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JPH068057B2 - Method of manufacturing thermal head - Google Patents
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JPH068057B2 - Method of manufacturing thermal head - Google Patents

Method of manufacturing thermal head

Info

Publication number
JPH068057B2
JPH068057B2 JP20401086A JP20401086A JPH068057B2 JP H068057 B2 JPH068057 B2 JP H068057B2 JP 20401086 A JP20401086 A JP 20401086A JP 20401086 A JP20401086 A JP 20401086A JP H068057 B2 JPH068057 B2 JP H068057B2
Authority
JP
Japan
Prior art keywords
voltage
heating resistor
value
resistance
resistance value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP20401086A
Other languages
Japanese (ja)
Other versions
JPS6359557A (en
Inventor
博實 山下
孝文 遠藤
広久 杉原
裕 尾崎
弥平 高瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP20401086A priority Critical patent/JPH068057B2/en
Publication of JPS6359557A publication Critical patent/JPS6359557A/en
Publication of JPH068057B2 publication Critical patent/JPH068057B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/315Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
    • B41J2/32Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
    • B41J2/35Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads providing current or voltage to the thermal head

Landscapes

  • Electronic Switches (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は発熱抵抗体の抵抗値を均一化させるサーマル
ヘツドの製造方法に関する。
The present invention relates to a method for manufacturing a thermal head for uniformizing the resistance value of a heating resistor.

〔従来の技術〕[Conventional technology]

周知のように厚膜形のサーマルヘツドはペースト状の抵
抗材料にスクリーン印刷法等によつて所定のパターンに
印刷し、その後焼成することで発熱抵抗体を形成してい
る。そのため、厚膜形のサーマルヘツドは比較的短い製
造工程によつて安価に製造できる反面、発熱抵抗体の抵
抗値のばらつきが大きくなる欠点を持ち合せている。こ
の発熱抵抗体の抵抗値のばらつきは印字等の質に直接影
響を及ぼすものであるため、厚膜形のサーマルヘツドの
製造においては発熱抵抗体の抵抗値の均一化は極めて重
要な要因である。この発熱抵抗体の抵抗値の均一化とし
ては発熱抵抗体形成後、各発熱抵抗体に個別に比較的高
圧の電圧パルスを印加すると、その抵抗値が低下すると
いう現象を利用したトリミング処理がある。
As is well known, a thick film type thermal head is formed by printing a paste-like resistance material in a predetermined pattern by a screen printing method or the like and then firing it to form a heating resistor. Therefore, the thick-film type thermal head can be manufactured at a low cost by a relatively short manufacturing process, but has a drawback that the resistance value of the heating resistor varies greatly. Since the variation in the resistance value of the heating resistor directly affects the quality of printing and the like, it is an extremely important factor to make the resistance value of the heating resistor uniform in the production of the thick film type thermal head. . To make the resistance values of the heating resistors uniform, there is a trimming process utilizing the phenomenon that the resistance value decreases when a relatively high voltage pulse is individually applied to each heating resistor after forming the heating resistors. .

このように従来のサーマルヘツドの製造方法は電圧値を
暫増させながら発熱抵抗体に電圧パルスを繰返し印加
し、発熱抵抗体の抵抗値をある目標値に設定させるよう
にするもので、実験により発熱抵抗体の抵抗値はその初
期値にかかわらず、印加する電圧パルスを暫増させてい
くときに変化率が一定の曲線上を推移していくことがわ
かつた。
In this way, the conventional thermal head manufacturing method is to apply a voltage pulse repeatedly to the heating resistor while temporarily increasing the voltage value to set the resistance value of the heating resistor to a certain target value. It was found that the resistance value of the heating resistor changes on a curve with a constant rate of change when the applied voltage pulse is increased irrespective of its initial value.

この変化率は で近似的に表わすことができる。なお、(1)式中Vは印
加電圧、Rは発熱抵抗体の抵抗値、R0は発熱抵抗体の
初期抵抗値、V0は抵抗値に変化が現われ始める印加電
圧の境界値、ΔVは印加電圧の変化ステツプ、α,βは
サーマルヘツドの構造,ドツト密度等で決まる定数であ
る。
This rate of change Can be approximately represented by. In the equation (1), V is the applied voltage, R is the resistance value of the heating resistor, R 0 is the initial resistance value of the heating resistor, V 0 is the boundary value of the applied voltage at which the resistance value starts to change, and ΔV is The applied voltage change steps α and β are constants determined by the thermal head structure, dot density, and the like.

第2図はこのような方法によつて電圧パルスを発熱抵抗
体に印加した場合の発熱抵抗体の抵抗値の減少を示す線
図であり、トリミング前にはR1,R2,R3と大きくば
らついていた抵抗値がトリミング処理により目標値R0
よりわずかに低い狭い範囲内に均一化される。図におい
て、VSは電圧パルスの初期値であり、電圧パルスの印
加によつて発熱抵抗体の抵抗値が減少を始める境界電圧
が通常は25V近傍にあるため、例えば25Vに設定さ
れている。また、ΔVは電圧パルスの電圧値の増し分で
あり、発熱抵抗体の抵抗値が減少し過ぎないように例え
ば2.5Vに設定して徐々に抵抗値を減少させるようにし
ている。
FIG. 2 is a diagram showing a decrease in the resistance value of the heating resistor when a voltage pulse is applied to the heating resistor by such a method. Before trimming, R 1 , R 2 , R 3 Due to the trimming process, the resistance value that has largely varied is the target value R 0.
It is homogenized within a narrow range slightly lower. In the figure, V S is the initial value of the voltage pulse, and since the boundary voltage at which the resistance value of the heating resistor starts to decrease due to the application of the voltage pulse is usually around 25 V, it is set to, for example, 25 V. Further, ΔV is an increment of the voltage value of the voltage pulse, and is set to, for example, 2.5 V so that the resistance value of the heating resistor does not decrease too much, and the resistance value is gradually decreased.

第3図は、横軸に電圧パルスによる印加電圧値が、縦軸
に電圧パルス印加による発熱抵抗体の抵抗変化率が目盛
られた線図である。そして、第3図は第2図と同一デー
タで第2図の縦軸を抵抗変化率で表わしたもので、個々
の発熱抵抗体の初期抵抗値はばらつきを呈していても変
化率の曲線は第3図に破線で示す如く初期抵抗値には関
係なくほぼ一定の曲線Y上をたどる発熱抵抗体の抵抗値
の減少を示す線図が描ける。
FIG. 3 is a diagram in which the horizontal axis represents the applied voltage value by the voltage pulse and the vertical axis represents the resistance change rate of the heating resistor by the voltage pulse application. FIG. 3 shows the same data as in FIG. 2 and the vertical axis of FIG. 2 is represented by the resistance change rate. Even if the initial resistance values of the individual heating resistors vary, the change rate curve is As shown by the broken line in FIG. 3, a diagram showing a decrease in the resistance value of the heating resistor that follows a substantially constant curve Y regardless of the initial resistance value can be drawn.

このようなサーマルヘツドの製造方法では1ドツトの発
熱抵抗体のトリミングには20〜30回の電圧パルスの
印加および抵抗値の測定をしなければならず、発熱抵抗
体の抵抗値の均一化には多大な時間を要することにな
る。
In such a thermal head manufacturing method, in order to trim a one-dot heating resistor, it is necessary to apply a voltage pulse 20 to 30 times and to measure the resistance value, so that the resistance value of the heating resistor can be made uniform. Will take a great deal of time.

このため、近時はサーマルヘツド内のサンプルドツトの
測定によつて抵抗値降下曲線を近似し、トリミングに際
してこの抵抗値降下曲線を用いてドツトの発熱抵抗体の
初期抵抗体と到達させるべき抵抗値とより印加する電圧
パルスと電圧値を決定して1回の電圧パルスの印加で発
熱抵抗体の抵抗値を目標値に減少させるようにした抵抗
値の均一化方法が考えられるに至つた。
Therefore, recently, the resistance drop curve is approximated by measuring the sample dot in the thermal head, and the resistance drop curve should be used for trimming when using the resistance drop curve to reach the initial resistance of the dot heating resistor. Therefore, a method of making the resistance value uniform by determining the voltage pulse to be applied and the voltage value and reducing the resistance value of the heating resistor to a target value by applying the voltage pulse once has been conceived.

すなわち、第4図は従来のサーマルヘツドの製造方法を
示すフローチヤートである。同図において、ST1は初
期設定のステツプ、ST2は上記ステツプST1に続く
サンプルの抵抗変化測定のステツプ、ST3は上記ステ
ツプST2に続く抵抗値降下曲線近似のステツプ、ST
4は上記ステツプST3に続く抵抗値測定のステツプ、
ST5は上記ステツプST4に続く印加電圧決定のステ
ツプ、ST6は上記ステツプST5に続く電圧パルス印
加のステツプ、ST7は上記ステツプST6に続くトリ
ミングの全ドツト終了検出のステツプであり、このステ
ツプST7の分岐からはステツプST4に処理が戻され
る。
That is, FIG. 4 is a flow chart showing a conventional method for manufacturing a thermal head. In the figure, ST1 is an initial setting step, ST2 is a step for measuring a resistance change of a sample following the step ST1, ST3 is a step for approximating a resistance value drop curve following the step ST2, and ST.
4 is a resistance value measuring step following the step ST3,
ST5 is a step for determining an applied voltage following step ST4, ST6 is a step for applying a voltage pulse following step ST5, and ST7 is a step for detecting the end of all trimming dots following step ST6. Returns to step ST4.

第5図はこのサーマルヘツドの製造方法を実施する装置
の一例を示すブロツク図であり、図において、1はトリ
ミング処理が行われるサーマルヘツド、2はこのサーマ
ルヘツド1の各発熱抵抗体の端子にプローブを押し当て
るプロービング装置、3はこのプロービング装置2に接
続されて上記発熱抵抗体の選択を行うリレー網、4はこ
のリレー網3に接続されて電圧パルスの印加と抵抗値の
測定とを切換えるスイツチ、5はこのスイツチ4の一方
に接続されて指定された電圧値の電圧パルスを送出する
パルス発生器、6はスイツチ4の他方に接続された抵抗
計、7は入出力部8、中央処理部(以下、CPUとい
う)9、メモリ10、キーボード11等を備えて上記諸
装置の制御を行なうとともに所要の演算処理を行う制御
演算部、12はこの制御演算部7に接続されたプリンタ
である。
FIG. 5 is a block diagram showing an example of an apparatus for carrying out this thermal head manufacturing method. In the figure, 1 is a thermal head on which trimming processing is performed, and 2 is a terminal of each heating resistor of this thermal head 1. A probing device 3 for pressing the probe is connected to the probing device 2 to select the heating resistor. A relay network 4 is connected to the relay network 3 to switch between application of a voltage pulse and measurement of a resistance value. A switch 5 is a pulse generator connected to one side of the switch 4 to send out a voltage pulse of a designated voltage value, 6 is a resistance meter connected to the other side of the switch 4, 7 is an input / output unit 8, and a central processing unit. A control arithmetic unit 12 for controlling the above-mentioned devices and performing necessary arithmetic processing, including a unit (hereinafter referred to as CPU) 9, a memory 10, a keyboard 11 and the like. A printer connected to the control calculation unit 7.

次に動作について説明する。まず、第4図においてステ
ツプST1で初期設定が行われ、次いでステツプST2
でサンプルの抵抗変化測定が行われる。すなわち、リレ
ー網3を制御してサーマルヘツド1のサンプルとして指
定されたドツトの発熱抵抗体を選択し、スイツチ4を切
換えて抵抗計6へ接続して抵抗値を測定し、その測定値
を制御演算部7へ送り、制御演算部7のCPU9はこれ
をメモリ10へ格納する。次に、スイツチ4を切換えて
パルス発生器5より所定の電圧値の電圧パルスを上記発
熱抵抗体に印加する。ここで、この電圧パルスは例えば
幅が2μsecのパルスが15個、周期50μsecで連
続するパルス列である。次に、再度スイツチ4を切換え
て電圧パルスが印加された発熱抵抗体を抵抗計6に接続
して抵抗値を測定し、制御演算部7へ送る。制御演算部
7のCPU9はそれを印加した電圧パルスの電圧値とと
もにメモリ10に格納する。以下、同様にして電圧パル
スの電圧値を適宜上昇させながら、これらの処理を繰返
す。この処理は少くとも3回繰返して実行され、リレー
網3を切換えていくつかのサンプルについて実行され
る。
Next, the operation will be described. First, in FIG. 4, initial setting is performed in step ST1, and then step ST2.
The resistance change of the sample is measured at. That is, the relay network 3 is controlled to select the dot heating resistor specified as the sample of the thermal head 1, the switch 4 is switched and the resistance value is measured by connecting to the resistance meter 6, and the measured value is controlled. The data is sent to the calculation unit 7, and the CPU 9 of the control calculation unit 7 stores it in the memory 10. Next, the switch 4 is switched to apply a voltage pulse of a predetermined voltage value from the pulse generator 5 to the heating resistor. Here, this voltage pulse is, for example, a pulse train in which 15 pulses having a width of 2 μsec and a period of 50 μsec are continuous. Next, the switch 4 is switched again to connect the heating resistor to which the voltage pulse is applied to the resistance meter 6 to measure the resistance value and send it to the control calculation unit 7. The CPU 9 of the control calculation unit 7 stores it in the memory 10 together with the voltage value of the applied voltage pulse. Hereinafter, similarly, these processes are repeated while appropriately increasing the voltage value of the voltage pulse. This process is repeated at least three times, switching relay network 3 and executing for some samples.

次に、ステツプST3において、測定された抵抗変化に
基づく抵抗値降下曲線の近似が行われる。すなわち、制
御演算部7のCPU9はメモリ10に格納しておいた抵
抗変化から電圧パルスによる各印加電圧における抵抗変
化率ΔR=(R−R0)/R0を求め、これを上記(1)式
に代入する。これによつて各サンプル毎にそれぞれα,
β,V0を未知数とする方程式を作成してこれを解く。
ここで三つの未知数に対して四つ以上の方程式がある場
合にはこれを統計的に処理して解を得る。得られた解は
さらに各サンプル間で統計的に処理され、得られた定数
α,β、境界電圧値V0が(1)式に代入されて抵抗変化率
ΔRと印加電圧Vとの関係を示す第6図の抵抗値降下曲
線Aが近似される。
Next, in step ST3, the resistance drop curve is approximated based on the measured resistance change. That is, the CPU 9 of the control calculation unit 7 obtains the resistance change rate ΔR = (R−R 0 ) / R 0 at each applied voltage by the voltage pulse from the resistance change stored in the memory 10, and calculates it as the above (1). Substitute in an expression. Thus, for each sample, α,
An equation with β and V 0 as unknowns is created and solved.
If there are four or more equations for three unknowns, they are statistically processed to obtain a solution. The obtained solution is further statistically processed between each sample, and the obtained constants α and β and the boundary voltage value V 0 are substituted into the equation (1) to calculate the relationship between the resistance change rate ΔR and the applied voltage V. The resistance drop curve A shown in FIG. 6 is approximated.

これで準備段階を終了してステツプST4よりトリミン
グの処理に入る。まず、ステツプST4において、リレ
ー網3でトリミングを実施するドツトを選択し、スイツ
チ4によつてこれを抵抗計6に接続してその抵抗値を測
定する。次に、ステツプST5ではCPU9によつて得
られた抵抗値を目標値まで降下させるための抵抗変化率
ΔRnが算出され、さらに前述の抵抗値降下曲線Aを用い
て電圧パルスの印加電圧Vnを決定する。すなわち、上記
α,β,V0が代入された関係式に抵抗変化率ΔRnを代
入して印加電圧Vnを算出する。得られた印加電圧Vnは制
御演算部7よりパルス発生器5へ送られる。ステツプS
T6でスイツチ4が切換えられると、パルス発生器5か
らは電圧がVnの電圧パルスが送出され、トリミングを実
施するドツトの発熱抵抗体に印加される。これによつて
当該発熱抵抗体の抵抗値は目標値以下に降下する。以下
ステツプST7が全ドツトのトリミングの終了を検出す
るまでステツプST4以後の処理を繰返す。
This completes the preparatory stage and starts the trimming process from step ST4. First, in step ST4, a dot to be trimmed by the relay network 3 is selected, and this is connected to the ohmmeter 6 by the switch 4, and the resistance value is measured. Next, in step ST5, the resistance change rate ΔRn for lowering the resistance value obtained by the CPU 9 to the target value is calculated, and further, the applied voltage Vn of the voltage pulse is determined using the resistance value decrease curve A described above. To do. That is, the applied voltage Vn is calculated by substituting the resistance change rate ΔRn into the relational expression in which α, β and V 0 are substituted. The obtained applied voltage Vn is sent from the control calculation unit 7 to the pulse generator 5. Step S
When the switch 4 is switched at T6, a voltage pulse having a voltage of Vn is sent from the pulse generator 5 and applied to the dot heating resistor for trimming. As a result, the resistance value of the heating resistor falls below the target value. Thereafter, steps ST4 and subsequent steps are repeated until step ST7 detects the end of trimming of all dots.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

従来のサーマルヘツドの製造方法は以上のように構成さ
れているので、任意の発熱抵抗体に電圧パルスを印加し
た場合、第7図に示すように隣接する発熱抵抗体13は
放電により電圧が印加された状態となり、その抵抗値が
降下してしまう。このため、放電により影響を受けた発
熱抵抗体13をトリミングしようとするとき、測定され
る初期抵抗値は既に若干降下した値であり、印加すべき
正確な電圧を算出できないという問題点があつた。
Since the conventional thermal head manufacturing method is configured as described above, when a voltage pulse is applied to an arbitrary heating resistor, the voltage is applied to the adjacent heating resistors 13 by discharging as shown in FIG. And the resistance value drops. Therefore, when the heating resistor 13 affected by the discharge is to be trimmed, the measured initial resistance value is a value that has already dropped slightly, and there is a problem in that an accurate voltage to be applied cannot be calculated. .

この発明は上記のような問題点を解消するためになされ
たもので、全ての発熱抵抗体に対して印加すべき正確な
電圧が算出できるようにしたサーマルヘツドの製造方法
を得ることを目的とする。。
The present invention has been made to solve the above problems, and an object thereof is to obtain a method for manufacturing a thermal head capable of calculating an accurate voltage to be applied to all heating resistors. To do. .

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係るサーマルヘツドの製造方法は発熱抵抗体
の電圧値の異なる電圧パルスを低圧のものから順次印加
してその抵抗値を降下させ、印加電圧と抵抗変化との関
係を示す抵抗値降下曲線を近似し、この抵抗値降下曲線
を用いて上記各発熱抵抗体へ印加する上記電圧パルスの
電圧値を当該発熱抵抗体の初期抵抗値に基づいて算出
し、算出された電圧値を上記発熱抵抗体に印加してその
抵抗値を降下させて均一化する方法であつて、上記全て
の発熱抵抗体の初期抵抗値をトリミング前に予め測定し
てメモリに格納し、次いでトリミング時に各ドツトの発
熱抵抗体を選択すると共に、選択された発熱抵抗体の初
期抵抗値を読出し、上記抵抗値降下曲線を用いて当該発
熱抵抗体の初期抵抗値を目標値まで降下させる抵抗変化
率より当該発熱抵抗体へ印加させる上記電圧パルスの電
圧値を算出する方法である。
In the method for manufacturing a thermal head according to the present invention, a voltage pulse having different voltage values of a heating resistor is sequentially applied from a low voltage one to decrease its resistance value, and a resistance value decreasing curve showing a relationship between an applied voltage and a resistance change. And the voltage value of the voltage pulse applied to each of the heating resistors is calculated using this resistance drop curve based on the initial resistance value of the heating resistor, and the calculated voltage value is the heating resistance. It is a method to apply uniform resistance to the body by lowering its resistance value.Measure the initial resistance value of all the above heating resistors before trimming and store them in the memory, and then heat each dot during trimming. While selecting the resistor, read the initial resistance value of the selected heating resistor, and use the resistance drop curve to lower the initial resistance value of the heating resistor to the target value. It is a method of calculating the voltage value of the voltage pulse to be applied to.

〔作 用〕[Work]

この発明におけるサーマルヘツドの製造方法はサーマル
ヘツドのサンプルドツトの測定によつて抵抗値降下曲線
を近似し、トリミングに際して全ての発熱抵抗体の初期
抵抗値を予め測定してメモリに格納し、次いで発熱抵抗
体を選択して当該発熱抵抗体の初期抵抗値を読出し、上
記抵抗値降下曲線を表わす式を用いて抵抗変化率より発
熱抵抗体に印加する電圧パルスの電圧値を算出する。
The method of manufacturing the thermal head according to the present invention approximates the resistance drop curve by measuring the sample head of the thermal head, measures the initial resistance values of all the heating resistors in advance during trimming, stores them in the memory, and then generates the heat. A resistor is selected, the initial resistance value of the heating resistor is read out, and the voltage value of the voltage pulse applied to the heating resistor is calculated from the resistance change rate using the expression representing the resistance drop curve.

〔実施例〕〔Example〕

以下この発明の一実施例を図について説明する。第1図
において、ST11は初期抵抗値保存のステツプ、ST
12は上記ステツプST11に続く初期抵抗値読出しの
ステツプ、ST13は上記ステツプST12に続く印加
電圧算出のステツプ、ST14は上記ステツプST13
に続く電圧パルス印加のステツプ、ST15は上記ステ
ツプST14に続く抵抗値測定のステツプ、ST16は
上記ステツプST15に続く目標値比較のステツプ、S
T17は上記ステツプST16に続くプリンタ出力情報
演算のステツプ、ST18は、上記ステツプST17に
続くトリミングの全ドツト終了検出のステツプであり、
このステツプST18の分岐からはステツプST12に
処理が戻される。また、ステツプST16の分岐からは
ステツプST19へ処理が進み、このステツプST19
はステツプST14の処理へ戻る。
An embodiment of the present invention will be described below with reference to the drawings. In FIG. 1, ST11 is a step for storing the initial resistance value, ST11
Reference numeral 12 is a step for reading the initial resistance value following the step ST11, ST13 is a step for calculating an applied voltage following the step ST12, and ST14 is a step ST13.
Step ST15 is a step of applying a voltage pulse, ST15 is a step of measuring a resistance value following the step ST14, ST16 is a step of comparing the target value following the step ST15, S
T17 is a printer output information calculation step following step ST16, and ST18 is a trimming all dot end detection step following step ST17.
The process returns from the branch of step ST18 to step ST12. The processing proceeds from the branch of step ST16 to step ST19, and this step ST19
Returns to the processing of step ST14.

しかして、この発明のサーマルヘツドの製造方法を実施
する装置は、第5図に示す装置を使用する。
Therefore, the apparatus for carrying out the method for manufacturing the thermal head of the present invention uses the apparatus shown in FIG.

次に動作について説明する。まず、ステツプST11で
トリミングによる電圧パルス印加前の全ての発熱抵抗体
の初期抵抗値を測定保存する。すなわち、スイツチ4を
切換えて抵抗計6へ接続して初期抵抗値を測定し、その
測定値を制御演算部7に送り、制御演算部7のCPU9
はこれをメモリ10へ格納する。次にステツプST12
においてサーマルヘツド1の各発熱抵抗体の端子にフロ
ービング装置2のプローブを押当てリレー網3によつて
発熱抵抗体を選択し(この実施例の場合64コ)、この
選択された発熱抵抗体の初期低抗値をメモリ10より読
出す。次いで、ステツプST13において、抵抗値降下
曲線を表わす(1)式を用いて選択された発熱抵抗体に印
加する電圧パルスの電圧値を演算する。すなわち、制御
演算部7のCPU9はメモリ10に格納しておいた初期
抵抗値と目標とする抵抗値の抵抗変化から電圧パルスに
よる印加電圧における抵抗変化率ΔR(R−R0)/R0
を求め、これを(1)式に代入して印加電圧を演算する。
得られた印加電圧は制御演算部7よりパルス発生器5へ
送られる。そして、ステツプST14でスイツチ4が切
換えられると、パルス発生器5からは電圧パルスが送出
され、トリミングを実施しているドツトの発熱抵抗体に
印加される。
Next, the operation will be described. First, in step ST11, initial resistance values of all heating resistors before voltage pulse application by trimming are measured and stored. That is, the switch 4 is switched and connected to the ohmmeter 6 to measure the initial resistance value, and the measured value is sent to the control calculation unit 7 and the CPU 9 of the control calculation unit 7 is measured.
Stores this in the memory 10. Next, step ST12
At the terminal of each heating resistor of the thermal head 1, the probe of the flowbing device 2 is pressed to select the heating resistor by the relay network 3 (64 in this embodiment), and the selected heating resistor is selected. The initial resistance value of is read from the memory 10. Next, in step ST13, the voltage value of the voltage pulse applied to the selected heating resistor is calculated using the equation (1) representing the resistance drop curve. That is, the CPU 9 of the control arithmetic unit 7 calculates the resistance change rate ΔR (R−R 0 ) / R 0 in the applied voltage by the voltage pulse from the resistance change between the initial resistance value stored in the memory 10 and the target resistance value.
Then, this is substituted into the equation (1) to calculate the applied voltage.
The obtained applied voltage is sent from the control calculation unit 7 to the pulse generator 5. Then, when the switch 4 is switched in step ST14, a voltage pulse is sent from the pulse generator 5 and applied to the dot heating resistor which is being trimmed.

次いで、ステツプST16において、当該発熱抵抗体の
抵抗値が目標値に近い値であるか否かの判定をし、目標
値に極めて近い値であればステツプST17に進み、目
標値に対してまだ開きがある場合はステツプST19に
進む。そして、ステツプST19において、選択された
発熱抵抗体に印加された電圧パルスと同電圧の電圧パル
スあるいは印加された電圧パルスの電圧値より1ステツ
プ昇圧した電圧を再度印加する。
Next, in step ST16, it is determined whether or not the resistance value of the heating resistor is close to the target value. If the resistance value is extremely close to the target value, the process proceeds to step ST17, and the target value is still open. If there is, proceed to step ST19. Then, in step ST19, a voltage pulse having the same voltage as the voltage pulse applied to the selected heating resistor or a voltage stepped up from the voltage value of the applied voltage pulse by one step is applied again.

以下、ステツプST18全ドツトのトリミングを終了す
るまでステツプST12以後の処理が繰返されることに
なる。
After that, the processes after step ST12 are repeated until the trimming of all the dots at step ST18 is completed.

なお、上記実施例では電圧パルスに所定数連続したパル
ス列を用いたが、単一パルスであつてもよく、上記実施
例と同様の効果を奏する。
In the above embodiment, a predetermined number of pulse trains are used for the voltage pulse, but a single pulse may be used, and the same effect as that of the above embodiment can be obtained.

〔発明の効果〕〔The invention's effect〕

以上のようにこの発明によれば全ての発熱抵抗体の初期
抵抗値をトリミング前に予め測定してメモリに格納し、
次いでトリミング時に各ドツトの発熱抵抗体を選択する
と共に、選択された発熱抵抗体の初期抵抗値を読出し、
印加電圧と抵抗変化との関係を近似させた抵抗値降下曲
線を用いて当該発熱抵抗体の初期抵抗値を目標値まで降
下させるときの抵抵抗値変化率より発熱抵抗体へ印加さ
せる上記電圧パルスの電圧値を算出する構成であるの
で、先のトリミング時にそのドツトの発熱抵抗体に印加
された電圧パルスで隣接する発熱抵抗体の抵抗値が下つ
ても当該発熱抵抗体の初期抵抗値が測定してあるから全
ての発熱抵抗体に対して印加すべき正確な電圧が算出で
きるという効果が得られる。
As described above, according to the present invention, the initial resistance values of all the heating resistors are measured in advance before trimming and stored in the memory,
Next, at the time of trimming, the heating resistor of each dot is selected, and the initial resistance value of the selected heating resistor is read out.
The voltage pulse applied to the heating resistor from the resistance change rate when the initial resistance value of the heating resistor is lowered to the target value by using the resistance drop curve that approximates the relationship between the applied voltage and the resistance change. Since the voltage value of is calculated, the initial resistance value of the heating resistor is measured even if the resistance value of the adjacent heating resistor is reduced by the voltage pulse applied to the heating resistor of the dot during the previous trimming. Therefore, the effect that an accurate voltage to be applied to all the heating resistors can be calculated can be obtained.

【図面の簡単な説明】[Brief description of drawings]

第1図は、この発明の一実施例によるサーマルヘツドの
製造方法を示すフローチヤート、第2図は発熱抵抗体の
抵抗値の減少を示す線図、第3図は抵抗値降下曲線の一
例を示す線図、第4図は従来のサーマルヘツドの製造方
法を示すフローチヤート、第5図はそれを実施するため
の装置の一例を示すブロツク図、第6図はその抵抗値降
下曲線の一例を示す線図、第7図(a),(b)は任意の発熱
抵抗体に電圧パルスを印加する状態を示す概念図であ
る。 1はサーマルヘツド、10はメモリ、 なお、図中同一符号は同一または相当部分を示す。
FIG. 1 is a flow chart showing a method of manufacturing a thermal head according to an embodiment of the present invention, FIG. 2 is a diagram showing a decrease in the resistance value of a heating resistor, and FIG. 3 is an example of a resistance drop curve. The diagram shown in FIG. 4, FIG. 4 is a flow chart showing a conventional method for manufacturing a thermal head, FIG. 5 is a block diagram showing an example of an apparatus for carrying out the method, and FIG. 6 is an example of its resistance drop curve. The diagram shown in FIGS. 7A and 7B is a conceptual diagram showing a state in which a voltage pulse is applied to an arbitrary heating resistor. Reference numeral 1 is a thermal head, 10 is a memory, and the same reference numerals in the drawings denote the same or corresponding portions.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 尾崎 裕 兵庫県尼崎市塚口本町8丁目1番1号 三 菱電機株式会社通信機製作所内 (72)発明者 高瀬 弥平 兵庫県尼崎市塚口本町8丁目1番1号 三 菱電機株式会社通信機製作所内 (56)参考文献 特開 昭61−131404(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yu Ozaki 8-1-1 Tsukaguchi Honcho, Amagasaki City, Hyogo Prefecture Sanryo Electric Co., Ltd. Communication Machinery Works (72) Inventor Yahei Takase 8-chome, Tsukaguchi Honcho, Amagasaki City, Hyogo Prefecture No. 1-1 Sanryo Electric Co., Ltd. Communication Equipment Factory (56) Reference JP-A-61-131404 (JP, A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】複数のドツトの発熱抵抗体中から選択した
サンプルドツトに電圧値の異なる電圧パルスを低圧のも
のから順次印加して、印加電圧と抵抗値変化との関係を
抵抗値降下曲線として近似させ、この抵抗値降下曲線を
用い、トリミング時にそれぞれのドツトの発熱抵抗体の
初期抵抗値に基づいて各ドツトの発熱抵抗体に印加する
電圧パルスの電圧値を各別に算出し、算出された電圧値
を上記トリミングを実施するドツトの発熱抵抗体に印加
してその抵抗値を降下させて均一化するサーマルヘツド
の製造方法において、上記全てのドツトの発熱抵抗体の
初期抵抗値をトリミング前に予め測定してメモリに格納
し、次いでトリミング時に各ドツトの発熱抵抗体を選択
すると共に、選択されたドツトの発熱抵抗体の初期抵抗
値をメモリより読出し、上記抵抗値降下曲線を用いて当
該ドツトの発熱抵抗体の初期抵抗値を日標値まで降下さ
せた抵抗変化率より当該ドツトの発熱抵抗体へ印加させ
る上記電圧パルスの電圧値を算出することを特徴とする
サーマルヘツドの製造方法。
1. A sample dot selected from a plurality of dot heating resistors is sequentially applied with voltage pulses having different voltage values from a low voltage one, and the relationship between the applied voltage and the resistance value change is expressed as a resistance value drop curve. Approximately, using this resistance drop curve, the voltage value of the voltage pulse applied to each heating resistor of each dot was calculated based on the initial resistance value of each heating resistor of each dot during trimming. In the method of manufacturing the thermal head in which the voltage value is applied to the heating resistors of the dots for performing the above trimming to lower the resistance values to make them uniform, the initial resistance values of the heating resistors of all the dots are trimmed before trimming. Measure and store in memory in advance, then select the heating resistor of each dot during trimming and read the initial resistance value of the heating resistor of the selected dot from the memory. Then, using the resistance drop curve, calculate the voltage value of the voltage pulse to be applied to the heating resistor of the dot from the rate of change in resistance that has lowered the initial resistance value of the heating resistor of the dot to the daily standard value. A method of manufacturing a thermal head, which is characterized in that
JP20401086A 1986-08-29 1986-08-29 Method of manufacturing thermal head Expired - Lifetime JPH068057B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20401086A JPH068057B2 (en) 1986-08-29 1986-08-29 Method of manufacturing thermal head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20401086A JPH068057B2 (en) 1986-08-29 1986-08-29 Method of manufacturing thermal head

Publications (2)

Publication Number Publication Date
JPS6359557A JPS6359557A (en) 1988-03-15
JPH068057B2 true JPH068057B2 (en) 1994-02-02

Family

ID=16483275

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20401086A Expired - Lifetime JPH068057B2 (en) 1986-08-29 1986-08-29 Method of manufacturing thermal head

Country Status (1)

Country Link
JP (1) JPH068057B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05177860A (en) * 1991-12-28 1993-07-20 Kyocera Corp Resistor trimming device of thermal head

Also Published As

Publication number Publication date
JPS6359557A (en) 1988-03-15

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