B2 JP S6236610 B2 JPS6236610 B2 JP S6236610B2 JP 56030278 A JP56030278 A JP 56030278A JP 3027881 A JP3027881 A JP 3027881A JP S6236610 B2 JPS6236610 B2 JP S6236610B2
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- Prior art keywords
- resistor
- zno
- firing
- oxide
- sio
- Prior art date
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- Compositions Of Oxide Ceramics (AREA)
Description
【発明の詳細な説明】
本発明は酸化亜鉛(ZnO)を主成分とする電圧
非直線抵抗体の製造方法、特にその側面絶縁方法
に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a voltage nonlinear resistor containing zinc oxide (ZnO) as a main component, and particularly to a method for insulating the side surfaces thereof.
従来、ZnOを主成分とする電圧非直線抵抗体
(以下抵抗体と略する。)の側面絶縁においては、
焼成後抵抗体側面にエポキシ系有機物を塗布して
絶縁するか、あるいは抵抗体の焼成前に種々の無
機化合物を抵抗体側面に塗布後焼成し、ガラス質
又は結晶質の絶縁被膜を形成させて絶縁してい
た。 Conventionally, in the side insulation of voltage nonlinear resistors (hereinafter abbreviated as resistors) whose main component is ZnO,
After firing, an epoxy-based organic substance is applied to the side surface of the resistor for insulation, or before the resistor is fired, various inorganic compounds are applied to the side surface of the resistor and then fired to form a glassy or crystalline insulating film. It was insulated.
しかし、前者の方法においては、塗布するエポ
キシ系有機物と抵抗体との密着性が悪いため抵抗
体に水分が吸着され、特性劣化が大きく短波尾耐
量も弱くなる欠点がある。又、抵抗体とエポキシ
系有機物との間に熱膨張の差があるため熱衝撃で
エポキシ形有機物にクラツクが入り劣化の原因と
なる欠点がある。又、後者の方法においては、焼
成時に抵抗体と無機化合物との収縮率を一致させ
る必要があり、このため1次焼成してある程度抵
抗体を収縮させた後に無機化合物を塗布して本焼
成し、側面絶縁被膜を形成させている。従つてこ
の場合には、焼成を2回に分けて行なうこととな
り、燃料(電力を含む)費が上昇するとともに焼
成装置を2回使用するので製造コストが上昇する
欠点がある。又、両者の方法とも側面絶縁被膜を
必要厚に均一にするためには相当の技術と装置を
要する欠点がある。 However, the former method has the disadvantage that moisture is adsorbed to the resistor due to poor adhesion between the applied epoxy-based organic substance and the resistor, resulting in significant deterioration of characteristics and weakening of short wave tail resistance. Furthermore, since there is a difference in thermal expansion between the resistor and the epoxy organic material, there is a drawback that the epoxy organic material may crack due to thermal shock, causing deterioration. In addition, in the latter method, it is necessary to match the shrinkage rates of the resistor and the inorganic compound during firing, so after the resistor is first fired to shrink to some extent, the inorganic compound is applied and the main firing is performed. , a side insulation coating is formed. Therefore, in this case, the firing must be carried out twice, which increases fuel (including electricity) costs, and the firing apparatus is used twice, which increases manufacturing costs. Furthermore, both methods have the disadvantage that considerable skill and equipment are required to make the side insulating coating uniform to the required thickness.
このため、抵抗体の焼成時に焼成用容器内にア
ンチモン酸化物(sb2O3等)を配置し、焼成と同
時に気一固相反応により側面絶縁被膜を形成する
方法が提案されており、この方法ではアンチモン
酸化物の蒸気と抵抗体との気一固相反応を利用し
ているため抵抗体と絶縁被膜との密着性が良く、
ピンホールのない緻密で均一な結晶粒を持つ絶縁
被膜が得られ、電流放電耐量、耐コロナ性および
耐アーク性等の電気的諸特性がエポキシ系有機物
を塗布した場合に比べて著しく改善されるととも
に、無機化合物を塗布焼成した場合に比べると収
縮率を考慮する必要がなく、焼成を1回で完了す
ることができ、製作容易で安価となる。しかる
に、この場合、Sb2O3の蒸発速度は1000℃で0.07
mg/min1050℃で0.45mg/minと比較的速い。こ
のため、抵抗体中にガスが残つた状態で側面が反
応し、さらに高温になつた際に残存ガスが抵抗体
から放出され、抵抗体と側面絶縁被膜との密着性
が低下し、電気的諸特性も低下することとなつ
た。 For this reason, a method has been proposed in which antimony oxide (such as sb 2 O 3 ) is placed in the firing container during firing of the resistor, and a side insulating film is formed by a gas-solid phase reaction at the same time as the firing. The method utilizes a gas-solid phase reaction between antimony oxide vapor and the resistor, so it has good adhesion between the resistor and the insulating film.
An insulating film with dense and uniform crystal grains without pinholes is obtained, and various electrical properties such as current discharge withstand, corona resistance, and arc resistance are significantly improved compared to when epoxy-based organic materials are applied. In addition, compared to the case where an inorganic compound is applied and fired, there is no need to consider the shrinkage rate, the firing can be completed in one time, and the manufacturing is easy and inexpensive. However, in this case, the evaporation rate of Sb 2 O 3 is 0.07 at 1000℃
Relatively fast at 0.45mg/min at 1050℃. For this reason, the side surfaces of the resistor react with gas remaining in the resistor, and when the temperature increases, the residual gas is released from the resistor, reducing the adhesion between the resistor and the side insulation coating, resulting in electrical Various properties also deteriorated.
本発明は上記の欠点を除去して、電圧非直線抵
抗体の側面絶縁被膜を密着性良く形成することが
できて電気的諸特性を向上することができるとと
もに、側面絶縁被膜を製作容易で安価に形成する
ことができる電圧非直線抵抗体の製造方法を提供
することを目的とする。 The present invention eliminates the above-mentioned drawbacks, makes it possible to form a side insulating coating of a voltage non-linear resistor with good adhesion, improving various electrical characteristics, and making the side insulating coating easy and inexpensive to manufacture. An object of the present invention is to provide a method for manufacturing a voltage nonlinear resistor that can be formed into a voltage nonlinear resistor.
以下本発明の実施例を図面とともに説明する。
まず、焼成装置の構成を第1図によつて説明する
と、1はアルミナ質の鞘(焼成用容器)、2は鞘
1の内底部に載置された耐熱性セラミツク材から
成る台座で、台座2の材質はアルミナ質又は酸化
亜鉛系焼結板等が良く、特に酸化亜鉛系焼結板は
抵抗体の主成分と同質であるので抵抗体の特性を
損ねる恐れがない。3は圧縮成形されたZnOを主
成分とする電圧非直線抵抗体で、抵抗体3は敷粉
4を介して台座2の上面に載置される。敷粉4は
台座2と抵抗体3との溶着を防ぐためのもので、
抵抗体3の成分に類似又は同質のものが要求さ
れ、アルミナ質や抵抗体3の造粒末又は抵抗体3
を仮焼して砕いた粉等が用いられる。台座2を抵
抗体3と同質系とした場合には敷粉4はなくても
良い。5は鞘1の内側面に塗布された抵抗体3に
側面絶縁被膜を形成するための塗布剤、6は鞘1
の上部をほぼ密閉状におおう蓋で、蓋6は鞘1と
同質性の部材により形成する。塗布剤5は鞘1の
内面の一部又は全部あるいは蓋6の内面に塗布し
ても良く、要は焼成用の容器内に設けられていれ
ば良い。尚、実際には抵抗体3の上面には絶縁被
膜が形成されるのを防ぐためのしやへい部材が設
けられる。 Embodiments of the present invention will be described below with reference to the drawings.
First, the configuration of the firing apparatus will be explained using FIG. The second material is preferably alumina or a zinc oxide sintered plate, and in particular, the zinc oxide sintered plate has the same quality as the main component of the resistor, so there is no risk of impairing the characteristics of the resistor. Reference numeral 3 denotes a compression-molded voltage non-linear resistor whose main component is ZnO, and the resistor 3 is placed on the upper surface of the pedestal 2 with a padding material 4 in between. The bedding powder 4 is for preventing welding between the pedestal 2 and the resistor 3.
A substance similar or the same as the components of the resistor 3 is required, such as alumina, granulated powder of the resistor 3, or resistor 3.
Powder etc. that are calcined and crushed are used. If the pedestal 2 is made of the same material as the resistor 3, the bedding powder 4 may be omitted. 5 is a coating agent applied to the inner surface of the sheath 1 to form a side insulation coating on the resistor 3; 6 is the sheath 1;
The lid 6 is made of the same material as the sheath 1 and covers the upper part of the sheath 1 in a substantially airtight manner. The coating agent 5 may be applied to a part or all of the inner surface of the sheath 1 or to the inner surface of the lid 6, and it is sufficient if it is provided inside the firing container. In fact, a shielding member is provided on the upper surface of the resistor 3 to prevent the formation of an insulating film.
次に上記の焼成装置を用いた製造方法について
述べると、まず抵抗体3はZnO(91mol%)に
Sb2O3、Bi2O3、CO2O3、MnO2、Cr2O3、SiO2な
どを合計9mol%加え、充分混合した後に適当な
形状に圧縮成形する。例えば直径40mmφ、厚さ30
mmの円柱状の成形体とする。又、塗布剤5は、出
発原料としてSb2O3とSb2O3と反応する酸化物例
えばBi2O3、ZnO、SiO2を60Sb2O3−10Bi2O3−
10ZnO−20SiO2(モル比)となるよう秤量後、こ
れらに水を加えて充分に混合して得られたスラリ
ーを鞘1の内壁に塗布して乾燥させる。そして、
鞘1内に第1図のように抵抗体3を配置し、蓋6
で鞘1をほぼ密閉する。この状態で1000℃〜1500
℃(1100℃〜1300℃が好ましい。)の温度範囲で
焼成すると、塗布剤5中のSb2O3、Bi2O3が蒸発
し、鞘1内はこれらの雰囲気で満たされ、抵抗体
3内のZnO、Bi2O3等と気一固相反応し、抵抗体
3の表面に高抵抗の絶縁被膜が形成される。この
絶縁被膜をX線回析により調べると第2図に示す
ようになり、スピネル(Zn2・33 Sb0・67O4)が主
成分で形成されていることが判明した。このこと
はX線マイクロアナライザーにより調べても同様
であつた。 Next, we will discuss the manufacturing method using the above firing equipment. First, resistor 3 is made of ZnO (91 mol%).
A total of 9 mol % of Sb 2 O 3 , Bi 2 O 3 , CO 2 O 3 , MnO 2 , Cr 2 O 3 , SiO 2 and the like are added, thoroughly mixed, and then compression molded into an appropriate shape. For example, diameter 40mmφ, thickness 30
A cylindrical molded body with a diameter of mm. Further, the coating agent 5 uses Sb 2 O 3 and oxides that react with Sb 2 O 3 such as Bi 2 O 3 , ZnO, and SiO 2 as starting materials .
After weighing to give a molar ratio of 10ZnO-20SiO 2 , water is added to these and thoroughly mixed to obtain a slurry, which is applied to the inner wall of the sheath 1 and dried. and,
The resistor 3 is placed inside the sheath 1 as shown in FIG. 1, and the lid 6 is closed.
to almost seal the sheath 1. 1000℃~1500 in this state
℃ (preferably 1100℃ to 1300℃), Sb 2 O 3 and Bi 2 O 3 in the coating agent 5 evaporate, the inside of the sheath 1 is filled with these atmospheres, and the resistor 3 A high-resistance insulating film is formed on the surface of the resistor 3 by a gas-solid phase reaction with ZnO, Bi 2 O 3 , etc. inside the resistor 3. When this insulating film was examined by X-ray diffraction, as shown in FIG. 2, it was found that spinel (Zn 2 .33 Sb 0 .67 O 4 ) was the main component. This was also confirmed when examined using an X-ray microanalyzer.
上記の気一固相反応においては、塗布剤5の
SbO3とZnOは1000℃までの加熱過程で
ZnO+Sb2O3+O2→ZnSb2O6 ……(1)
の反応によりZnSb2O6が700℃で形成されはじ
め、800℃位までその生成量は増加しその後減少
する。又、
7ZnO+Sb2O3+O2→Zn7Sb2O12 ……(2)
の反応によりZn7Sb2O12(Zn2.33 Sb0.67O4)が800
℃付近から形成されはじめその後増加する。又、
塗布剤5のZnOとSiO2は
2ZnO+SiO2→Zn2SiO4 ……(3)
の反応によりZn2SiO4が800℃付近から形成され
る。 In the above gas-solid phase reaction, the coating agent 5 is
During the heating process of SbO 3 and ZnO up to 1000℃, ZnSb 2 O 6 begins to be formed at 700℃ due to the reaction ZnO + Sb 2 O 3 + O 2 →ZnSb 2 O 6 ...(1), and the amount of formation increases up to about 800℃. increases and then decreases. Also, due to the reaction 7ZnO + Sb 2 O 3 + O 2 →Zn 7 Sb 2 O 12 ...(2), Zn 7 Sb 2 O 12 (Zn 2 . 33 Sb 0 . 67 O 4 ) becomes 800
It begins to form around ℃ and increases thereafter. or,
ZnO and SiO 2 of the coating agent 5 form Zn 2 SiO 4 at around 800° C. due to the reaction 2ZnO+SiO 2 →Zn 2 SiO 4 (3).
さらに、塗布剤5のZnO、Bi2O3とSb2O3は
4ZnO+3Bi2O3+3Sb2O3+O2
→Zn2Sb3Bi3O14 ……(4)
の反応によりZn2Sb3Bi3O14(バイロクロア)が
700℃付近から形成され始め、900℃くらいでその
生成量は最大となつた後、減少し始める。 Furthermore, ZnO, Bi 2 O 3 and Sb 2 O 3 of coating agent 5 are converted into Zn 2 Sb 3 Bi by the reaction of 4ZnO + 3Bi 2 O 3 + 3Sb 2 O 3 + O 2 →Zn 2 Sb 3 Bi 3 O 14 ( 4 ) 3 O 14 (virochloa)
It begins to form at around 700°C, and after reaching a maximum at around 900°C, it begins to decrease.
そして、上記(1)、(2)式の反応によりSb2O3の蒸
発は抑制され、又Sb2O3と反応するZnOの反応率
は上記(3)式の反応によりSiO2によつて抑制され
る。しかし、第3図に示すZnO−Bi2O3−Sb2O3
−SiO2系の加熱過程の結晶構造変化から判るよ
うに、800℃以上になるとZnSb2O6も
Zn2Bi3Sb3O14とZn7Sb2O12に変化するため、
Sb2O3の蒸発は結果的には(2)、(3)、(4)式の反応に
より抑制されたこととなる。従つて、Sb2O3を蒸
発させるためには(2)、(3)、(4)式の反応に必要な量
以上を要求されるので、Sb2O3とZnO、Bi2O3お
よびSiO2との割合は(2)〜(4)式よりSb2O3/ZnO>
4/13、同じくSb2O3/Bi2O3>4/3、又Sb2O3/SlO
3>4/1
となつている。このようにSb2O3は上記の反応に
必要な量以上存在するため上記反応残余のSb2O3
が1000℃前後で蒸発する。しかし、この蒸発は上
記反応においてSb2O3が消費されるためSb2O3単
一塗布の場合より遅くなる。第4図は塗布剤5が
Sb2O3単一の場合と60Sb2O3−10Bi2O3−10ZnO−
20SiO2の場合とにおける温度とSb2O3蒸発量との
関係を示したもので、後者の場合は前者の場合よ
り蒸発が遅いことが判る。一方、抵抗体3は800
℃付近より収縮を始め、1000℃付近ではZnOの他
にZnSiO4、Zn2.33Sb0.67O4、Zn2Bi3Sb3O14、
14Bi2O3−Cr2O3等が形成される。この結果、抵
抗体3の側面ではSb2O3の蒸気と抵抗体3のZnO
とが気一固相反応し、Zn2.33Sb0.67O4を主成分と
する高抵抗の絶縁被膜が形成される。又、Bi2O3
の蒸気は抵抗体3の電圧非直線を支配する抵抗体
3のBi2O3からの蒸発を抑制し、抵抗体3と
Sb2O3の蒸気との反応を促進する作用がある。 The evaporation of Sb 2 O 3 is suppressed by the reactions of equations (1) and (2) above, and the reaction rate of ZnO that reacts with Sb 2 O 3 is increased by SiO 2 by the reaction of equation (3) above. suppressed. However, ZnO−Bi 2 O 3 −Sb 2 O 3 shown in Fig. 3
-As can be seen from the change in crystal structure of the SiO 2 system during heating, ZnSb 2 O 6 also changes at temperatures above 800℃.
Because it changes to Zn 2 Bi 3 Sb 3 O 14 and Zn 7 Sb 2 O 12 ,
As a result, the evaporation of Sb 2 O 3 was suppressed by the reactions of equations (2), (3), and (4). Therefore, in order to evaporate Sb 2 O 3 , an amount exceeding that required for the reactions of equations (2), (3), and (4) is required, so Sb 2 O 3 and ZnO, Bi 2 O 3 , and From formulas (2) to (4), the ratio with SiO 2 is Sb 2 O 3 /ZnO>
4/13, also Sb 2 O 3 /Bi 2 O 3 > 4/3, also Sb 2 O 3 /SlO
3 > 4/1. In this way, since Sb 2 O 3 exists in an amount exceeding the amount required for the above reaction, the Sb 2 O 3 remaining in the above reaction
evaporates at around 1000℃. However, this evaporation is slower than in the case of a single application of Sb 2 O 3 because Sb 2 O 3 is consumed in the above reaction. Figure 4 shows the application agent 5.
Sb 2 O 3 single case and 60Sb 2 O 3 −10Bi 2 O 3 −10ZnO−
This figure shows the relationship between temperature and Sb 2 O 3 evaporation amount in the case of 20SiO 2 , and it can be seen that evaporation is slower in the latter case than in the former case. On the other hand, resistor 3 is 800
It begins to shrink at around 1000°C, and in addition to ZnO, it also contains ZnSiO 4 , Zn 2 . 33 Sb 0 . 67 O 4 , Zn 2 Bi 3 Sb 3 O 14 ,
14Bi 2 O 3 −Cr 2 O 3 etc. are formed. As a result, on the side surface of resistor 3, Sb 2 O 3 vapor and ZnO of resistor 3
A high-resistance insulating film containing Zn 2 . 33 Sb 0 . 67 O 4 as a main component is formed by a gas-solid phase reaction. Also, Bi 2 O 3
The vapor suppresses evaporation from Bi 2 O 3 of the resistor 3, which governs the voltage non-linearity of the resistor 3, and
It has the effect of promoting the reaction of Sb 2 O 3 with vapor.
上記実施例においては、塗布剤5中のSb2O3が
ZnOおよびZnOを介してSiO2と反応するため
Sb2O3の蒸発が遅くなる。このため、抵抗体3が
充分に収縮し充分にガスを放出してから気一固相
反応を生じ、残存ガスが生じないので抵抗体3と
側面絶縁被膜との密着性が良好となり、電流放電
耐量、耐コロナ性および耐アーク性などの電気的
諸特性が良好となる。因みに抵抗体3の短波尾放
電耐量を測定した結果、例えば塗布剤5を
60Sb2O3−10Bi2O3−10ZnO−20SiO2とした場
合、4×10μSのインパルスを2回印加して
75KAの放電耐量を示した。又、抵抗体3の側面
に直接塗布剤5を塗布する方法ではないので焼成
中における抵抗体3と塗布剤5との収縮率の相違
を考慮する必要がなく、1回の焼成で簡単かつ安
価に高抵抗な側面絶縁被膜を形成することができ
る。 In the above example, Sb 2 O 3 in the coating agent 5 is
Because it reacts with SiO2 through ZnO and ZnO
Evaporation of Sb 2 O 3 becomes slower. Therefore, a gas-solid phase reaction occurs after the resistor 3 sufficiently contracts and releases gas, and no residual gas is generated, resulting in good adhesion between the resistor 3 and the side insulating coating, and current discharge. Electrical properties such as durability, corona resistance, and arc resistance are improved. Incidentally, as a result of measuring the short wave tail discharge resistance of resistor 3, it was found that, for example, coating material 5
In the case of 60Sb 2 O 3 −10Bi 2 O 3 −10ZnO−20SiO 2 , apply 4 × 10 μS impulse twice.
It showed a discharge capacity of 75KA. In addition, since the method does not apply the coating material 5 directly to the side surface of the resistor 3, there is no need to consider the difference in shrinkage rate between the resistor 3 and the coating material 5 during firing, and the method is simple and inexpensive with one firing. A high-resistance side insulating film can be formed on the surface.
尚、上記実施例において、鞘1内に収納する抵
抗体3は圧縮成形した後に仮焼成してある程度収
縮させたものでも良い。又、塗布剤5とせずにス
ラリーを乾燥して粉状にし鞘1内に敷くようにし
ても良い。さらに、ZnO、Bi2O3、SiO2はこれら
と熱分解してZnO、Bi2O3、GiO2となる塩、例え
ば炭酸塩等も含む。 In the above embodiment, the resistor 3 housed in the sheath 1 may be compressed and then pre-fired to shrink to some extent. Alternatively, instead of forming the coating agent 5, the slurry may be dried into powder and spread within the sheath 1. Furthermore, ZnO, Bi 2 O 3 and SiO 2 also include salts, such as carbonates, which thermally decompose with these to become ZnO, Bi 2 O 3 and GiO 2 .
以上のように本発明においては、酸化亜鉛を主
成分とする電圧非直接抵抗体の焼成の際に、焼成
用容器内にアンチモン酸化物とこのアンチモン酸
化物と反応してアンチモン酸化物の蒸発を遅延さ
せる酸化物を設け、この酸化物にBi2O3、ZnOお
よびSiO2を用いて焼成したのでアンチモン酸化
物の蒸発はアンチモン酸化物のみを配置した場合
より遅くなり、特に抵抗体が充分収縮してから
Sb2O3との気−固相反応が起るため、緻密で、か
つ高抵抗な絶縁被膜が得られ、しかも被膜の密着
性が極めて良くなるとともに電気的緒特性も良好
となる。 As described above, in the present invention, when firing a voltage non-direct resistor whose main component is zinc oxide, antimony oxide reacts with the antimony oxide in the firing container to prevent evaporation of the antimony oxide. Since a retardant oxide is provided and this oxide is fired using Bi 2 O 3 , ZnO and SiO 2 , the evaporation of antimony oxide is slower than when only antimony oxide is provided, and in particular, the resistor shrinks sufficiently. after
Since a gas-solid phase reaction with Sb 2 O 3 occurs, a dense and high-resistance insulating film can be obtained, and the adhesion of the film is extremely good, as well as good electrical properties.
第1図は本発明に係る焼成装置の縦断正面図、
第2図は本発明に係る側面絶縁被膜のX線回折
図、第3図は本発明に係るZnO−Bi2O3−Sb2O3
−SiO2系の加熱過程の結晶構造変化図、第4図
は本発明に係る温度とSb2O3蒸発量との関係を示
す特性図である。
1……鞘(焼成用容器)、3……電圧非直線抵
抗体、5……塗布剤、6……蓋。
FIG. 1 is a longitudinal sectional front view of a firing device according to the present invention;
FIG. 2 is an X-ray diffraction diagram of the side insulating coating according to the present invention, and FIG. 3 is an X-ray diffraction diagram of the ZnO-Bi 2 O 3 -Sb 2 O 3 according to the present invention.
FIG. 4 is a characteristic diagram showing the relationship between temperature and Sb 2 O 3 evaporation amount according to the present invention. 1... Sheath (container for firing), 3... Voltage nonlinear resistor, 5... Coating agent, 6... Lid.
Claims (1)
焼成用容器内に収納するとともにアンチモン酸化
物と反応してアンチモン酸化物の蒸発を遅延させ
る酸化物を、アンチモン酸化物と混合し、その混
合物を前記焼成用容器内に設けた後、前記抵抗体
を焼成すると、その焼成と同時に気一固相反応に
より前記抵抗体に側面絶縁被膜を得るようにした
製造方法において、前記アンチモン酸化物の蒸発
を遅延させる酸化物はBi2O3、ZnO及びSiO2から
なることを特徴とする電圧非直線抵抗体の製造方
法。1. A voltage nonlinear resistor containing zinc oxide as a main component is stored in a firing container, and an oxide that reacts with antimony oxide to retard the evaporation of antimony oxide is mixed with antimony oxide. In the manufacturing method, when the resistor is fired after being placed in the firing container, a side insulating coating is obtained on the resistor by a gas-solid phase reaction at the same time as the firing. A method for manufacturing a voltage nonlinear resistor, characterized in that the oxide that retards the voltage is comprised of Bi 2 O 3 , ZnO, and SiO 2 .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56030278A JPS57145303A (en) | 1981-03-03 | 1981-03-03 | Method of producing voltage nonlinear resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56030278A JPS57145303A (en) | 1981-03-03 | 1981-03-03 | Method of producing voltage nonlinear resistor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57145303A JPS57145303A (en) | 1982-09-08 |
| JPS6236610B2 true JPS6236610B2 (en) | 1987-08-07 |
Family
ID=12299241
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56030278A Granted JPS57145303A (en) | 1981-03-03 | 1981-03-03 | Method of producing voltage nonlinear resistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57145303A (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5769705A (en) * | 1980-10-20 | 1982-04-28 | Meidensha Electric Mfg Co Ltd | Method of producing voltage nonlinear resistor |
-
1981
- 1981-03-03 JP JP56030278A patent/JPS57145303A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57145303A (en) | 1982-09-08 |
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