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JPH0568550B2 - - Google Patents
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JPH0568550B2 - - Google Patents

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Publication number
JPH0568550B2
JPH0568550B2 JP60082387A JP8238785A JPH0568550B2 JP H0568550 B2 JPH0568550 B2 JP H0568550B2 JP 60082387 A JP60082387 A JP 60082387A JP 8238785 A JP8238785 A JP 8238785A JP H0568550 B2 JPH0568550 B2 JP H0568550B2
Authority
JP
Japan
Prior art keywords
chemical
solution
copper plating
circulation
chemical copper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP60082387A
Other languages
Japanese (ja)
Other versions
JPS61243181A (en
Inventor
Hiroshi Kikuchi
Isamu Tanaka
Hitoshi Oka
Shusaku Izumi
Yukihiro Taniguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8238785A priority Critical patent/JPS61243181A/en
Publication of JPS61243181A publication Critical patent/JPS61243181A/en
Publication of JPH0568550B2 publication Critical patent/JPH0568550B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1675Process conditions
    • C23C18/1683Control of electrolyte composition, e.g. measurement, adjustment
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1617Purification and regeneration of coating baths

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electrochemistry (AREA)
  • Chemically Coating (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、析出金属自体がめつき反応の触媒と
して働く自己触媒反応によつて、金属銅を析出さ
せる無電解銅めつき(化学銅めつき)装置に係
り、特に光沢のある機械的性質の優れた良質の化
学銅めつきを安定して得るために好適な薬液補給
構造を有する化学銅めつき装置に関するものであ
る。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to electroless copper plating (chemical copper plating) in which metallic copper is deposited by an autocatalytic reaction in which the deposited metal itself acts as a catalyst for the plating reaction. In particular, the present invention relates to a chemical copper plating apparatus having a suitable chemical supply structure for stably obtaining high-quality chemical copper plating with gloss and excellent mechanical properties.

〔発明の背景〕[Background of the invention]

印刷回路基板のスルーホール(Through
Hole)や導体配線パターン(Pattern)形成に化
学銅めつき法を用いる、いわゆるアデイテイブプ
ロセス(Additive Process)は、電子工業分野
において周知の方法として工業的に大規模に使用
されている。ここで用いられている化学銅めつき
液は、一般に2価銅イオン、銅イオンの錯化剤、
銅イオンの還元剤およびアルカリ金属の水酸化物
を必須成分として含んでいるものであり、めつき
反応で消費される成分を補給しながら化学銅めつ
きを行なうのが一般的な使用方法である。すなわ
ち、化学銅めつき液中の必須成分濃度を常に一定
値に管理することにより数μm以上の厚めつきを
施すものである。このめつき液中の必須成分の濃
度管理については従来から種々の方法が提案され
ており、その一例が特開昭54−143734ならびに特
開昭56−120943に開示されている。
Through holes in printed circuit boards
The so-called additive process, which uses a chemical copper plating method to form holes and conductor wiring patterns, is a well-known method in the electronics industry and is used on a large scale industrially. The chemical copper plating solution used here generally contains divalent copper ions, copper ion complexing agents,
It contains a copper ion reducing agent and an alkali metal hydroxide as essential components, and the common method of use is to perform chemical copper plating while replenishing the components consumed in the plating reaction. . That is, by always controlling the concentration of essential components in the chemical copper plating solution to a constant value, plating of several μm or more is achieved. Various methods have been proposed for controlling the concentration of essential components in the plating solution, examples of which are disclosed in JP-A-54-143734 and JP-A-56-120943.

しかし、これらの方法は、めつき液の必須成分
濃度を所定の値に保つために、単に薬液の補給を
行ない濃度管理するだけであつて、補給する薬液
成分の溶解ならびに混合を十分に行なつて、たえ
ず均一な成分濃度のもとで光沢のある良質のめつ
きを安して施すという配慮ならびに認識は全然な
されていなかつた。すなわち、化学銅めつき液へ
の薬液補給成分は、少なくとも2価銅(Cu2+
イオン塩の水溶液、Cu2+イオンの還元剤、アル
カリ金属の水酸化物を含む水溶液であるが、これ
らの濃度の高い薬液成分をめつき液に補給する
と、めつき液への補給部分では、めつき液中の平
均した成分濃度よりも濃度が大となるために、め
つき液が不安定となり、これが化学めつき反応に
著しい悪影響を与え安定した良質のめつきを施す
ことができなくなるので、このような問題が生じ
ない薬液成分の補給方法ならびに補給構造を持つ
化学銅めつき装置の開発が強く望まれていた。
However, these methods simply replenish the chemical solution and control the concentration in order to maintain the concentration of the essential components of the plating solution at a predetermined value. Therefore, no consideration or recognition was given to the ability to provide a glossy, high-quality plating at a low cost under constant, uniform component concentrations. In other words, the chemical replenishment component for the chemical copper plating solution contains at least divalent copper (Cu 2+ ).
This is an aqueous solution containing an ionic salt aqueous solution, a Cu 2+ ion reducing agent, and an alkali metal hydroxide, but when these highly concentrated chemical components are replenished into the plating solution, Because the concentration of the components is higher than the average concentration in the plating solution, the plating solution becomes unstable, which has a significant negative effect on the chemical plating reaction and makes it impossible to provide stable, high-quality plating. There has been a strong desire to develop a method for replenishing chemical components that does not cause such problems, and a chemical copper plating apparatus having a replenishment structure.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、上述した従来技術の問題点を
解消し、化学銅めつき液に必須成分を含む濃度の
高い薬液成分を補給する場合において、めつき液
と十分に混合、溶解して均一な成分濃度のめつき
液となし、めつき液の安定性を損なわない薬液補
給構造を持つ化学銅めつき装置を提供することに
ある。
The purpose of the present invention is to solve the above-mentioned problems of the prior art, and when replenishing a chemical copper plating solution with a highly concentrated chemical component containing essential components, it is possible to sufficiently mix and dissolve the chemical components in the plating solution to ensure uniformity. To provide a chemical copper plating apparatus which produces a plating solution with a high component concentration and has a chemical solution supply structure that does not impair the stability of the plating solution.

〔発明の概要〕[Summary of the invention]

本発明者らは、化学銅めつき操作において、め
つき反応によつて消費された成分の不足分を補給
するためには、通常、その不足した成分を含む農
厚な薬液を補給するが、補給した薬液が十分にめ
つき液に溶解、拡散し均一な濃度のめつき液にな
らないと、化学めつきが著しく不安定となり、本
来の自己触媒的なめつき反応以外によつても銅が
析出してしまうことを知つた。すなわち、補給す
る薬液と化学銅めつき液との成分濃度の違いによ
つて、めつき槽壁面、配管の機器内および配管内
面に銅が析出することや、プリント回路基板にめ
つきを施す場合には、目的とするスルーホール部
や導体配線パターン部以外の絶縁材料上にも銅が
析出して、回路間を短絡するなど極めて好ましく
ない現象が発生する。
The present inventors have discovered that in chemical copper plating operations, in order to replenish the missing components consumed by the plating reaction, a rich chemical solution containing the missing components is usually replenished. If the replenished chemical solution is not sufficiently dissolved and diffused into the plating solution to form a plating solution with a uniform concentration, chemical plating will become extremely unstable, and copper will precipitate due to processes other than the original autocatalytic plating reaction. I learned that I would do it. In other words, due to the difference in component concentration between the replenishing chemical solution and the chemical copper plating solution, copper may be deposited on the walls of the plating tank, inside piping equipment, and on the inside of the piping, and when plating printed circuit boards. In this case, extremely undesirable phenomena such as copper depositing on the insulating material other than the intended through-hole portions and conductor wiring pattern portions occur, such as short circuits between circuits.

そして本発明者らは、化学銅めつき液は上述し
たごとくアルカリ金属の水酸化物を多量に含む強
アルカリ性の溶液であり、これにCu2+イオンの
補給薬液、例えば硫酸銅溶液を加えると瞬間的に
銅水酸化物の沈澱が生成する。この沈澱は、化学
銅めつき液中に過剰のCu2+イオンの錯価剤を含
むために十分な時間をかけ平衡に達するまで放置
すればすべて溶解するが、しかし生産ラインにお
ける化学銅めつき操作においては、めつき液の濃
度管理に遅れが生じるので十分な時間をかけるこ
とはできない。したがつて、沈澱した銅水酸化物
が未溶解のままめつき操作を行なうと、この沈澱
がプリント回路基板の導体配線パターン部以外の
絶縁材料上に吸着されてめつきの核となり不要な
銅めつきが形成されてしまうという問題が発生す
る。この問題は、Cu2+イオンの還元剤であるホ
ルムアルデヒドあるいはアルカリ金属の水酸化物
の補給においても同様であり、Cu2+イオンの補
給の場合とは異なり銅水酸化物の沈澱を生成する
ことはないが、濃厚な補給液が未分散のままめつ
き槽内のめつき反応部分に達したり、あるいは、
上述のCu2+イオンの水酸化物と接触することに
よつて化学銅めつきの安定性を著しく低下させて
しまうことを知り、それらの問題の解決方法を
種々探策した結果本発明を完成するに至つた。
The present inventors discovered that the chemical copper plating solution is, as mentioned above, a strongly alkaline solution containing a large amount of alkali metal hydroxide, and that by adding a replenishing chemical solution for Cu 2+ ions, such as a copper sulfate solution, Copper hydroxide precipitates form instantaneously. This precipitate will completely dissolve if the chemical copper plating solution contains excess Cu 2+ ion complexing agent and is allowed to reach equilibrium for a sufficient period of time, but chemical copper plating on the production line During the operation, sufficient time cannot be taken because there is a delay in controlling the concentration of the plating solution. Therefore, if the plating operation is performed while the precipitated copper hydroxide remains undissolved, this precipitate will be adsorbed onto the insulating material other than the conductor wiring pattern of the printed circuit board, becoming the nucleus of plating and removing unnecessary copper plating. A problem arises in that a bond is formed. This problem is the same when replenishing formaldehyde, which is a reducing agent for Cu 2+ ions, or alkali metal hydroxide, and unlike when replenishing Cu 2+ ions, copper hydroxide precipitates are generated. However, if the concentrated replenishment solution reaches the plating reaction part in the plating tank without being dispersed, or
It was discovered that the stability of chemical copper plating is significantly reduced by contact with the hydroxide of Cu 2+ ions mentioned above, and as a result of exploring various ways to solve these problems, the present invention was completed. It came to this.

本発明は、例えば第1図に示すように、化学銅
めつき液2の一部を循環ポンプ3,3′,3″を介
して化学銅めつき槽1に還流するめつき液の循環
流路を設け、循環ポンプ3,3′,3″の上流に補
給薬液6,7,8の注入口を設けることによつ
て、循環ポンプ3,3′,3″の機械的回転力を利
用して、補給薬液6,7,8を機械的に強制撹拌
することを第1の特徴とするものであつて、この
ような薬液補給方式による補給構造を有する化学
銅めつき装置を用いることによつて、濃厚な補給
薬液を瞬時に混合、分散して化学銅めつき液との
接触を大とすることができ、補給する薬液成分の
速やかな溶解、拡散を可能とするものである。
For example, as shown in FIG. 1, the present invention provides a plating solution circulation flow path in which a part of the chemical copper plating solution 2 is returned to the chemical copper plating tank 1 via circulation pumps 3, 3', 3''. By providing inlets for the replenishment chemicals 6, 7, 8 upstream of the circulation pumps 3, 3', 3'', the mechanical rotational force of the circulation pumps 3, 3', 3'' is utilized. By using a chemical copper plating apparatus having a replenishment structure based on such a chemical replenishment method, the first feature is that the replenishment chemical solutions 6, 7, and 8 are forcibly stirred mechanically. , it is possible to instantly mix and disperse the concentrated replenishment chemical solution to increase contact with the chemical copper plating solution, and it is possible to quickly dissolve and diffuse the replenishment chemical components.

さらに、本発明の第2の特徴は、例えば上記第
1図に示すごとく、めつき液の循環ポンプを有す
る循環流路を複数経路設け、補給薬液6,7,8
の注入口を、それぞれ異なる循環流路にそれぞれ
個別に設けることであつて、このような構造にす
ることによつて循環流路内での高濃度の補給薬液
の相互接触をさけ、化学銅めつき液の安定性をさ
らに向上させることができるものである。
Furthermore, the second feature of the present invention is that, as shown in FIG.
By providing the injection ports for each of the different circulation channels individually, this structure prevents high concentration replenishment chemicals from coming into contact with each other in the circulation channels, and prevents chemical copper metallization. This makes it possible to further improve the stability of the soaking liquid.

そして、本発明の好ましい薬液の補給構造は、
循環流路に設けられた循環ポンプの上流側に補給
する薬液の注入口を設けるものであり、薬液の注
入口は循環ポンプに可及的に近接させることが好
ましい。また、薬液注入口はめつき液の循環流路
の配管内で、流体力学的に流速の大なる化学銅め
つき液中に補給液が注入される構造であることが
好ましい。
A preferable drug solution supply structure of the present invention is as follows:
An inlet for replenishing the chemical liquid is provided upstream of the circulation pump provided in the circulation flow path, and it is preferable that the inlet for the chemical liquid be placed as close to the circulation pump as possible. Further, it is preferable that the chemical solution inlet has a structure in which the replenishment solution is injected into the chemical copper plating solution having a high flow rate hydrodynamically within the piping of the plating solution circulation channel.

また、本発明においては、特別に補給薬液の撹
拌設備を設ける必要がなく、化学めつき液の循環
流路を利用することだけで本発明の目的を達成す
ることもできる。
Further, in the present invention, there is no need to provide special stirring equipment for the replenishment chemical solution, and the object of the present invention can be achieved simply by utilizing the circulation channel for the chemical plating solution.

〔発明の実施例〕[Embodiments of the invention]

以下に本発明の実施例ならびに従来技術である
比較例を挙げ、本発明の特徴をさらに詳細に説明
する。なお、本発明の実施例ならびに従来技術に
よる比較例において共通する実験条件は次のとお
りである。
Examples of the present invention and comparative examples of the prior art will be given below to explain the features of the present invention in more detail. The experimental conditions common to the examples of the present invention and the comparative examples according to the prior art are as follows.

化学銅めつき槽にはポリプロピレンを用い、50
の化学銅めつき液を70℃に加熱して試験した。
めつき液には、めつき負荷1dm2/のプリント
回路基板を浸漬して15時間のめつき操作を行なつ
た。めつき液の循環ポンプは15/分の流量を有
するマグネツトポンプを用いた。使用した化学銅
めつき液および補給薬液の組成は次のとおりであ
る。
Polypropylene is used for the chemical copper plating bath, and 50
A chemical copper plating solution was heated to 70°C and tested.
A printed circuit board with a plating load of 1 dm 2 / was immersed in the plating solution, and a plating operation was performed for 15 hours. A magnetic pump with a flow rate of 15/min was used as a circulation pump for the plating solution. The compositions of the chemical copper plating solution and replenishment chemical solution used are as follows.

化学銅めつき液 CuSO4・5H2O 12g EDTA−2Na(エチレンジアミン四酢酸塩) 42g NaOH PH12.3とする量 37%ホルマリン 3ml α,α′−ジピリジル 30ml ポリエチレングリコールステアリルアミン 100ml 水 1とする量 Cu2+イオンの補給薬液 CuSO4・5H2O 200g 水 1とする量 OH-イオンの補給薬液 NaOH 200g 水 1とする量 ホルマリンの補給薬液 37%ホルマリン 500ml 水 1とする量 本発明の実施例ならびに従来技術による比較例
において用いた実験用のプリント回路基板は、両
面銅張り積層板に穴あけして、穴の内面に触媒処
理を施した後、周知の方法であるテンテイング法
によつて回路を形成した。
Chemical copper plating solution CuSO 4・5H 2 O 12g EDTA-2Na (ethylenediaminetetraacetate) 42g NaOH Amount to make PH12.3 37% formalin 3ml α,α′-dipyridyl 30ml Polyethylene glycol stearylamine 100ml Water Amount to make 1 Cu 2+ ion replenishment solution CuSO 4・5H 2 O 200g Water 1 amount OH - ion replenishment solution NaOH 200g Water 1 amount Formalin replenishment solution 37% Formalin 500ml Water 1 amount Examples of the present invention In addition, the experimental printed circuit board used in the comparative example using the conventional technology was made by drilling holes in a double-sided copper-clad laminate, applying catalyst treatment to the inner surface of the hole, and then forming a circuit using the well-known tenting method. Formed.

実施例 1 第1図は本発明の一実施例である化学銅めつき
装置の構成を示す説明図で、化学銅めつき槽1に
は3系統の循環路を設け、それぞれに循環ポンプ
3,3′,3″、およびフイルタ4,4′,4″が設
けられていて、化学銅めつき液2は循環されめつ
き槽1に還流される。
Embodiment 1 FIG. 1 is an explanatory diagram showing the configuration of a chemical copper plating apparatus which is an embodiment of the present invention.A chemical copper plating tank 1 is provided with three circulation paths, each of which is equipped with a circulation pump 3, 3', 3'' and filters 4, 4', 4'' are provided, and the chemical copper plating solution 2 is circulated and returned to the plating tank 1.

化学銅めつき液2の循環流路の一つには熱交換
器5を設けてめつき液2を加熱する。めつき反応
によつて消費されためつき液2の成分は、Cu2+
イオンの補給薬液6である硫黄銅、OH-イオン
の補給薬液7である水酸化ナトリウムおよび還元
剤であるホルマリンの補給薬液8は、それぞれの
補給薬液タンクより薬液補給ポンプ9,9′,
9″を介してめつき液2の循環流路に注入される。
本発明の特徴の一つは、補給薬液の注入口をそれ
ぞれのめつき液2の循環流路における循環ポンプ
3,3′,3″の上流に設けたことであり、注入さ
れた高濃度の補給薬液6,7,8が循環ポンプ
3,3′,3″の機械的撹拌によつて速やかに混合
され溶解される構造になつていることである。
A heat exchanger 5 is provided in one of the circulation channels for the chemical copper plating solution 2 to heat the plating solution 2. The components of the plating liquid 2 consumed by the plating reaction are Cu 2+
Copper sulfur which is a replenishment chemical solution 6 for ions, sodium hydroxide which is a replenishment chemical solution 7 for OH - ions, and a replenishment chemical solution 8 consisting of formalin which is a reducing agent are supplied from respective replenishment chemical tanks to chemical replenishment pumps 9, 9',
9'' into the circulation channel of the plating liquid 2.
One of the features of the present invention is that the inlet for the replenishment chemical solution is provided upstream of the circulation pumps 3, 3', 3'' in the circulation flow path of each plating solution 2, so that the injected high concentration The structure is such that the replenishing chemical solutions 6, 7, and 8 are rapidly mixed and dissolved by mechanical stirring of the circulation pumps 3, 3', and 3''.

本実施例における化学銅めつき液自動管理装置
10は、薬液ポンプ9,9′,9″の駆動を自動化
するために、化学銅めつき液2中のCu2+イオン、
PH、ホルマリ濃度を自動的に検出し、不足しため
つき液2の成分を、薬液補給ポンプ9,9′,
9″の駆動信号として出力する機能を有するもの
であればいかなる種類あるいは形式のものであつ
てもよく、また、このような機能を人的に代行さ
せることも可能である。
The chemical copper plating liquid automatic management device 10 in this embodiment uses Cu 2+ ions in the chemical copper plating liquid 2,
The pH and formal concentration are automatically detected, and the components of the depleted pampering liquid 2 are supplied to the chemical replenishment pumps 9, 9',
It may be of any type or format as long as it has the function of outputting a 9'' drive signal, and it is also possible to have such a function performed manually.

本実施例における化学銅めつき装置によつて、
プリント回路基板に化学銅めつきを施した結果、
めつき槽1、配管、フイルタ4,4′,4″、循環
ポンプ3,3′,3″にはもちろんのこと、プリン
ト回路基板の回路間にも不要な銅の析出は全く認
められなかつた。そして、析出した銅被膜は金属
光沢を有する機械的性質の良好なものであつて、
本発明による効果が著しく優れていることを確認
した。
By the chemical copper plating apparatus in this example,
As a result of chemical copper plating on printed circuit boards,
No unnecessary copper deposits were observed in the plating bath 1, piping, filters 4, 4', 4'', circulation pumps 3, 3', 3'', or between the circuits on the printed circuit board. . The deposited copper coating has metallic luster and good mechanical properties,
It was confirmed that the effects of the present invention were significantly superior.

実施例 2 本実施例においては、本発明の効果をより簡単
な化学銅めつき装置で得られた場合の一例を示す
ものであつて、その化学銅めつき装置の構成を第
2図に示す。この実施例では、化学銅めつき液2
の循環流路を2経路とすることによつて、循環ポ
ンプ3,3′の使用台数を減らすことができる一
例である。2経路の化学銅めつき液2の循環流路
において、一方の流路の循環ポンプ3の上流に
Cu2+イオンの補給薬液6を注入し、他方の流路
の循環ポンプ3′の上流にOH-イオンの補給薬液
7を注入するが、残るホルマリンの補給薬液8
は、循環ポンプ3′の下流に注入する方式である。
この場合に、Cu2+イオンおよびOH-イオンはそ
れぞれの循環ポンプ3,3′によつて十分に化学
銅めつき液2に混合撹拌されてしまうので、ホル
マリンの補給薬液8によつて化学銅めつき液の安
全性が損なわれることはなかつた。
Example 2 This example shows an example in which the effects of the present invention can be obtained with a simpler chemical copper plating apparatus, and the configuration of the chemical copper plating apparatus is shown in FIG. . In this example, chemical copper plating solution 2
This is an example in which the number of circulation pumps 3, 3' can be reduced by providing two circulation channels. In the two-path chemical copper plating solution 2 circulation flow path, there is a pump upstream of the circulation pump 3 in one flow path.
A replenishing chemical solution 6 for Cu 2+ ions is injected, and a replenishing chemical solution 7 for OH - ions is injected upstream of the circulation pump 3' in the other channel, but the replenishing chemical solution 8 for formalin remains.
This is a method in which the water is injected downstream of the circulation pump 3'.
In this case, Cu 2+ ions and OH - ions are sufficiently mixed and stirred into the chemical copper plating solution 2 by the respective circulation pumps 3 and 3', so that the chemical copper plating solution 8 is mixed with the formalin replenishment chemical solution 8. The safety of the plating solution was not compromised.

本実施例においても、上記実施例1と同様に、
プリント回路基板上に不要な銅の析出は全く認め
られなかつた。そして、本発明による効果を得る
ためには、少なくとも3成分の補給薬液の注入位
置を分離すべきであること、さらに、少なくとも
2成分の補給薬液はそれぞれの循環ポンプで強制
的に撹拌して溶解させる必要があることを確認し
た。
In this example, as well as in Example 1 above,
No unnecessary copper deposits were observed on the printed circuit board. In order to obtain the effects of the present invention, the injection positions of at least three component replenishment chemicals should be separated, and at least two component replenishment chemicals should be forcibly stirred and dissolved by their respective circulation pumps. I confirmed that it was necessary to do so.

実施例 3 本実施例においては、第3図に示すごとく、本
発明による化学銅めつき装置において補給薬液の
循環ポンプによる強制撹拌機能を強化した場合の
一例であつて、3経路のめつき液循環流路のう
ち、2経路には補給薬液を強制混合する撹拌ポン
プ11,11′を備え、実施例1で示した本発明
の化学銅めつき装置よりもさらに混合、溶解能力
を増加させたケースである。本実施例におけるめ
つき装置を用いて化学銅めつきを行なつた結果、
上述の実施例1および2と同様にプリント回路間
には銅の析出は全く認められず、本発明の目的を
十分に達成することができた。さらに注目すべき
ことは、化学銅めつき速度を、通常の2倍以上に
した場合に、めつき液の不足成分の補給薬液量が
2倍以上になるにもかかわらず、プリント回路間
には銅の析出が全く見られなかつた。このよう
に、本発明は特に高速で化学銅めつきを行なう場
合においても、その効果を十分に発揮できること
を確認した。
Example 3 As shown in FIG. 3, this example is an example of a chemical copper plating apparatus according to the present invention in which the forced stirring function of the replenishment chemical solution circulation pump is strengthened, and the plating liquid has three routes. Two of the circulation channels are equipped with stirring pumps 11 and 11' for forcibly mixing replenishment chemicals, and the mixing and dissolving capabilities are further increased than in the chemical copper plating apparatus of the present invention shown in Example 1. It is a case. As a result of chemical copper plating using the plating apparatus in this example,
As in Examples 1 and 2 described above, no copper precipitation was observed between the printed circuits, and the object of the present invention could be fully achieved. What is also noteworthy is that when the chemical copper plating speed is more than twice the normal rate, even though the amount of replenishment chemicals for the missing components of the plating solution is more than doubled, there is still no damage between the printed circuits. No copper precipitation was observed at all. As described above, it has been confirmed that the present invention can sufficiently exhibit its effects even when chemical copper plating is performed particularly at high speed.

比較例 1 従来技術である本比較例においては、第4図に
示すごとく、化学銅めつき液2の循環流路におい
て本発明の薬液補給構造を採用せず、従来一般的
に用いられている薬液補給部であるミキサ12を
使用し、プリント回路基板に化学銅めつきを施し
た場合の一例である。この場合は、3成分の補給
薬液を循環流路の一部に設けたミキサ12に注入
しめつき槽に補給する方式である。このミキサ1
2は単に配管のみの場合もあるし、流体混合用の
スタテイツクミキサを内装して薬液を混合する場
合もあり、本比較例においては後者のミキサ12
を用いた。この化学銅めつき装置を使用してプリ
ント回路基板にめつきを施したところ、回路間や
めつき槽の内壁の一部に銅が析出した。また、析
出した銅の被膜は光沢がなく、粗雑な銅めつき膜
であつた。この原因は上述したごとく、補給薬液
成分の混合不足によるものと考えられる。さらに
高級なミキサ部品を用いても本発明と同等あるい
はそれ以上の混合溶解能力を得ることができない
ことを確認した。
Comparative Example 1 In this comparative example, which is a conventional technique, as shown in FIG. 4, the chemical solution replenishment structure of the present invention was not adopted in the circulation flow path of the chemical copper plating solution 2, but instead the chemical solution replenishment structure of the present invention was used, as shown in FIG. This is an example of chemical copper plating applied to a printed circuit board using the mixer 12, which is a chemical solution replenishing unit. In this case, the three-component replenishment chemical solution is injected into a mixer 12 provided in a part of the circulation flow path, and the replenishment tank is replenished. This mixer 1
2 may simply be a pipe, or may include a static mixer for mixing fluids to mix chemical liquids; in this comparative example, the latter mixer 12 is used.
was used. When this chemical copper plating apparatus was used to plate a printed circuit board, copper was deposited between the circuits and on a part of the inner wall of the plating bath. Further, the deposited copper film lacked luster and was a rough copper plating film. As mentioned above, the cause of this is thought to be insufficient mixing of the replenishment chemical components. It was confirmed that even if higher-grade mixer parts were used, it was not possible to obtain a mixing and dissolving ability equal to or greater than that of the present invention.

比較例 2 本比較例においては、本発明による薬液補給構
造を採用せず、第5図に示すごとく、補給薬液成
分6,7,8を直接に化学銅めつき槽1内に注入
し、めつきを行なつた場合の一例である。この場
合には、プリント回路基板の回路にとどまらず、
めつき槽1の壁面、循環ポンプ3、フイルタ4、
熱交換器5や配管の内部にまで多量の銅の析出が
認められ、化学銅めつき液は事実上分解した。
Comparative Example 2 In this comparative example, the chemical replenishment structure according to the present invention was not adopted, and the replenishment chemical components 6, 7, and 8 were directly injected into the chemical copper plating tank 1 as shown in FIG. This is an example of a case where a test is performed. In this case, it is not limited to the circuit on the printed circuit board.
Wall surface of plating tank 1, circulation pump 3, filter 4,
A large amount of copper was observed to be deposited inside the heat exchanger 5 and the piping, and the chemical copper plating solution was virtually decomposed.

〔発明の効果〕〔Effect of the invention〕

以上詳細に説明したごとく、本発明による薬液
補給構造を設けた化学銅めつき装置においては、
簡単な構造の、かつ安価な装置で、めつき液の不
足成分である補給薬液を効率よく十分に混合、溶
解することができ、光沢ある機械的性質の優れた
良質の化学銅めつきを安定して行なうことができ
るので、プリント回路基板あるいはプリント配線
基板等の大幅な生産性の向上をはかることが可能
であり、本発明の工業的利用における技術的、経
済的効果は極めて大きい。
As explained in detail above, in the chemical copper plating apparatus equipped with the chemical supply structure according to the present invention,
With a simple structure and inexpensive device, it is possible to efficiently and sufficiently mix and dissolve the replenishment chemical solution, which is a missing ingredient in the plating solution, and to stably produce high-quality chemical copper plating with glossy and excellent mechanical properties. Therefore, it is possible to significantly improve the productivity of printed circuit boards, printed wiring boards, etc., and the technical and economic effects of the present invention in industrial applications are extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例1に用いた化学銅めつ
き装置の構成を示す説明図、第2図は本発明の実
施例2に用いた化学銅めつき装置の構成を示す説
明図、第3図は本発明の実施例3に用いた化学銅
めつき装置の構成を示す説明図、第4図は比較例
1に用いた従来の化学銅めつき装置の構成を示す
説明図、第5図は比較例2に用いた従来の化学銅
めつき装置の構成を示す説明図である。 1……化学銅めつき槽、2……化学銅めつき
液、3,3′,3″……循環ポンプ、4,4′,
4″……フイルタ、5……熱交換器、6……Cu2+
イオンの補給薬液、7……OH-イオンの補給薬
液、8……ホルマリンの補給薬液、9,9′,
9″……薬液補給ポンプ、10……めつき液自動
管理装置、11,11′……撹拌ポンプ、12…
…ミキサ。
FIG. 1 is an explanatory diagram showing the configuration of the chemical copper plating apparatus used in Example 1 of the present invention, FIG. 2 is an explanatory diagram showing the configuration of the chemical copper plating apparatus used in Example 2 of the present invention, 3 is an explanatory diagram showing the configuration of the chemical copper plating apparatus used in Example 3 of the present invention, FIG. 4 is an explanatory diagram showing the configuration of the conventional chemical copper plating apparatus used in Comparative Example 1, FIG. 5 is an explanatory diagram showing the configuration of a conventional chemical copper plating apparatus used in Comparative Example 2. 1...Chemical copper plating tank, 2...Chemical copper plating solution, 3, 3', 3''...Circulation pump, 4, 4',
4″...Filter, 5...Heat exchanger, 6...Cu 2+
Ion replenishment chemical solution, 7...OH - ion replenishment chemical solution, 8...Formalin replenishment chemical solution, 9,9',
9''... Chemical solution supply pump, 10... Plating liquid automatic management device, 11, 11'... Stirring pump, 12...
...Mixer.

Claims (1)

【特許請求の範囲】 1 化学銅めつき槽と、該化学銅めつき槽内の化
学銅めつき液を循環ポンプによつて還流させる上
記化学銅めつき液の循環流路と、上記化学銅めつ
き液にめつき反応により消費されためつき液成分
を供給する薬液補給部とを備えた化学銅めつき装
置において、 上記化学銅めつき液の循環流路が少なくとも2
経路あり、かつ上記薬液補給部が少なくとも2経
路あつて、 上記循環流路のそれぞれに設けられている循環
ポンプもしくは攪拌ポンプの上流側に薬液が各々
個別に注入される薬液補給構造を有することを特
徴とする化学銅めつき装置。 2 上記化学銅めつき液の循環流路が少なくとも
2経路あり、かつ上記薬液補給部が少なくとも3
経路あつて、 該薬液補給部から供給される薬液は、上記循環
流路のそれぞれに設けられている循環ポンプもし
くは攪拌ポンプの上流側に薬液が各々個別に注入
され、 かつ残余の薬液補給部から供給される薬液は、
上記循環流路のそれぞれに設けられている循環ポ
ンプもしくは攪拌ポンプの下流側に各々個別に注
入され、 補給される薬液が互いに接触しない薬液補給構
造を有することを特徴とする特許請求の範囲第1
項記載の化学銅めつき装置。 3 上記化学銅めつき液の循環ポンプを有する循
環流路が少なくとも2経路あり、かつ上記薬液補
給部が少なくとも2経路あつて、 上記複数の循環流路の少なくとも1経路には、
供給される薬液を混合する攪拌ポンプを少なくと
も1個備えることを特徴とする特許請求の範囲第
1項または第2項記載の化学銅めつき装置。 4 上記化学銅めつき液の循環流路が2経路あつ
て、 上記薬液補給部から供給されるCu2+イオン、
OH-イオン、ホルマリンの薬液の中から選ばれ
たいずれか2種を、上記循環ポンプもしくは攪拌
ポンプの上流側に各々個別に注入する薬液補給構
造を有することを特徴とする特許請求の範囲第1
項、第2項または第3項記載の化学銅めつき装
置。 5 上記化学銅めつき液の循環流路が3経路あつ
て、 上記薬液補給部から供給されるCu2+イオン、
OH-イオン、ホルマリンの薬液を、上記循環ポ
ンプもしくは攪拌ポンプの上流側に各々個別に注
入する薬液補給構造を有することを特徴とする特
許請求の範囲第1項、第2項、第3項または第4
項記載の化学銅めつき装置。
[Scope of Claims] 1. A chemical copper plating tank, a circulation flow path for the chemical copper plating solution in which the chemical copper plating solution in the chemical copper plating tank is refluxed by a circulation pump, and a chemical copper plating solution circulating in the chemical copper plating tank. In a chemical copper plating apparatus comprising a chemical solution replenishing section that supplies plating solution components consumed by plating reactions to the plating solution, at least two circulation channels for the chemical copper plating solution are provided.
There is a route, and the chemical solution replenishing section has at least two routes, and the chemical solution supplying structure has a chemical solution supply structure in which the chemical solution is individually injected into the upstream side of the circulation pump or stirring pump provided in each of the circulation channels. Characteristic chemical copper plating equipment. 2. There are at least two circulation channels for the chemical copper plating solution, and at least three chemical solution replenishment sections.
Regarding the route, the chemical solution supplied from the chemical solution supply section is individually injected into the upstream side of the circulation pump or stirring pump provided in each of the circulation flow paths, and is discharged from the remaining chemical solution supply section. The chemical solution supplied is
Claim 1, characterized in that the chemical liquid is individually injected into the downstream side of the circulation pump or stirring pump provided in each of the circulation channels, and has a chemical liquid supply structure in which the chemical liquids to be replenished do not come into contact with each other.
Chemical copper plating equipment as described in section. 3. There are at least two circulation channels having circulation pumps for the chemical copper plating solution, and at least two routes for the chemical solution replenishment section, and at least one of the plurality of circulation channels includes:
3. The chemical copper plating apparatus according to claim 1, further comprising at least one stirring pump for mixing the supplied chemical solution. 4 There are two circulation channels for the chemical copper plating solution, and Cu 2+ ions are supplied from the chemical supply section.
Claim 1, characterized by having a chemical solution supply structure for individually injecting any two types of chemical solutions selected from OH - ions and formalin into the upstream side of the circulation pump or the stirring pump.
2. The chemical copper plating apparatus according to item 2, item 3, or item 3. 5 There are three circulation channels for the chemical copper plating solution, and Cu 2+ ions are supplied from the chemical supply section.
Claims 1, 2, 3 or 3, characterized by having a chemical solution supply structure for individually injecting OH - ion and formalin chemical solutions into the upstream side of the circulation pump or stirring pump, respectively. Fourth
Chemical copper plating equipment as described in section.
JP8238785A 1985-04-19 1985-04-19 Chemical copper plating equipment Granted JPS61243181A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8238785A JPS61243181A (en) 1985-04-19 1985-04-19 Chemical copper plating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8238785A JPS61243181A (en) 1985-04-19 1985-04-19 Chemical copper plating equipment

Publications (2)

Publication Number Publication Date
JPS61243181A JPS61243181A (en) 1986-10-29
JPH0568550B2 true JPH0568550B2 (en) 1993-09-29

Family

ID=13773169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8238785A Granted JPS61243181A (en) 1985-04-19 1985-04-19 Chemical copper plating equipment

Country Status (1)

Country Link
JP (1) JPS61243181A (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3770464A (en) * 1971-10-12 1973-11-06 Shipley Co Dry replenishment of electroless copper solutions
JPS589148B2 (en) * 1980-01-11 1983-02-19 日立化成工業株式会社 Electroless plating device
JPS56169764A (en) * 1980-05-28 1981-12-26 Hitachi Chem Co Ltd Device for electroless copper plating
JPS58123865A (en) * 1982-01-20 1983-07-23 Hitachi Ltd chemical plating equipment
JPS5993863A (en) * 1982-11-17 1984-05-30 Hitachi Chem Co Ltd Method for supplying copper ion to electroless copper plating solution

Also Published As

Publication number Publication date
JPS61243181A (en) 1986-10-29

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