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JPH032838B2 - - Google Patents
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JPH032838B2 - - Google Patents

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Publication number
JPH032838B2
JPH032838B2 JP57122009A JP12200982A JPH032838B2 JP H032838 B2 JPH032838 B2 JP H032838B2 JP 57122009 A JP57122009 A JP 57122009A JP 12200982 A JP12200982 A JP 12200982A JP H032838 B2 JPH032838 B2 JP H032838B2
Authority
JP
Japan
Prior art keywords
crystal
crucible
melt
shape
cross
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57122009A
Other languages
Japanese (ja)
Other versions
JPS5913692A (en
Inventor
Tokumi Fukazawa
Kazumasa Takagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP57122009A priority Critical patent/JPS5913692A/en
Publication of JPS5913692A publication Critical patent/JPS5913692A/en
Publication of JPH032838B2 publication Critical patent/JPH032838B2/ja
Granted legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/34Silicates

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 本発明はチヨクラルスキー法による酸化物単結
晶、とくにシンチレータ材料として有用なユーリ
タイト族、Bi4(GexSi1-x3O12(ここでx=0〜
1)の単結晶育成方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides oxide single crystals produced by the Czyochralski method, particularly eurytite group Bi 4 (Ge x Si 1-x ) 3 O 12 (where x=0~
The present invention relates to the method for growing a single crystal (1).

放射線検出用シンチレータ材料として有用なゲ
ルマニウム酸ビスマス(Bi4Ge3O12)に代表され
るユーリタイト族の単結晶は、チヨクラルスキー
法によつて育成される。放射線に対する検出感
度、すなわちシンチレータから発生する蛍光の強
さは結晶の品質に強く影響される。とくに結晶中
に泡{ボイド(void)}が存在すると、結晶中で
発生した蛍光が散乱、吸収され、放射線検出感度
は大幅に低下する。この泡をなくすには、融液の
温度を高め、固液界面の形状を平らにすることが
望ましい。固液界面の形状を平らにし、泡をなく
す育成方法は特開昭54−112789に述べられてい
る。一方、高エネルギー放射線の検出のための大
型シンチレータの作成や単結晶からシンチレータ
を歩留りよく作成するためには、育成結晶の大型
化が望まれる。しかしながら、例えばゲルマニウ
ム酸ビスマス単結晶は育成過程において、結晶外
形がねじれやすく、とくに直径35mm以上の大型単
結晶の育成ではこの傾向が強くなる。
Single crystals of the eurytite group, represented by bismuth germanate (Bi 4 Ge 3 O 12 ), which are useful as scintillator materials for radiation detection, are grown by the Czyochralski method. The detection sensitivity to radiation, that is, the intensity of fluorescence generated from the scintillator, is strongly influenced by the quality of the crystal. In particular, when voids are present in the crystal, the fluorescence generated in the crystal is scattered and absorbed, significantly reducing radiation detection sensitivity. In order to eliminate these bubbles, it is desirable to increase the temperature of the melt and flatten the shape of the solid-liquid interface. A growth method for flattening the shape of the solid-liquid interface and eliminating bubbles is described in JP-A-112789-1989. On the other hand, in order to create a large scintillator for detecting high-energy radiation or to create a scintillator from a single crystal with a high yield, it is desired to increase the size of the grown crystal. However, for example, bismuth germanate single crystals tend to have a twisted crystal shape during the growth process, and this tendency becomes particularly strong when growing large single crystals with a diameter of 35 mm or more.

一例としてゲルマニウム酸ビスマス単結晶
(Bi4Ge3O12:BGO)の育成について述べる。第
1図に示すように直径70mm、深さ60mm、板厚2mm
の白金るつぼ1から、結晶径35mmの単結晶を育成
した。白金るつぼに約1.3Kgの焼結体原料を充填
した場合、融液表面はるつぼ1の上端から7mm下
に位置する。高周波誘導加熱によるチヨクラルス
キーの単結晶育成では、るつぼ1と高周波コイル
3の位置は、それによつてるつぼ内の融液の温度
分布が大きく変化するので重要である。この方法
では、るつぼ1の深さ方向の中心に対する高周波
コイル3の長さ方向の中心の位置を13mm下にし
た。この位置で育成を開始し、第2図に示すよう
に結晶の肩部5を結晶回転速度を30min-1にして
作成した。結晶外部の断面はほぼ円形で、その時
の結晶の固液界面の形状は融液に向つて凸であつ
た。ところが結晶肩部において固液界面形状が凸
から平らに変化する時、結晶の成長軸に垂直な断
面の形状は、円形からゆがんだものになる。第3
図は結晶肩部で外形が変形した結晶の外観と成長
軸に垂直な断面形状を示したものである。第3図
の8は結晶肩部から10mm成長させた結晶平行部の
断面である。すでに四角に変形しており、4ケ所
がへこんでいる。さらに育成を続けると第3図の
9のようにヒトデ状になつた。
As an example, the growth of bismuth germanate single crystal (Bi 4 Ge 3 O 12 :BGO) will be described. As shown in Figure 1, the diameter is 70mm, the depth is 60mm, and the plate thickness is 2mm.
A single crystal with a crystal diameter of 35 mm was grown from platinum crucible 1. When a platinum crucible is filled with about 1.3 kg of sintered material, the surface of the melt is located 7 mm below the top of the crucible 1. In the Czyochralski single crystal growth using high-frequency induction heating, the positions of the crucible 1 and the high-frequency coil 3 are important because the temperature distribution of the melt in the crucible changes greatly depending on the position. In this method, the center of the high frequency coil 3 in the length direction was positioned 13 mm below the center of the crucible 1 in the depth direction. Growth was started at this position, and a crystal shoulder 5 was created at a crystal rotation speed of 30 min -1 as shown in FIG. The cross section of the outside of the crystal was approximately circular, and the shape of the solid-liquid interface of the crystal at that time was convex toward the melt. However, when the solid-liquid interface shape changes from convex to flat at the crystal shoulder, the cross-sectional shape perpendicular to the crystal growth axis becomes distorted from circular. Third
The figure shows the appearance of a crystal whose outer shape has been deformed at the crystal shoulder and the cross-sectional shape perpendicular to the growth axis. 8 in FIG. 3 is a cross section of a parallel crystal part grown 10 mm from the crystal shoulder. It has already been transformed into a square, with dents in four places. As it continued to grow, it became starfish-shaped as shown in Figure 3 (9).

このように一度断面が変形するともとにもどら
ずに変形は加速される。一方、この変形を防ぐた
め、すなわち結晶外形を円形にするために、結晶
回転速度を小さくすると泡が発生しやすくなる。
しかも、結晶化にともなつてるつぼ内の融液面が
低下すると、るつぼ壁面からの輻射熱により、る
つぼ内全体に亘つて温度差が小さくなり、最適な
温度分布が得られずにますます結晶中に多数の泡
が発生する。
In this way, once the cross section is deformed, it does not return to its original state and the deformation is accelerated. On the other hand, if the crystal rotation speed is reduced in order to prevent this deformation, that is, to make the crystal outer shape circular, bubbles are likely to occur.
Moreover, as the melt level in the crucible decreases as crystallization progresses, the temperature difference throughout the crucible becomes smaller due to radiant heat from the crucible wall, making it impossible to obtain an optimal temperature distribution and increasing the temperature inside the crystal. A large number of bubbles are generated.

単結晶の外形は、融液中の温度分布に強く影響
され、この結晶外形のねじれを防ぐ方法として
は、上記結晶回転速度の他に、るつぼの上端部に
ヒータを置いて融液の周辺の温度を高めることが
すでに知られている(実開昭54−22329)。しか
し、この方法では、結晶化にともなつてるつぼ内
の融液面が低下すると、上記ヒータからの熱が融
液面に届かなくなり、依然としてねじれの問題は
残る。
The external shape of a single crystal is strongly influenced by the temperature distribution in the melt, and in addition to the crystal rotation speed mentioned above, one way to prevent this crystal external shape from twisting is to place a heater at the upper end of the crucible to control the temperature around the melt. It is already known that the temperature can be increased (Utility Model Publication No. 54-22329). However, in this method, when the surface of the melt in the crucible decreases with crystallization, the heat from the heater no longer reaches the surface of the melt, and the problem of twisting still remains.

したがつて、上記のように泡を無くするのに適
した、成長界面の形状が平らになるような育成条
件では結晶外形がねじれやすく、泡の発生防止と
結晶外形の改善を同時に満足することは極めて難
しい問題であつた。
Therefore, under the growth conditions described above where the shape of the growth interface is flat, which is suitable for eliminating bubbles, the outer shape of the crystal tends to be twisted, and it is therefore necessary to simultaneously prevent the generation of bubbles and improve the outer shape of the crystal. was an extremely difficult problem.

本発明の目的は融液中の温度分布を最適化し、
結晶中の泡を低減するとともに、結晶外形のねじ
れを防ぎ、大型で良質のBi4(GexSi1-x)O12単結
晶を育成するものである。
The purpose of the present invention is to optimize the temperature distribution in the melt,
This method reduces bubbles in the crystal, prevents distortion of the crystal outline, and grows large, high-quality Bi 4 (Ge x Si 1-x ) O 12 single crystals.

結晶中の泡の発生におよぼす融液中の温度分布
の影響について調べた結果、融液中の垂直方向の
温度勾配が大きい場合、ボイドが減少することを
見いだした。このような温度分布を達成するに
は、発熱体であるるつぼの深さ方向の中心を高周
波コイルの長さ方向の中心に対して高い位置にお
くことがよい。
As a result of investigating the influence of the temperature distribution in the melt on the generation of bubbles in the crystal, it was found that the number of voids decreases when the vertical temperature gradient in the melt is large. In order to achieve such a temperature distribution, it is preferable to place the center of the crucible, which is the heating element, in the depth direction at a higher position than the center of the high frequency coil in the length direction.

他方、高周波コイルに対してるつぼが高い位置
にあると、育成される結晶の外形は激しくねじれ
る。しかしながら、結晶肩部から結晶平行部にか
けて成長軸に垂直な結晶断面が円形からずれてい
る場合、ねじれが生じ、一度ねじれると結晶下部
に向かつて一層激しくねじれることが分つた。そ
のためもし、結晶肩部から結晶平行部にかけて、
結晶断面が円形であれば、結晶下部においても、
結晶外形のねじれは少なくなるものと考えられ
る。
On the other hand, if the crucible is located high relative to the high-frequency coil, the outer shape of the grown crystal will be severely twisted. However, it was found that when the crystal cross section perpendicular to the growth axis deviates from a circular shape from the crystal shoulder to the crystal parallel region, twisting occurs, and once twisted, the crystal twists more violently toward the lower part of the crystal. Therefore, if from the crystal shoulder to the crystal parallel part,
If the crystal cross section is circular, even at the bottom of the crystal,
It is thought that the distortion of the crystal external shape will be reduced.

そこで、本発明では結晶育成の初期、すなわち
結晶肩部の育成において、結晶回転速度を小さ
く、固液界面の形状融液に向かつて凸にするとと
もに、結晶断面の形状を円形に保持する。成長が
安定したところで結晶回転速度を徐々に大きく
し、固液界面の形状を平らにしたのち、るつぼを
高周波コイルに対して徐々に上昇させることにし
た。
Therefore, in the present invention, in the early stage of crystal growth, that is, in the growth of the crystal shoulder, the crystal rotation speed is reduced, the shape of the solid-liquid interface is made convex toward the melt, and the shape of the crystal cross section is maintained circular. Once growth stabilized, the crystal rotation speed was gradually increased to flatten the shape of the solid-liquid interface, and then the crucible was gradually raised relative to the high-frequency coil.

これにより、融液中の垂直方向の温度勾配は大
きく維持され、結晶中の泡は大幅に低限されると
同時に、結晶外形の大きなねじれも防止できた。
As a result, the vertical temperature gradient in the melt was maintained large, the number of bubbles in the crystal was significantly reduced, and at the same time, large distortion of the crystal shape was also prevented.

以下、本発明を実施例をもつて説明する。 Hereinafter, the present invention will be explained using examples.

実施例 1 ゲルマニウム酸ビスマス(Bi4Ge3O12)を第1
図に示す直径70mm、深さ60mmの白金るつぼ1から
直径35mmの単結晶を育成した。育成開始時のるつ
ぼ1の深さ方向の中心位置は、高周波コイル3の
長さ方向に対して13mm以下である。種つけ後の結
晶肩部5の作成では、結晶回転速度を20min-1
下にした。これにより結晶平行部6に入るまで、
結晶の固液界面の形状は融液に向かつて凸であ
り、結晶断面の形状は第4図11に示すように円
形であつた。20min-1の結晶回転速度は第1図に
示す炉の構造を採用した場合であつて、その数値
が重要ではなく、育成する結晶の直径、本実施例
では35mmにおいて固液界面の形状が融液に向かつ
て凸状であることが重要である。
Example 1 Bismuth germanate (Bi 4 Ge 3 O 12 ) was used as the first
A single crystal with a diameter of 35 mm was grown from platinum crucible 1 with a diameter of 70 mm and a depth of 60 mm as shown in the figure. The center position of the crucible 1 in the depth direction at the start of growth is 13 mm or less with respect to the length direction of the high frequency coil 3. In creating the crystal shoulder portion 5 after seeding, the crystal rotation speed was set to 20 min -1 or less. As a result, until it enters the crystal parallel part 6,
The shape of the solid-liquid interface of the crystal was convex toward the melt, and the cross-sectional shape of the crystal was circular as shown in FIG. 411. The crystal rotation speed of 20 min -1 is obtained when the furnace structure shown in Fig. 1 is adopted, and the value is not important. It is important that the shape is convex toward the liquid.

結晶平行部に入り約5mm育成した時点で、結晶
回転速度を20min-1から40min-1に約1時間で上
昇させた。40min-1に増加後、るつぼを融液面の
低下温度と同じ1.1mm/hで上昇させ、融液面と
高周波コイルの相対位置が常に一定になるように
した。なお結晶の引上速度は4.1mm/hで、るつ
ぼを停止した場合の引上速度3mm/hと成長速度
が等しくなるようにした。
When the crystals entered the parallel part and grew about 5 mm, the crystal rotation speed was increased from 20 min -1 to 40 min -1 in about 1 hour. After increasing the temperature to 40 min -1 , the crucible was raised at a rate of 1.1 mm/h, which is the same as the temperature drop of the melt surface, so that the relative position between the melt surface and the high-frequency coil was always constant. The crystal pulling rate was 4.1 mm/h, which was set to be equal to the pulling rate of 3 mm/h when the crucible was stopped.

その結果、第4図の結晶外観および結晶断面の
12,13に示すごとく結晶外形のねじれは防止
された。一方、るつぼの位置が高周波コイルに対
して上昇するために、融液中の垂直方向の温度勾
配が大きく、泡の発生も低減できた。
As a result, distortion of the crystal outer shape was prevented as shown in the crystal appearance and crystal cross section 12 and 13 in FIG. On the other hand, since the position of the crucible was raised relative to the high-frequency coil, the temperature gradient in the vertical direction in the melt was large, and the generation of bubbles could be reduced.

るつぼの上昇速度を融液面の低下速度の75%に
した場合、結晶下部において帯状に泡が発生する
のが顕著に見られ、すくなくとも融液面の低下速
度の80%以上が望ましい。
When the rising speed of the crucible is set to 75% of the falling speed of the melt surface, band-shaped bubbles are noticeably generated at the bottom of the crystal, and it is desirable that the rising speed of the crucible be at least 80% of the melt surface falling speed.

実施例 2 実施例1に述べたゲルマニウム酸ビスマスの育
成と同じ育成装置を用いて、ケイ酸ビスマス
(Bi4Si3O12)を育成した。育成開始時のるつぼ1
の深さ方向の中心位置は、高周波コイル3の長さ
方向の中心に対して13mm下であつた。種つけ後の
結晶肩部5の育成では、結晶回転速度を25min-1
にした。これはBi4Si3O12の方が、固液界面の形
状が凸になり易いためである。結晶径が所定の寸
法になつたのち、すぐに結晶回転速度を25min-1
から45min-1に約1時間で増加した。その後、る
つぼを融液面の低下速度と同じ1.1mm/hで上昇
させた。その結果、結晶外形のねじれがない結晶
が育成でき、泡の発生も少ないことが分つた。
Example 2 Bismuth silicate (Bi 4 Si 3 O 12 ) was grown using the same growth apparatus as used for growing bismuth germanate described in Example 1. Crucible 1 at the start of cultivation
The center position in the depth direction was 13 mm below the center of the high frequency coil 3 in the length direction. In growing the crystal shoulder 5 after seeding, the crystal rotation speed was set to 25 min -1.
I made it. This is because Bi 4 Si 3 O 12 tends to have a convex solid-liquid interface. Immediately after the crystal diameter reaches the specified size, the crystal rotation speed is increased to 25 min -1.
It increased from 45 min -1 in about 1 hour. Thereafter, the crucible was raised at a rate of 1.1 mm/h, the same as the rate at which the melt surface was lowered. As a result, it was found that crystals without twisting of the crystal outer shape could be grown, and the generation of bubbles was also small.

以上実施例でも説明したように、本発明によれ
ば、Bi4Ge3O12単結晶、Bi4Si3O12単結晶中の中泡
は低減し、しかも結晶外形のすぐれた単結晶が育
成できることにより、単結晶から作製できるシン
チレータの個数および大型シンチレータの作製が
可能となつた。
As explained in the examples above, according to the present invention, the number of bubbles in Bi 4 Ge 3 O 12 single crystals and Bi 4 Si 3 O 12 single crystals is reduced, and single crystals with excellent crystal outlines can be grown. This has made it possible to manufacture more scintillators and larger scintillators from single crystals.

実施例では、Bi4Ge3O12、Bi4Si3O12について述
べたが、同じ結晶構造をもつこれらの混晶におい
ても同じ効果のあることは明白である。
In the examples, Bi 4 Ge 3 O 12 and Bi 4 Si 3 O 12 were described, but it is clear that these mixed crystals having the same crystal structure also have the same effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は結晶育成用のるつぼ近傍の保温構造を
示す図、第2図はチヨクラルスキー法により単結
晶を育成する場合の形状を示す図、第3図は従来
法で育成したゲルマニウム酸ビスマス単結晶又は
ケイ酸ビスマス単結晶の外観と結晶の成長軸に垂
直な断面の形状を示す図、第4図は本発明によつ
て育成したゲルマニウム酸ビスマス単結晶又はケ
イ酸ビスマス単結晶の外観と結晶の断面形状を示
す図である。 1……白金るつぼ、2……アルミナ耐火物、3
……高周波コイル、4……るつぼの深さ方向の中
心に対する高周波コイルの長さ方向の中心の位
置、5……結晶肩部、6……結晶平行部、7……
結晶肩部における固液界面の形状、8……平行部
から10mmの所の断面形状、9……平行部から70mm
の所の断面形状、10……平行部から150mmの所
の断面形状、11……平行部から10mmの所の断面
形状、12……平行部から70mmの所の断面形状、
13……平行部から150mmの所の断面形状。
Figure 1 shows the heat insulation structure near the crucible for crystal growth, Figure 2 shows the shape when growing a single crystal using the Czyochralski method, and Figure 3 shows bismuth germanate grown using the conventional method. Figure 4 shows the appearance of a single crystal or bismuth silicate single crystal and the shape of a cross section perpendicular to the crystal growth axis. FIG. 3 is a diagram showing a cross-sectional shape of a crystal. 1...Platinum crucible, 2...Alumina refractory, 3
...High frequency coil, 4...Position of the center of the high frequency coil in the longitudinal direction with respect to the center in the depth direction of the crucible, 5...Crystal shoulder, 6...Crystal parallel part, 7...
Shape of the solid-liquid interface at the crystal shoulder, 8...Cross-sectional shape at 10 mm from the parallel part, 9...70 mm from the parallel part
10... Cross-sectional shape at 150 mm from the parallel part, 11... Cross-sectional shape at 10 mm from the parallel part, 12... Cross-sectional shape at 70 mm from the parallel part,
13...Cross-sectional shape at 150mm from the parallel part.

Claims (1)

【特許請求の範囲】 1 高周波誘導加熱を用いたチヨクラルスキー法
によるBi4(GexSi1-X3O12(ここでx=0〜1)単
結晶の育成において、結晶の固液界面形状を融液
に対して凸とし、かつ結晶外形の断面形状をほぼ
円形に保つ小さな結晶回転速度を有する工程と、
前記固液界面形状を融液に対し凸から平坦にする
ために結晶回転速度を増加する工程と、その後る
つぼを高周波コイルに対し相対的に上昇させる工
程を有することを特徴とするBi4(GexSi1-x3O12
単結晶の育成方法。 2 上記るつぼの相対的上昇速度は、上記融液の
面の低下速度の80〜100%である特許請求の範囲
第1項記載のBi4(GexSi1-x3O12単結晶の育成方
法。
[Claims] 1. In growing a Bi 4 (Ge x Si 1-X ) 3 O 12 (where x = 0 to 1) single crystal by the Czyochralski method using high-frequency induction heating, solid-liquid crystal growth a step of having a small crystal rotation speed that makes the interface shape convex with respect to the melt and keeps the cross-sectional shape of the crystal outer shape approximately circular;
Bi 4 (Ge x Si 1-x ) 3 O 12
How to grow single crystals. 2. The relative rising speed of the crucible is 80 to 100 % of the falling speed of the surface of the melt. Cultivation method.
JP57122009A 1982-07-15 1982-07-15 Growing method of bi4(ge, si)3o12 single crystal Granted JPS5913692A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57122009A JPS5913692A (en) 1982-07-15 1982-07-15 Growing method of bi4(ge, si)3o12 single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57122009A JPS5913692A (en) 1982-07-15 1982-07-15 Growing method of bi4(ge, si)3o12 single crystal

Publications (2)

Publication Number Publication Date
JPS5913692A JPS5913692A (en) 1984-01-24
JPH032838B2 true JPH032838B2 (en) 1991-01-17

Family

ID=14825303

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57122009A Granted JPS5913692A (en) 1982-07-15 1982-07-15 Growing method of bi4(ge, si)3o12 single crystal

Country Status (1)

Country Link
JP (1) JPS5913692A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02199374A (en) * 1989-01-30 1990-08-07 Eagle Ind Co Ltd Characteristic change measuring method and measuring device for mechanical seal

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944213B2 (en) * 1977-08-15 1984-10-27 松下電工株式会社 Manufacturing method of flexible tube
JPS54152683A (en) * 1978-05-23 1979-12-01 Sumitomo Electric Ind Ltd Growing method for single crystal
JPS5560093A (en) * 1978-10-25 1980-05-06 Toshiba Corp Production of single crystal

Also Published As

Publication number Publication date
JPS5913692A (en) 1984-01-24

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