「X-ray Diffraction」に関連した英語例文の一覧と使い方 - Weblio英語例文検索

X-RAY DIFFRACTION DEVICE AND X-RAY DIFFRACTION METHOD例文帳に追加

Ｘ線回折装置およびＸ線回折方法 - 特許庁

X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS例文帳に追加

Ｘ線回折方法およびＸ線回折装置 - 特許庁

X-RAY DIFFRACTION APPARATUS FOR X-RAY SCATTERING例文帳に追加

Ｘ線散乱用のＸ線回折機器 - 特許庁

X-RAY DIFFRACTION APPARATUS AND DIFFRACTION METHOD例文帳に追加

Ｘ線回折装置および方法 - 特許庁

X-RAY DIFFRACTION OPTICAL ELEMENT例文帳に追加

Ｘ線回折光学素子 - 特許庁

X-RAY DIFFRACTION JIG, X-RAY DIFFRACTION DEVICE, AND MEASURING METHOD OF X-RAY DIFFRACTION例文帳に追加

Ｘ線回折用治具、Ｘ線回折装置およびＸ線回折の測定方法 - 特許庁

X-RAY DIFFRACTION MEASUREMENT DEVICE例文帳に追加

Ｘ線回折測定装置 - 特許庁

X-RAY DIFFRACTION MEASUREMENT METHOD AND X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折測定方法及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD例文帳に追加

Ｘ線回折装置及びＸ線回折測定方法 - 特許庁

X-RAY DIFFRACTION DEVICE AND MEASUREMENT METHOD BY X-RAY DIFFRACTION例文帳に追加

Ｘ線回折装置及びＸ線回折の測定方法 - 特許庁

X-RAY DIFFRACTION DETERMINATION APPARATUS例文帳に追加

Ｘ線回折定量装置 - 特許庁

X-RAY DIFFRACTION MEASUREMENT METHOD例文帳に追加

Ｘ線回折測定方法 - 特許庁

X-RAY DIFFRACTION MEASURING METHOD例文帳に追加

Ｘ線回折測定方法 - 特許庁

X-RAY DIFFRACTION QUANTIFYING DEVICE例文帳に追加

Ｘ線回折定量装置 - 特許庁

X-RAY DIFFRACTION ANALYZER AND X-RAY DIFFRACTION ANALYZING METHOD例文帳に追加

Ｘ線回折分析装置およびＸ線回折分析方法 - 特許庁

X-RAY DIFFRACTION ANALYZING METHOD AND X-RAY DIFFRACTION ANALYZER例文帳に追加

Ｘ線回折分析方法およびＸ線回折分析装置 - 特許庁

COMBINATORIAL X-RAY DIFFRACTION DEVICE例文帳に追加

コンビナトリアルＸ線回折装置 - 特許庁

MINUTE PART X-RAY DIFFRACTION APPARATUS例文帳に追加

微小部Ｘ線回折装置 - 特許庁

X-RAY DIFFRACTION APPARATUS AND MEASURING METHOD OF X-RAY DIFFRACTION PATTERN例文帳に追加

Ｘ線回折装置およびＸ線回折パターンの測定方法 - 特許庁

X-RAY DIFFRACTION ANALYSIS SYSTEM AND X-RAY DIFFRACTION ANALYSIS METHOD例文帳に追加

Ｘ線回折分析システム、および、Ｘ線回折分析方法 - 特許庁

X-Ray Powder Diffraction Method例文帳に追加

粉末Ｘ線回折測定法 - 厚生労働省

X-RAY DIFFRACTION APPARATUS AND X-RAY ADJUSTING METHOD例文帳に追加

Ｘ線回折装置及びＸ線調整方法 - 特許庁

SINGLE-CRYSTAL X-RAY DIFFRACTION SYSTEM例文帳に追加

単結晶Ｘ線回折システム - 特許庁

GONIOMETER FOR X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折装置用ゴニオメータ - 特許庁

IMAGING PLATE X-RAY DIFFRACTION DEVICE例文帳に追加

イメージングプレートＸ線回折装置 - 特許庁

X-RAY DIFFRACTOMETER AND METHOD FOR X-RAY DIFFRACTION MEASUREMENT例文帳に追加

Ｘ線回折装置及びＸ線回折測定方法 - 特許庁

METHOD OF MEASURING X-RAY DIFFRACTION AND X-RAY DIFFRACTOMETER例文帳に追加

Ｘ線回折測定方法及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTING AND MEASURING METHOD例文帳に追加

Ｘ線回折装置及びＸ線回折測定方法 - 特許庁

X-RAY DIFFRACTION METHOD AND PORTABLE X-RAY DIFFRACTION APPARATUS USING THE SAME例文帳に追加

Ｘ線回折方法及びそれを用いた可搬型Ｘ線回折装置 - 特許庁

SAMPLE CONTAINER FOR X-RAY DIFFRACTION MEASUREMENT例文帳に追加

Ｘ線回折測定用試料容器 - 特許庁

SILICON SUBSTRATE FOR X-RAY DIFFRACTION MEASUREMENT例文帳に追加

Ｘ線回折測定用シリコン基板 - 特許庁

WAVELENGTH DISCRIMINATION X-RAY DIFFRACTION DEVICE例文帳に追加

波長分別型Ｘ線回折装置 - 特許庁

ANGLE CORRECTION METHOD IN X-RAY DIFFRACTION MEASUREMENT AND X-RAY DIFFRACTION SYSTEM例文帳に追加

Ｘ線回折測定における角度補正方法及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION APPARATUS FOR MEMBRANE SAMPLE例文帳に追加

薄膜試料用Ｘ線回折装置 - 特許庁

X-RAY DIFFRACTION DEVICE AND MEASURING METHOD OF X-RAY LOCKING CURVE例文帳に追加

Ｘ線回折装置及びＸ線ロッキングカーブの測定方法 - 特許庁

X-RAY DETECTOR AND POWDER X-RAY DIFFRACTION MEASURING METHOD例文帳に追加

Ｘ線検出装置及び粉末Ｘ線回折測定方法 - 特許庁

METHOD FOR MANUFACTURING X-RAY TALBOT DIFFRACTION GRATING, X-RAY TALBOT DIFFRACTION GRATING, X-RAY TALBOT INTERFEROMETERS AND X-RAY PHASE IMAGING APPARATUS例文帳に追加

Ｘ線タルボ回折格子の製造方法、Ｘ線タルボ回折格子、Ｘ線タルボ干渉計及びＸ線位相イメージング装置 - 特許庁

TRANSMISSION TYPE DIFFRACTION GRATING FOR X-RAY, X-RAY TALBOT INTERFEROMETER AND X-RAY IMAGING APPARATUS例文帳に追加

Ｘ線用透過型回折格子、Ｘ線タルボ干渉計およびＸ線撮像装置 - 特許庁

X-RAY DIFFRACTION METHOD AND NEUTRON BEAM DIFFRACTION METHOD例文帳に追加

Ｘ線回折方法および中性子線回折方法 - 特許庁

X-RAY POWDER DIFFRACTION PATTERN SCREENING METHOD例文帳に追加

Ｘ線粉末回折パターンスクリーニング法 - 特許庁

STRESS MEASURING METHOD BY X-RAY DIFFRACTION例文帳に追加

Ｘ線回折による応力測定法 - 特許庁

The X-ray diffraction chart is shown by figure 1.例文帳に追加

このＸ線回折図は図１に示す。 - 特許庁

METHOD AND DEVICE FOR X-RAY DIFFRACTION ANALYSIS例文帳に追加

Ｘ線回折分析方法及び装置 - 特許庁

METHOD FOR PREPARING X-RAY DIFFRACTION SAMPLE例文帳に追加

Ｘ線回折用試料の調製方法 - 特許庁

X-RAY DIFFRACTION ANALYZER AND METHOD FOR CORRECTING MEASUREMENT POSITION OF X-RAY DIFFRACTION ANALYZER例文帳に追加

Ｘ線回折分析器およびこのＸ線回折分析器の測定位置補正方法 - 特許庁