「defect state」に関連した英語例文の一覧と使い方 - Weblio英語例文検索

METHOD AND APPARATUS FOR INSPECTING DETERIORATION IN DEFECT STATE OF DEFECT SECTOR例文帳に追加

ディフェクトセクタのディフェクト状況の悪化を検査するための方法及び装置 - 特許庁

METHOD OF DETECTING PIXEL DEFECT FOR SOLID STATE IMAGING DEVICE例文帳に追加

固体撮像素子の画素欠陥検出方法 - 特許庁

IMAGE DEFECT CORRECTING DEVICE FOR SOLID-STATE IMAGE PICKUP DEVICE例文帳に追加

固体撮像装置用画像欠陥補正装置 - 特許庁

DEFECT PIXEL DETECTION METHOD FOR SOLID-STATE IMAGE PICKUP ELEMENT AND PIXEL DEFECT CORRECTION METHOD例文帳に追加

固体撮像素子の欠陥画素検出方法および画素欠陥補正方法 - 特許庁

CORRECTION DEVICE FOR DEFECT PIXEL DATA FOR SOLID-STATE IMAGE PICKUP ELEMENT例文帳に追加

固体撮像素子の欠陥画素データ補正装置 - 特許庁

the state of goods of having a production defect 例文帳に追加

商品に偶発的に生じた欠陥があること - EDR日英対訳辞書

DEFECT DETECTING APPARATUS AND DEFECT DETECTING METHOD FOR SOLID-STATE IMAGING ELEMENT, DEFECT CORRECTION APPARATUS AND DEFECT CORRECTION METHOD, AND IMAGING APPARATUS例文帳に追加

固体撮像素子の欠陥検出装置および欠陥検出方法、欠陥補正装置および欠陥補正方法ならびに撮像装置 - 特許庁

In the first defect detection, since detection is performed in the unseparated state between a pseudo defect and a normal state, the pseudo defect is detected by pseudo defect detection.例文帳に追加

第１の欠陥検出では、擬似欠陥と正常状態とが分離されない状態で検出されるため、擬似欠陥検出によって擬似欠陥を検出する。 - 特許庁

SOLID-STATE IMAGE PICKUP DEVICE AND PIXEL DEFECT COMPENSATION METHOD例文帳に追加

固体撮像装置および画素欠陥補償方法 - 特許庁

SOLID-STATE IMAGING DEVICE EQUIPPED WITH PIXEL DEFECT CORRECTING FUNCTION例文帳に追加

画素欠陥補正機能を備えた固体撮像装置 - 特許庁

DEFECT CORRECTION APPARATUS AND METHOD FOR SOLID-STATE IMAGING DEVICE例文帳に追加

固体撮像素子の欠陥補正装置及び方法 - 特許庁

DEFECT PIXEL DETECTION.CORRECTION DEVICE FOR SOLID-STATE AGE PICKUP ELEMENT例文帳に追加

固体撮像素子の欠陥画素検出・補正装置 - 特許庁

SOLID-STATE IMAGE PICKUP DEVICE AND PIXEL DEFECT INSPECTING METHOD THEREFOR例文帳に追加

固体撮像装置及びその画素欠陥検査方法 - 特許庁

SOLID-STATE IMAGE PICKUP DEVICE AND METHOD FOR DETECTING PIXEL DEFECT例文帳に追加

固体撮像装置および画素欠陥検出方法 - 特許庁

the state of having a defect only in speech and with the auditory sense intact 例文帳に追加

聴覚は完全で,言語機能だけがないこと - EDR日英対訳辞書

BLACK DEFECT DETECTING DEVICE FOR SOLID STATE IMAGE SENSING DEVICE AND IMAGING APPARATUS, AND BLACK DEFECT DETECTING METHOD例文帳に追加

固体撮像素子の黒欠陥検出装置及び撮像装置、並びに黒欠陥検出方法 - 特許庁

METHOD AND APPARATUS FOR INSPECTING PIXEL DEFECT OF SOLID-STATE IMAGING DEVICE例文帳に追加

固体撮像素子の画素欠陥検査方法及び検査装置 - 特許庁

METHOD OF MANUFACTURING SOLID-STATE ELECTRONIC DEVICE USING CRYSTALLINE DEFECT CONTROL例文帳に追加

結晶性欠陥制御を用いる固体電子デバイスの製造 - 特許庁

METHOD FOR ESTIMATING CRYSTAL DEFECT STATE AND METHOD FOR MANUFACTURING SILICON WAFER例文帳に追加

結晶欠陥状態予測方法、シリコンウェーハの製造方法 - 特許庁

IMAGING APPARATUS AND DEFECT DETECTING METHOD OF SOLID-STATE IMAGING ELEMENT例文帳に追加

撮像装置および固体撮像素子の欠陥検出方法 - 特許庁

DEVICE AND METHOD FOR CORRECTING DEFECT IN SOLID-STATE IMAGE DEVICE例文帳に追加

固体撮像素子の欠陥補正装置および欠陥補正方法 - 特許庁

SOLID-STATE IMAGE PICKUP ELEMENT AND METHOD FOR DETECTING AND CORRECTING DEFECT OF SOLID-STATE IMAGE PICKUP DEVICE例文帳に追加

固体撮像素子ならびに固体撮像装置の欠陥検出および欠陥補正方法 - 特許庁

In the second defect detection, since detection is performed in the unseparated state between the second true device defect and a pseudo defect, the second true device defect is detected separately by using a pseudo defect detected by the pseudo defect detection.例文帳に追加

第２の欠陥検出では、第２の真のデバイス欠陥と擬似欠陥とが分離されない状態で検出されるため、擬似欠陥検出で検出した擬似欠陥を用いて、第２の真のデバイス欠陥を分離して検出する。 - 特許庁

METHOD AND DEVICE OF DEFECT INSPECTION FOR CCD SOLID-STATE IMAGING ELEMENT例文帳に追加

ＣＣＤ型固体撮像素子の欠陥検査方法及びその装置 - 特許庁

METHOD OF MEASURING ELECTRONIC STATE OF IMPURITY AND DEFECT IN SEMICONDUCTOR例文帳に追加

半導体内不純物および欠陥の電子状態測定方法 - 特許庁

To accurately detect a black defect of a solid state image sensing device.例文帳に追加

固体撮像素子について黒欠陥検出を正確に行う。 - 特許庁

The defect management information includes the defect location information indicating the location of defective areas and the defect status information indicating the state of the defective areas.例文帳に追加

欠陥管理情報は、欠陥領域の位置を示す欠陥位置情報と、欠陥領域の状態を示す欠陥状態情報とを含む。 - 特許庁

Distribution state of defects is analyzed based on a defect position coordinate detected by an inspection equipment and classified into one distribution feature category of repetitive defect, aggregated defect, linear distribution defect, annular block distribution defect or random defect.例文帳に追加

検査装置によって検出された欠陥位置座標に基づいて欠陥の分布状態を解析し、繰り返し欠陥、密集欠陥、線状分布欠陥、環・塊状分布欠陥、ランダム欠陥のうちいずれかの分布特徴カテゴリに分類する。 - 特許庁

To visualize and display a fluctuation state and defect distribution state of the measured value of a panel inspection apparatus.例文帳に追加

パネル検査装置の測定値の変動状態や欠陥分布を可視化して表示すること。 - 特許庁

To surely avoid the defect of image quality in a spot state with simple constitution.例文帳に追加

簡単な構成で、斑点状の画質欠陥を確実に回避する。 - 特許庁

DEFECT DETECTING AND CORRECTING DEVICE FOR SOLID-STATE IMAGE PICKUP ELEMENT AND IMAGE PICKUP DEVICE例文帳に追加

固体撮像素子の欠陥検出補正装置および撮像装置 - 特許庁

To detect a defect in wiring, the defect being latent in the wiring of a printed board made of a composite material of a resin and copper, and discriminate the defect in a state of a printed board.例文帳に追加

樹脂と銅の複合材料からなるプリント基板の配線に潜む配線異常を検出し、プリント基板の状態で判別可能とすること。 - 特許庁

To provide a defect inspection device capable of suppressing a defect data amount to be managed without impeding acquisition of a defect generation state on a substrate to be inspected.例文帳に追加

被検査基板における欠陥発生状況の把握を妨げることなく、管理すべき欠陥データ量を抑制できる欠陥検査装置の提供。 - 特許庁

SOLID-STATE IMAGE PICKUP DEVICE, METHOD FOR CONVERTING FAILED PIXEL FOR THE APPARATUS AND DEFECT CORRECTING METHOD例文帳に追加

固体撮像装置、その画素不良変換方法および傷補正方法 - 特許庁

METHOD FOR DETECTING FLICKER DEFECT, VIDEO CORRECTION METHOD, AND SOLID-STATE IMAGE PICKUP APPARATUS例文帳に追加

点滅欠陥検出方法、映像補正方法及び固体撮像装置 - 特許庁

SOLID-STATE IMAGE SENSOR, AND METHOD AND APPARATUS FOR INSPECTING DEFECT OF THE SAME例文帳に追加

固体撮像素子及びその欠陥検査方法並びに欠陥検査装置 - 特許庁

A defect state judging circuit 424 determines a defect state variable DET by subtracting the slack variable OCCNT from the difference detection variable DEFDET.例文帳に追加

欠陥状態判定回路４２４は、差分検出変数ＤＥＦＤＥＴから緩和変数ＯＣＣＮＴを減じた値を欠陥状態変数ＤＥＴとする。 - 特許庁

For a V line defect generated in an image due to defect in VCCD of an imaging sensor, the position (initial defect position) of a V line defect generated in an initial state of activation of an imaging apparatus is previously stored in a defect address memory.例文帳に追加

撮像センサのＶＣＣＤにおける欠陥に起因して画像において発生するＶライン傷について、撮像装置の起動初期状態において発生するＶライン傷の位置（初期傷位置）を傷アドレスメモリに予め記憶しておく。 - 特許庁

To properly inspect the defect in a solid-state image pickup element without being affected by a dot defect included in a small signal in the case of inspecting the defect by using the small signal outputted from the solid-state image pickup element.例文帳に追加

固体撮像素子から出力される小信号を用いて欠陥検査を行う場合に、前記小信号に含まれる点状の欠陥の影響を受けることなく適正な検査を行う。 - 特許庁

The solid-state image sensor 3 is operated in a light shield state, a linear defect detection correction circuit 6 detects the linear defect of the solid-state image sensor 3 on the basis of the pixel signal of the solid-state imaging element 3, and an address of the detected linear defect is stored.例文帳に追加

固体撮像素子３を遮光状態で動作させ、固体撮像素子３の画素信号に基づいて固体撮像素子３の線状欠陥を線状欠陥検出補正回路６により検出し、検出された線状欠陥のアドレスを記憶しておく。 - 特許庁

To provide a solid-state imaging device suppressed in a defect of signal charge transfer.例文帳に追加

信号電荷の転送不良を抑制した固体撮像装置を提供する。 - 特許庁

To provide a defect detection method and a defect detection device capable of detecting a defect of the surface state of an inspection object with extremely high accuracy.例文帳に追加

検査対象物の表面状態の欠陥を極めて高精度に検出することが可能な欠陥検出方法及び欠陥検出装置を提供すること。 - 特許庁

METHOD OF ADJUSTING DEFECT INSPECTION DEVICE, EVALUATING METHOD OF ADJUSTING STATE OF DEFECT INSPECTION DEVICE, AND SETTING METHOD OF AZIMUTHAL ANGLE OF PATTERN例文帳に追加

欠陥検査装置の調整方法、欠陥検査装置の調整状態の評価方法、及びパターンの方位角の設定方法 - 特許庁

The solid-state image sensor 3 is activated at a low temperature, a linear defect detection correction circuit 6 detects the linear defect of the solid-state image sensor 3 on the basis of the pixel signal of the solid-state image sensor 3, and an address of the detected linear defect is stored.例文帳に追加

固体撮像素子３を低温で動作させ、固体撮像素子３の画素信号に基づいて固体撮像素子３の線状欠陥を線状欠陥検出補正回路６により検出し、検出された線状欠陥のアドレスを記憶しておく。 - 特許庁

IMAGE PICKUP UNIT AND DEVICE AND METHOD FOR DETECTING PIXEL DEFECT IN SOLID-STATE IMAGE PICKUP ELEMENT例文帳に追加

撮像装置並びに固体撮像素子の画素欠陥検出装置及び方法 - 特許庁