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JPH0534318B2 - - Google Patents
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JPH0534318B2 - - Google Patents

Info

Publication number
JPH0534318B2
JPH0534318B2 JP58181214A JP18121483A JPH0534318B2 JP H0534318 B2 JPH0534318 B2 JP H0534318B2 JP 58181214 A JP58181214 A JP 58181214A JP 18121483 A JP18121483 A JP 18121483A JP H0534318 B2 JPH0534318 B2 JP H0534318B2
Authority
JP
Japan
Prior art keywords
crystal
diameter
section
seed crystal
floating zone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58181214A
Other languages
Japanese (ja)
Other versions
JPS6071589A (en
Inventor
Kuniharu Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Canon Machinery Inc
Original Assignee
Seiko Epson Corp
Nichiden Machinery Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Nichiden Machinery Ltd filed Critical Seiko Epson Corp
Priority to JP18121483A priority Critical patent/JPS6071589A/en
Publication of JPS6071589A publication Critical patent/JPS6071589A/en
Publication of JPH0534318B2 publication Critical patent/JPH0534318B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/28Controlling or regulating

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】 本発明はFZ法における、新規な単結晶の製造
方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a novel single crystal manufacturing method using the FZ method.

本発明の目的は結晶の育処を安定して行なうこ
とにより、良質な単結晶を得ることである。
An object of the present invention is to obtain high-quality single crystals by stably growing crystals.

本発明の他の目的は装置の自動化を促進し、安
価な単結晶を得ることである。
Another object of the invention is to facilitate automation of the apparatus and to obtain inexpensive single crystals.

従来メルト法による単結晶製造方法として、ベ
ルヌーイ法及び引き上げ法が知られている。しか
しベルヌーイ法は水素ガスを使用する為安全上問
題があり、引き上げ法は高価なルツボを必要と
し、汚染の心配がある等の問題点を有している。
Conventionally, the Bernoulli method and the pulling method are known as single crystal manufacturing methods using the melt method. However, the Bernoulli method has safety problems because it uses hydrogen gas, and the pulling method requires an expensive crucible and has problems such as concerns about contamination.

そこで、ルツボが不要で汚染の心配がなく、危
険なガスを使用する必要のないFZ法が注目を集
めている。
Therefore, the FZ method is attracting attention because it does not require a crucible, there is no need to worry about contamination, and it does not require the use of dangerous gases.

第1図にFZ法の概要を示す。 Figure 1 shows an overview of the FZ method.

ここで1は回転楕円面鏡、2はハロゲンラン
プ、3は石英管、4はガス導入口、5はガス排出
口、6は原料棒、7は種結晶、8は溶融帯、9は
上部シヤフト、10は下部シヤフトである。
Here, 1 is a spheroidal mirror, 2 is a halogen lamp, 3 is a quartz tube, 4 is a gas inlet, 5 is a gas outlet, 6 is a raw material rod, 7 is a seed crystal, 8 is a molten zone, and 9 is an upper shaft , 10 is a lower shaft.

上部シヤフト9に、原料棒6をセツトし、下部
シヤフト10に、種結晶7をセツトする。
A raw material rod 6 is set on the upper shaft 9, and a seed crystal 7 is set on the lower shaft 10.

ハロゲンランプ2のパワーを上げ、回転楕円面
鏡1により該ハロゲンランプの光を、石英管3の
中央部に集光する。この時、同時にガス導入口4
から雰囲気ガスを導入し、ガス排出口5から雰囲
気ガスを排出する。なお雰囲気ガスとしては、通
常、空気が使用されるが、材質に応じて、アルゴ
ン、窒素、一酸化炭素、二酸化炭素、水等等が使
用される。
The power of the halogen lamp 2 is increased, and the spheroidal mirror 1 focuses the light from the halogen lamp onto the center of the quartz tube 3. At this time, the gas inlet 4
Atmospheric gas is introduced from the gas outlet port 5, and the atmospheric gas is exhausted from the gas outlet port 5. Note that air is normally used as the atmospheric gas, but argon, nitrogen, carbon monoxide, carbon dioxide, water, etc. may be used depending on the material.

集光部において、原料棒6の先端と種結晶7の
先端とを溶融接触させて、溶融帯8を形成する。
この時上部シヤフト9及び下部シヤフト10は、
同方向ないしは逆方向に回転させ、上下のシヤフ
トが同時に移動することにより結晶が育成され
る。
In the light condensing section, the tip of the raw material rod 6 and the tip of the seed crystal 7 are brought into molten contact to form a molten zone 8.
At this time, the upper shaft 9 and the lower shaft 10 are
Crystals are grown by rotating in the same or opposite directions and moving the upper and lower shafts simultaneously.

かかるFZ法における結晶育成では、これまで
結晶径を一定に保つための制御は行なわれておら
ず、専ら溶融帯の状況を目視で観察しながらラン
プパワーの制御、あるいは溶融帯の高さを調節し
ていた。
Until now, in crystal growth using the FZ method, there has been no control to maintain a constant crystal diameter, and the only method has been to control the lamp power or adjust the height of the molten zone while visually observing the state of the molten zone. Was.

この為結晶外径が変動し、極端な場合には融液
のタレ、あるいは溶融帯での破断が生じて良質な
単結晶が得られなかつた。
As a result, the outer diameter of the crystal fluctuates, and in extreme cases, the melt sag or breakage occurs in the molten zone, making it impossible to obtain a high-quality single crystal.

又、1人の人が監視できる装置台数も限定さ
れ、結晶の価格も高価なものとなつていた。
Furthermore, the number of devices that one person can monitor is limited, and the cost of crystals has become expensive.

本発明はかかる欠点を除去するもので、種結晶
をセツトしたシヤフトから回転同期信号を取り出
し、結晶の所定部分の直径を光学的検出法を用い
て測定し、これを融液の温度あるいは融液の高さ
にフイードバツクすることにより極めて結晶外径
の安定した単結晶が得られた。
The present invention aims to eliminate such drawbacks by extracting a rotation synchronization signal from a shaft on which a seed crystal is set, measuring the diameter of a predetermined portion of the crystal using an optical detection method, and determining the temperature of the melt or the diameter of a predetermined portion of the crystal. By feedback to the height of , a single crystal with an extremely stable outer diameter was obtained.

以下実施例により本発明について更に詳しく説
明する。
The present invention will be explained in more detail below with reference to Examples.

実施例 1 第2図に本発明に基づくシステムのブロツク図
を示す。
Embodiment 1 FIG. 2 shows a block diagram of a system based on the present invention.

ここで21は光学系、22はカメラ部、23は
タイミング部、24はキー入力部、25はコント
ローラー部、26はDA変換器、27はAD変換
器、28は表示部、29はプリンター部、30は
ランプパワーコントロール部、31はギヤツプ調
整部である。
Here, 21 is an optical system, 22 is a camera section, 23 is a timing section, 24 is a key input section, 25 is a controller section, 26 is a DA converter, 27 is an AD converter, 28 is a display section, 29 is a printer section, 30 is a lamp power control section, and 31 is a gap adjustment section.

カメラ部22はラインセンサあるいはビデオカ
メラのいずれも使用可能であるが、高解像度を必
要とする場合にはラインセンサを使用する。
Although a line sensor or a video camera can be used as the camera section 22, a line sensor is used when high resolution is required.

コントローラー部25はタイミング部23の信
号を得た時のみカメラ部22からの像の処理を行
なう。これは第3図に示す如く、結晶の断面は真
円ではなく、殆んど楕円形状となる為、下部シヤ
フト10から回転同期信号を取り出し、結晶の所
定部分の直径を測定する。
The controller section 25 processes the image from the camera section 22 only when it receives the signal from the timing section 23. This is because, as shown in FIG. 3, the cross section of the crystal is not a perfect circle but almost an ellipse, so a rotation synchronization signal is extracted from the lower shaft 10 and the diameter of a predetermined portion of the crystal is measured.

コントローラー部25で処理された信号はDA
変換器26を経て、ランプパワーコントロール部
30でランプパワーを調節し、融液の温度を制御
する。あるいはギヤツプ調整31でギヤツプ調整
を行ない融液の高さを調節する。
The signal processed by the controller section 25 is DA
After passing through the converter 26, a lamp power control unit 30 adjusts the lamp power and controls the temperature of the melt. Alternatively, the gap adjustment 31 is used to perform gap adjustment to adjust the height of the melt.

なおランプパワー及びギヤツプはAD変換器2
7を経てコントローラー25に再度フイードバツ
クされる。
Note that the lamp power and gap are determined by AD converter 2.
7, the feedback is sent back to the controller 25 again.

一方キー入力部24では初期の各種定数をイン
プツトし、表示部28はその時のランプパワー等
を表示する。更にプリンター部29は所定の時間
毎にPIDの各種定数、その時の結晶径等をプリン
トアウトする。
On the other hand, the key input section 24 inputs various initial constants, and the display section 28 displays the lamp power and the like at that time. Further, the printer section 29 prints out various constants of the PID, the crystal diameter at that time, etc. at predetermined intervals.

第4図に結晶径測定の様子を示す。 Figure 4 shows how the crystal diameter was measured.

ここで41は原料棒、42は育成結晶、43は
溶融帯である。今、結晶径測定部をA−A′とす
る。(固液界面の上0.5〜5ミリメートルの部位を
選定。)すると従来目視では結晶径の制御精度が
10ミリメートル±0.5ミリメートル前後であつた
ものが、±0.05ミリメートル以内に制御され、同
時に融液のタレ、溶融帯での破断が防止でき、極
めて安定な結晶育成が可能となつた。
Here, 41 is a raw material rod, 42 is a grown crystal, and 43 is a molten zone. Now, let the crystal diameter measurement part be A-A'. (Select a location 0.5 to 5 mm above the solid-liquid interface.) Then, conventional visual inspection would not be able to control the crystal diameter accurately.
What used to be around 10 mm ±0.5 mm was controlled to within ±0.05 mm, and at the same time, it was possible to prevent melt dripping and breakage in the molten zone, making it possible to grow extremely stable crystals.

しかも結晶径が変動すると、色ムラや気泡を生
じ易くなる為品質的に問題であつたが、かかる欠
点も除去され、極めて良質な単結晶が得られた。
Moreover, when the crystal diameter varied, color unevenness and bubbles were likely to occur, which was a problem in terms of quality, but these defects were eliminated and a single crystal of extremely high quality was obtained.

更に従来目視による監視では3〜5台がやつと
であつたが、本発明によれば2.0〜30台を同時に
監視することが可能となり、単結晶の低価格化に
大きく貢献した。
Furthermore, conventional visual monitoring required only 3 to 5 units, but the present invention makes it possible to monitor 2.0 to 30 units at the same time, greatly contributing to lowering the price of single crystals.

以上詳述した如く本発明によれば、ルビー、サ
フアイア、アレキサンドライト等の宝石用単結晶
は勿論、YIG,YAG,GGG等の工業用単結晶に
も応用でき、良質で安価な単結晶を供給するもの
である。
As detailed above, the present invention can be applied not only to gemstone single crystals such as ruby, sapphire, and alexandrite, but also to industrial single crystals such as YIG, YAG, and GGG, and provides high-quality and inexpensive single crystals. It is something.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はFZ法の概要を示す図である。第2図
は本発明に基づく製造システムのブロツク図を示
す。第3図は結晶の断面を示す図である。第4図
は本発明による結晶径測定の様子を示す図であ
る。
FIG. 1 is a diagram showing an outline of the FZ method. FIG. 2 shows a block diagram of a manufacturing system according to the invention. FIG. 3 is a diagram showing a cross section of the crystal. FIG. 4 is a diagram showing how the crystal diameter is measured according to the present invention.

Claims (1)

【特許請求の範囲】[Claims] 1 ハロゲンランプ等の高温の光源から発する光
を反射鏡またはレンズを用いて集光し、該集光部
において、原料棒と種結晶とを溶融帯を仲介とし
て結合してフローテイングゾーンを形成し、該フ
ローテイングゾーンを一定速度で移動することに
より、前記種結晶上に結晶を析出させるフローテ
イングゾーン法(以下FZ法と略記)において、
種結晶をセツトしたシヤフトから回転同期信号を
取り出し、結晶の所定部分の直径を光学的検出法
を用いて測定し、これを融液の温度、あるいは融
液の高さにフイードバツクすることにより、育成
結晶の直径を制御することを特徴とする単結晶の
製造方法。
1. Light emitted from a high-temperature light source such as a halogen lamp is focused using a reflecting mirror or lens, and in the focusing section, a raw material rod and a seed crystal are combined via a molten zone to form a floating zone. In a floating zone method (hereinafter abbreviated as FZ method) in which crystals are deposited on the seed crystal by moving the floating zone at a constant speed,
A rotation synchronization signal is extracted from the shaft on which the seed crystal is set, the diameter of a predetermined portion of the crystal is measured using an optical detection method, and this is fed back to the temperature or height of the melt to grow the crystal. A method for producing a single crystal, characterized by controlling the diameter of the crystal.
JP18121483A 1983-09-29 1983-09-29 Single crystal manufacturing method Granted JPS6071589A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18121483A JPS6071589A (en) 1983-09-29 1983-09-29 Single crystal manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18121483A JPS6071589A (en) 1983-09-29 1983-09-29 Single crystal manufacturing method

Publications (2)

Publication Number Publication Date
JPS6071589A JPS6071589A (en) 1985-04-23
JPH0534318B2 true JPH0534318B2 (en) 1993-05-21

Family

ID=16096818

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18121483A Granted JPS6071589A (en) 1983-09-29 1983-09-29 Single crystal manufacturing method

Country Status (1)

Country Link
JP (1) JPS6071589A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5729569B2 (en) * 2010-03-31 2015-06-03 国立研究開発法人産業技術総合研究所 Method for producing metal compound crystal and method for producing decorative article

Also Published As

Publication number Publication date
JPS6071589A (en) 1985-04-23

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